Abstract: The present invention relates to an X-ray Talbot interferometer including a source grating including a plurality of X-ray transmitting portions, configured to allow some of X-rays from an X-ray source to pass therethrough; a beam splitter grating having a periodic structure, configured to diffract X-rays from the X-ray transmitting portions by using the periodic structure to form an interference pattern; and an X-ray detector configured to detect X-rays from the beam splitter grating. The beam splitter grating diffracts an X-ray from each of the plurality of X-ray transmitting portions to form interference patterns each corresponding to one of the plurality of X-ray transmitting portions. The plurality of X-ray transmitting portions are arranged so that the interference patterns, each corresponding to one of the plurality of X-ray transmitting portions, are superimposed on one another to enhance a specific spatial frequency component in a sideband generated by modulation of the interference patterns.

Abstract: An X-ray diffractive grating includes a phase advance portion and a plurality of phase delay portions. The phase advance portion includes a grating material. In each of the phase delay portions, the thickness of the grating material is less than that in the phase advance portion, and the area occupancy of the phase delay portions in the corresponding two-dimensional grating pattern is 15% or more but less than 45%. The phase delay portions are arranged in a hexagonal lattice shape.

Abstract: An X-ray Talbot interferometer includes a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source, a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to form interference patterns, an analyzer grating configured to block parts of the interference patterns, and a detector configured to detect X-rays from the analyzer grating. The X-ray transmitting portions of the source grating are arranged to form a periodic pattern in which spatial frequency components contained in a sideband resulting from modulation caused by the presence of an object are enhanced by superimposing the interference patterns corresponding to the respective X-ray transmitting portions. In the absence of any object, the positional relation between the periodic pattern and the grating pattern of the analyzer grating is substantially the same over the entire imaging field.

Abstract: An X-ray diffractive grating includes a phase advance portion and a plurality of phase delay portions. The phase advance portion includes a grating material. In each of the phase delay portions, the thickness of the grating material is less than that in the phase advance portion, and the area occupancy of the phase delay portions in the corresponding two-dimensional grating pattern is 15% or more but less than 45%. The phase delay portions are arranged in a hexagonal lattice shape.

Abstract: An X-ray Talbot interferometer includes a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source, a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to form interference patterns, an analyzer grating configured to block parts of the interference patterns, and a detector configured to detect X-rays from the analyzer grating. The X-ray transmitting portions of the source grating are arranged to form a periodic pattern in which spatial frequency components contained in a sideband resulting from modulation caused by the presence of an object are enhanced by superimposing the interference patterns corresponding to the respective X-ray transmitting portions. In the absence of any object, the positional relation between the periodic pattern and the grating pattern of the analyzer grating is substantially the same over the entire imaging field.

Abstract: The present invention relates to an X-ray Talbot interferometer including a source grating including a plurality of X-ray transmitting portions, configured to allow some of X-rays from an X-ray source to pass therethrough; a beam splitter grating having a periodic structure, configured to diffract X-rays from the X-ray transmitting portions by using the periodic structure to form an interference pattern; and an X-ray detector configured to detect X-rays from the beam splitter grating. The beam splitter grating diffracts an X-ray from each of the plurality of X-ray transmitting portions to form interference patterns each corresponding to one of the plurality of X-ray transmitting portions. The plurality of X-ray transmitting portions are arranged so that the interference patterns, each corresponding to one of the plurality of X-ray transmitting portions, are superimposed on one another to enhance a specific spatial frequency component in a sideband generated by modulation of the interference patterns.

Abstract: The present invention provides an X-ray imaging system comprising: an X-ray optical system; and an X-ray image detector configured to detect, via the X-ray optical system, an intensity distribution of an X ray emitted by an X-ray source and transmitted through an object, wherein the X-ray optical system includes a PSF modulation part configured to modulate a point spread function in such a manner that, assuming that a virtual pinhole is placed at a position of the object, an X ray transmitted through the virtual pinhole would be observed by the X-ray image detector as an image with an intensity distribution in a predetermined pattern by an action of the PSF modulation part on the X ray.

Abstract: An X-ray imaging apparatus for imaging an object to be inspected includes a grating that forms a periodic pattern using an X-ray from an X-ray source and a detector that detects the periodic pattern. In the X-ray imaging apparatus, when ?1 is an angle formed between a first direction, which is a periodic direction of the periodic pattern in a plane that is perpendicular to an optical axis of the X-ray, and a line parallel to an X-ray receiving surface of the detector in the plane, and ?2 is a grazing angle of the X-ray relative to the X-ray receiving surface, 1 sin 2 ? ? 1 ? sin 2 ? ? 2 + cos 2 ? ? 1 > 2 holds. Also in the X-ray imaging apparatus, an angle formed between a surface of the grating and the optical axis of the X-ray is from 45 to 90°.

Abstract: An X-ray imaging system includes: a micro X-ray source array formation part configured to form a micro X-ray source array by partially shielding an X-ray emitted from an X-ray source; and an X-ray detector configured to detect an X-ray transmitted through a test object. The micro X-ray source array formation part includes a plurality of gratings disposed between the X-ray source and the X-ray detector. A ratio of X-rays transmitted through all of the plurality of gratings to X-rays generated from the X-ray source varies depending on a position of an X-ray generating point on the X-ray source, and the micro X-ray source array formation part forms a micro X-ray source array of a pattern in accordance with the variation of the ratio of the transmitted X-rays.

Abstract: A computation apparatus that calculates subject information by using subject data, includes a calculation unit that calculates spatial distributions of a first-order phase value and a first-order measurement target value by using the subject data, a calculation unit that calculates an error correction function including the first-order phase value as a variable by using information of the spatial distribution of the first-order measurement target value and the spatial distribution of the first-order phase value, and a calculation unit that calculates information of a spatial distribution of a second-order measurement target value corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value by using the error correction function, the information of the spatial distribution of the first-order phase value, and the information of the spatial distribution of the first-order measurement target value.

Abstract: A computation apparatus that calculates information of a subject includes: a calculation unit configured to calculate a spatial distribution of a first first-order phase value, a spatial distribution of a second first-order phase value, and a spatial distribution of a first-order measurement target value, by using the subject data; a calculation unit configured to calculate an error correction function including the first first-order phase value and the second first-order phase value as variables, by using information of the spatial distribution of the first first-order phase value, information of the spatial distribution of the second first-order phase value, and information of the spatial distribution of the first-order measurement target value; and a calculation unit configured to calculate information of a spatial distribution of a second-order measurement target value, corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value.