Abstract: A coil device includes a first conductor on a first layer and arranged in a first spiral shape, a second conductor on a second layer and arranged in a second spiral shape, a transition that connects the first conductor and the second conductor in series, a first terminal connected to an end of the first conductor, and a second terminal connected to an end of the second conductor. The first terminal and the second terminal are outside of the first conductor and the second conductor when viewed in plan. The first conductor and the second conductor each include a plurality of in-plane traces connected in parallel with each other.

Abstract: A coil device includes a first conductor in a first layer and including a spiral shape and a second conductor in the first layer connected in parallel with the first conductor and extending adjacent to and parallel or substantially parallel to the first conductor. A cross-sectional area of the first conductor and a cross-sectional area of the second conductor are different.

Abstract: A coil device includes a first conductor on a first layer and arranged in a first spiral shape, a second conductor on a second layer and arranged in a second spiral shape, a transition that connects the first conductor and the second conductor in series, a first terminal connected to an end of the first conductor, and a second terminal connected to an end of the second conductor. The first terminal and the second terminal are outside of the first conductor and the second conductor when viewed in plan. The first conductor and the second conductor each include a plurality of in-plane traces connected in parallel with each other.

Abstract: A particle detection method for matching particles detected in two scans of a surface taken at different times in which particles having a light scattering intensity above a collection threshold are first detected and the measured position and scattering intensity therefor stored in a computer memory. Corresponding first and second measured positions from the respective first and second scans are determined by forming a triangle from selected first detected particles and finding those second detected particles which form a variant triangle with matching perimeter and area. From these matching first and second particles a transformation is found for mapping first measured positions to corresponding second positions and vice versa. Areas around corresponding positions of particles having a scattering intensity above a display threshold are examined for matching particles. If not found, the area is reexamined at a reduced threshold.