Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: An electronic device includes a power management circuit generating output for a plurality of voltage monitors that each detect whether voltages received from a test apparatus are at least a different minimum threshold. The power management circuit also generates a test enable signal indicative of whether the test apparatus is supplying the minimum required voltages to the electronic device. A control circuit receives the output for the plurality of voltage monitors and the test enable signal and generates at least one control signal as a function of the output for the plurality of voltage monitors and the test enable signal. An output circuit receives the at least one control signal and generates an interface control signal that selectively enables or disables interface with analog intellectual property packages within the electronic device, in response to the at least one control signal.

Abstract: An electronic device includes a power management circuit generating output for a plurality of voltage monitors that each detect whether voltages received from a test apparatus are at least a different minimum threshold. The power management circuit also generates a test enable signal indicative of whether the test apparatus is supplying the minimum required voltages to the electronic device. A control circuit receives the output for the plurality of voltage monitors and the test enable signal and generates at least one control signal as a function of the output for the plurality of voltage monitors and the test enable signal. An output circuit receives the at least one control signal and generates an interface control signal that selectively enables or disables interface with analog intellectual property packages within the electronic device, in response to the at least one control signal.

Abstract: A method of operating an electronic device during test mode operation of a duplicated voltage monitor includes sensing a functional supply voltage with a voltage monitor, deasserting an output of the voltage monitor if the functional supply voltage is exceeds a threshold, and asserting output of the voltage monitor if the functional supply voltage falls below the threshold. A test supply voltage is sensed with the duplicate voltage monitor, output of the duplicate voltage monitor is deasserted if the test supply voltage exceeds a threshold, and output of the duplicate voltage monitor is asserted if the test supply voltage falls below the threshold. Output of the duplicate voltage monitor is monitored to thereby determine the threshold based upon assertion of the output of the duplicate voltage monitor, and performing a logical operation between outputs of the voltage monitor and the duplicate voltage monitor to generate a power on reset signal.

Abstract: Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.

Abstract: Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.

Abstract: A method of operating an electronic device during test mode operation of a duplicated voltage monitor includes sensing a functional supply voltage with a voltage monitor, deasserting an output of the voltage monitor if the functional supply voltage is exceeds a threshold, and asserting output of the voltage monitor if the functional supply voltage falls below the threshold. A test supply voltage is sensed with the duplicate voltage monitor, output of the duplicate voltage monitor is deasserted if the test supply voltage exceeds a threshold, and output of the duplicate voltage monitor is asserted if the test supply voltage falls below the threshold. Output of the duplicate voltage monitor is monitored to thereby determine the threshold based upon assertion of the output of the duplicate voltage monitor, and performing a logical operation between outputs of the voltage monitor and the duplicate voltage monitor to generate a power on reset signal.

Abstract: A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.

Abstract: A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.

Abstract: A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.