Abstract: Capacitance networks for enhancing high voltage operation of high electron mobility transistors (HEMTs) are presented herein. A capacitance network, integrated and/or external, may be provided with a fixed number of capacitively coupled field plates to distribute the electric field in the drift region. The capacitively coupled field plates may advantageously be fabricated on the same metal layer to lower cost; and the capacitance network may be provided to control field plate potentials. The potentials on each field plate may be pre-determined through the capacitance network, resulting in a uniform, and/or a substantially uniform electric field distribution along the drift region.

Abstract: Coupled polysilicon guard rings for enhancing breakdown voltage in a power semiconductor device are presented herein. Polysilicon guard rings are disposed above the power device drift region and electrically coupled to power device regions (e.g., device diffusions) so as to spread electric fields associated with an operating voltage. Additionally, PN junctions (i.e., p-type and n-type junctions) are formed within the polysilicon guard rings to operate in reverse bias with a low leakage current between the power device regions (e.g., device diffusions). Low leakage current may advantageously enhance the electric field spreading without deleteriously affecting existing (i.e., normal) power device performance; and enhanced electric field spreading may in turn reduce breakdown-voltage drift.

Abstract: A switch having a drain, a source, and a control. The switch comprising a depletion-mode transistor including a first, a second, and a control terminal and an enhancement-mode transistor including a first, a second, and a control terminal. The first terminal of the depletion-mode transistor is the drain of the switch and the control of the depletion-mode transistor is coupled to the source of the switch. The control of the enhancement-mode transistor is coupled to the control of the switch, the second terminal of the enhancement-mode transistor is the source of the switch. The switch comprises a clamp circuit to clamp a voltage of the first terminal of the enhancement-mode transistor to a threshold, the clamp circuit comprises a resistor and a pn-junction device coupled between the first and second terminals of the enhancement-mode transistor and between the second terminal and the control of the depletion-mode transistor.

Abstract: A switch having a drain, a source, and a control. The switch comprising a depletion-mode transistor including a first, a second, and a control terminal and an enhancement-mode transistor including a first, a second, and a control terminal. The first terminal of the depletion-mode transistor is the drain of the switch and the control of the depletion-mode transistor is coupled to the source of the switch. The control of the enhancement-mode transistor is coupled to the control of the switch, the second terminal of the enhancement-mode transistor is the source of the switch. The switch comprises a clamp circuit to clamp a voltage of the first terminal of the enhancement-mode transistor to a threshold, the clamp circuit comprises a resistor and a pn-junction device coupled between the first and second terminals of the enhancement-mode transistor and between the second terminal and the control of the depletion-mode transistor.

Abstract: A switch having a drain, a source, and a control. The switch comprising a depletion-mode transistor including a first, a second, and a control terminal and an enhancement-mode transistor including a first, a second, and a control terminal. The first terminal of the depletion-mode transistor is the drain of the switch and the control of the depletion-mode transistor is coupled to the source of the switch. The control of the enhancement-mode transistor is coupled to the control of the switch, the second terminal of the enhancement-mode transistor is the source of the switch. The switch comprises a clamp circuit to clamp a voltage of the first terminal of the enhancement-mode transistor to a threshold, the clamp circuit comprises a resistor and a pn-junction device coupled between the first and second terminals of the enhancement-mode transistor and between the second terminal and the control of the depletion-mode transistor.

Abstract: A switch having a drain, a source, and a control. The switch comprising a depletion-mode transistor including a first, a second, and a control terminal and an enhancement-mode transistor including a first, a second, and a control terminal. The first terminal of the depletion-mode transistor is the drain of the switch and the control of the depletion-mode transistor is coupled to the source of the switch. The control of the enhancement-mode transistor is coupled to the control of the switch, the second terminal of the enhancement-mode transistor is the source of the switch. The switch comprises a clamp circuit to clamp a voltage of the first terminal of the enhancement-mode transistor to a threshold, the clamp circuit comprises a resistor and a pn-junction device coupled between the first and second terminals of the enhancement-mode transistor and between the second terminal and the control of the depletion-mode transistor.

Abstract: A switch having a drain terminal, a source terminal and a control terminal. The switch comprises a normally-on device including a first terminal, a second terminal, and a control terminal, a normally-off device including a first terminal, a second terminal, and a control terminal, and a clamp circuit. The first terminal of the normally-on device is the drain terminal of the switch and the control terminal of the normally-on device is coupled to the source terminal of the switch. The control terminal of the normally-off device is coupled to the control terminal of the switch. The second terminal of the normally-off device is the source terminal of the switch, and the first terminal of the normally-off device is coupled to the second terminal of the normally-on device. The clamp circuit coupled across the normally-off device and comprises a first transistor coupled to the first terminal of the normally-off device.

Abstract: A switch having a first terminal, a second terminal and a control terminal. The switch includes a normally-on device with a first terminal, a second terminal, and a control terminal. The first terminal of the normally-on device is the first terminal of the switch. The control terminal of the normally-on device is coupled to the second terminal of the switch. A normally-off device includes a first terminal, a second terminal, and a control terminal. The control terminal of the normally-off device is coupled to the control terminal of the switch. The second terminal of the normally off-device is the second terminal of the switch. The first terminal of the normally-off device is coupled to the second terminal of the normally-on device. A clamp circuit is coupled across the normally-off device. The clamp circuit is coupled to clamp a voltage of the first terminal of the normally-off device to a threshold.

Abstract: A switch having a first terminal, a second terminal and a control terminal. The switch includes a normally-on device with a first terminal, a second terminal, and a control terminal. The first terminal of the normally-on device is the first terminal of the switch. The control terminal of the normally-on device is coupled to the second terminal of the switch. A normally-off device includes a first terminal, a second terminal, and a control terminal. The control terminal of the normally-off device is coupled to the control terminal of the switch. The second terminal of the normally off-device is the second terminal of the switch. The first terminal of the normally-off device is coupled to the second terminal of the normally-on device. A clamp circuit is coupled across the normally-off device. The clamp circuit is coupled to clamp a voltage of the first terminal of the normally-off device to a threshold.

Abstract: A cascode switch circuit includes a normally-on device cascode coupled to a normally-off device between first and second terminals of the cascode switch circuit. A leakage clamp circuit is coupled between first and second terminals of the normally-off device. The leakage clamp circuit is coupled to clamp a voltage at an intermediate terminal between the normally-on device and the normally-off device at a threshold voltage level. The leakage clamp circuit is further coupled to clamp a voltage between the second terminal of the normally-on device and the control terminal of the normally-on device at the threshold voltage level to keep the normally-on device off when the normally-on device and the normally-off device are off.

Abstract: A semiconductor device including a dummy pillar and a plurality of racetrack pillars. The dummy pillar of semiconductor material extends in a first lateral direction. The plurality of racetrack pillars, including the semiconducting material, surrounds the dummy pillar. Each of the plurality of racetrack pillars has a first linear section, which extends in the first lateral direction, and a first rounded section to form a racetrack shape. The plurality of racetrack pillars includes a first racetrack pillar and a second racetrack pillar. The first racetrack pillar is disposed proximate to the dummy pillar and the second racetrack pillar surrounds the first racetrack pillar. The first racetrack pillar is disposed between the dummy pillar and the second racetrack pillar. The semiconductor device includes a plurality of spacing regions including a first spacing region that surrounds the dummy pillar and is disposed between the first racetrack pillar and the dummy pillar.

Abstract: A semiconductor device including a dummy pillar and a plurality of racetrack pillars. The dummy pillar of semiconductor material extends in a first lateral direction. The plurality of racetrack pillars, including the semiconducting material, surrounds the dummy pillar. Each of the plurality of racetrack pillars has a first linear section, which extends in the first lateral direction, and a first rounded section to form a racetrack shape. The plurality of racetrack pillars includes a first racetrack pillar and a second racetrack pillar. The first racetrack pillar is disposed proximate to the dummy pillar and the second racetrack pillar surrounds the first racetrack pillar. The first racetrack pillar is disposed between the dummy pillar and the second racetrack pillar. The semiconductor device includes a plurality of spacing regions including a first spacing region that surrounds the dummy pillar and is disposed between the first racetrack pillar and the dummy pillar.

Abstract: A cascode switch circuit includes a normally-on device cascode coupled to a normally-of device between first and second terminals of the cascode switch circuit. A leakage clamp circuit is coupled between first and second terminals of the normally-off device. The leakage clamp circuit is coupled to clamp a voltage at an intermediate terminal between the normally-on device and the normally-off device at a threshold voltage level. The leakage clamp circuit is further coupled to clamp a voltage between the second terminal of the normally-on device and the control terminal of the normally-on device at the threshold voltage level to keep the normally-on device off when the normally-on device and the normally-off device are off.

Abstract: A non-volatile memory (NVM) system includes a plurality of NVM cells fabricated in a dual-well structure. Each NVM cell includes an access transistor and an NVM transistor, wherein the access transistor has a drain region that is continuous with a source region of the NVM transistor. The drain regions of each NVM transistor in a column of the array are commonly connected to a corresponding bit line. The control gates of each NVM transistor in a row of the array are commonly connected to a corresponding word line. The source regions of each of the access transistors in the array are commonly coupled. The NVM cells are programmed and erased without having to apply the high programming voltage VPP across the gate dielectric layers of the access transistors. As a result, the NVM cells can be scaled down to sub-0.35 micron geometries.

Abstract: A charge pump provides a programmable multiplication factor for generating an output voltage. A first output voltage may be generated by connecting a first plurality of N capacitors in a first plurality of (N+1) configurations. A second output voltage may be generated by connecting a second plurality of M capacitors in a second plurality of M+1 configurations. The first plurality of N capacitors and the second plurality of M capacitors have one or more capacitors in common. The integers M and N may be equal, although this is not required. The first plurality of configurations is different than the second plurality of configurations, thereby providing different multiplication factors for the first and second pluralities of configurations. In one embodiment, the first plurality of (N+1) configurations results in an output voltage of about ¾× an input voltage.

Abstract: A charge pump provides a multiplication factor of ? by using a three-phase mode of operation. In a first mode, first and second capacitors are charged from an input voltage while a third capacitor drives the output voltage based on stored charge in the third capacitor. In a second mode, the output terminal is connected to the common node of the first and second capacitors. In a third mode, the voltage potential across the second capacitor is subtracted from the sum of the input voltage and the voltage potential across the first capacitor to generate the output voltage. Operated in this manner, the first, second, and third capacitors will provide the desired ?× voltage multiplication. This relatively low multiplication factor can be beneficial in applications requiring 2.5V and 1.8V supplies for integrated circuits, particularly where the input voltage is provided by a lithium battery.

Abstract: A charge pump provides a multiplication factor of 4/3 by using a three-phase mode of operation. In a first mode, first and second capacitors are charged from an input voltage while a third capacitor drives the output voltage based on stored charge in the third capacitor. In a second mode, the voltage potential across the first capacitor is added to the input voltage to generate the output voltage. In a third mode, the voltage potential across the first capacitor is subtracted from the sum of the input voltage and the voltage potential across the second capacitor to generate the output voltage. Operated in this manner, the first, second, and third capacitors will provide the desired 4/3× voltage multiplication. This relatively low multiplication factor can be beneficial in applications such as white LED driver circuits, particularly where the input voltage is provided by a battery.

Abstract: A nonvolatile memory integrated circuit arrayed in rows and columns is disclosed. Parallel lines of implant N-type regions are formed in a P-well of a semiconductor substrate, with lines of oxide material isolating each pair of the lines. Columns of memory cells straddle respective pairs of the implant region lines, with one line of the pair forming the source region and one line of the pair forming the drain region of each memory cell of the column. Each memory cell has a floating polysilicon storage gate. One of plural wordlines overlies each row of the memory cells. The portion of the wordline overlying each memory cells forms the control gate of the memory cell. Programming and erase operations occur by Fowler-Nordheim tunneling of electrons through a tunnel oxide layer between the floating gate and the source of the cell.

Abstract: A nonvolatile memory integrated circuit arrayed in rows and columns is disclosed. Parallel lines of implant N-type regions are formed in a P-well of a semiconductor substrate, with lines of oxide material isolating each pair of the lines. Columns of memory cells straddle respective pairs of the implant region lines, with one line of the pair forming the source region and one line of the pair forming the drain region of each memory cell of the column. Each memory cell has a floating polysilicon storage gate. One of plural wordlines overlies each row of the memory cells. The portion of the wordline overlying each memory cells forms the control gate of the memory cell. Programming and erase operations occur by Fowler-Nordheim tunneling of electrons through a tunnel oxide layer between the floating gate and the source of the cell.

Abstract: A digital potentiometer includes a string of impedance units in series. The string includes identical first and second sets of impedance units whose individual impedance values increment by a power of two. One of a plurality of switches is coupled in parallel with each respective impedance unit. The switches that are coupled to the first set of impedance units receive logical control signals complementary to logical control signals received by the respective switches coupled to the second set of impedance units, so that for every impedance unit of the first set that is bypassed (not bypassed), the identical impedance unit of the second set is not bypassed (bypassed). The string may include only the first and second sets of impedance units, or may include at least one third impedance unit in series with the first and second sets in a multi-stage design.