Patents by Inventor Srivatsan Seshadri
Srivatsan Seshadri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11885755Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.Type: GrantFiled: April 28, 2023Date of Patent: January 30, 2024Assignee: Sigray, Inc.Inventors: Wenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
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Publication number: 20230349842Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.Type: ApplicationFiled: April 28, 2023Publication date: November 2, 2023Inventors: Wenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
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Patent number: 11428651Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample such that at least a portion of the sample is between the crystal analyzer and the detector.Type: GrantFiled: November 23, 2021Date of Patent: August 30, 2022Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
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Publication number: 20220082516Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample.Type: ApplicationFiled: November 23, 2021Publication date: March 17, 2022Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
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Patent number: 11215572Abstract: An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.Type: GrantFiled: May 14, 2021Date of Patent: January 4, 2022Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
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Publication number: 20210356412Abstract: An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle in a tangential plane and having a Rowland circle radius (R). The crystal analyzer includes crystal planes curved along at least one direction within at least the tangential plane with a radius of curvature substantially equal to twice the Rowland circle radius (2R). The crystal planes are configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector configured to receive at least a portion of the dispersed x-rays. The spatially resolving detector includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy.Type: ApplicationFiled: May 14, 2021Publication date: November 18, 2021Inventors: Wenbing Yun, Srivatsan Seshadri, Ruimin Qiao, Janos Kirz, Sylvia Jia Yun Lewis
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Patent number: 10976273Abstract: An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.Type: GrantFiled: December 19, 2018Date of Patent: April 13, 2021Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis
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Patent number: 10578566Abstract: Systems and methods for x-ray emission spectroscopy are provided in which at least one x-ray analyzer is curved and receives and diffracts fluorescence x-rays emitted from a sample, and at least one spatially-resolving x-ray detector receives the diffracted x-rays. The at least one x-ray analyzer and the at least one spatially-resolving x-ray detector are positioned on the Rowland circle. In some configurations, the fluorescence x-rays are emitted from the same surface of the sample that is irradiated by the x-rays from an x-ray source and the system has an off-Rowland circle geometry. In some other configurations, an x-ray optical train receives the fluorescence x-rays emitted from a sample impinged by electrons within an electron microscope and focuses at least some of the received fluorescence x-rays to a focal spot.Type: GrantFiled: April 1, 2019Date of Patent: March 3, 2020Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Sylvia Jia Yun Lewis, Janos Kirz
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Publication number: 20190302042Abstract: Systems and methods for x-ray emission spectroscopy are provided in which at least one x-ray analyzer is curved and receives and diffracts fluorescence x-rays emitted from a sample, and at least one spatially-resolving x-ray detector receives the diffracted x-rays. The at least one x-ray analyzer and the at least one spatially-resolving x-ray detector are positioned on the Rowland circle. In some configurations, the fluorescence x-rays are emitted from the same surface of the sample that is irradiated by the x-rays from an x-ray source and the system has an off-Rowland circle geometry. In some other configurations, an x-ray optical train receives the fluorescence x-rays emitted from a sample impinged by electrons within an electron microscope and focuses at least some of the received fluorescence x-rays to a focal spot.Type: ApplicationFiled: April 1, 2019Publication date: October 3, 2019Inventors: Wenbing Yun, Srivatsan Seshadri, Sylvia Jia Yun Lewis, Janos Kirz
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Patent number: 10416099Abstract: A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density.Type: GrantFiled: March 21, 2018Date of Patent: September 17, 2019Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon, Benjamin Donald Stripe
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Patent number: 10352880Abstract: This disclosure presents systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro- or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using an arrayed x-ray source or a set of Talbot interference fringes.Type: GrantFiled: May 26, 2017Date of Patent: July 16, 2019Assignee: Sigray, Inc.Inventors: Wenbing Yun, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri, Alan Francis Lyon, David Vine
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Patent number: 10335104Abstract: A multi energy, such as dual-energy (“DE”), x-ray imaging system data acquisition and image reconstruction system and method enables optimizing the image contrast of a sample. Using the DE x-ray imaging system and its associated user interface applications, an operator performs a low energy (“LE”) and high energy (“HE”) x-ray scan of the same volume of interest of the sample. The system creates a low-energy reconstructed tomographic volume data set from the set of low-energy projections and a high-energy tomographic volume data set from the set of high-energy projections. This enables the operator to control the image contrast of selected slices, and apply the information associated with optimizing the contrast of the selected slice to all slices in the low-energy and high-energy tomographic data sets. This creates a combined volume data set from the LE and HE volume data sets with optimized image contrast throughout.Type: GrantFiled: July 22, 2015Date of Patent: July 2, 2019Assignee: Carl Zeiss X-ray Microscopy, Inc.Inventors: Thomas A. Case, Susan Candell, Srivatsan Seshadri, Paul McGuinness
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Patent number: 10304580Abstract: Systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro-or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using a arrayed x-ray source and a set of Talbot interference fringes.Type: GrantFiled: April 16, 2018Date of Patent: May 28, 2019Assignee: Sigray, Inc.Inventors: Wenbing Yun, David Vine, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri
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Patent number: 10295485Abstract: An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.Type: GrantFiled: July 31, 2017Date of Patent: May 21, 2019Assignee: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis
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Publication number: 20190145917Abstract: An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.Type: ApplicationFiled: December 19, 2018Publication date: May 16, 2019Inventors: Wenbing Yun, Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis
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Publication number: 20190011379Abstract: A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density.Type: ApplicationFiled: March 21, 2018Publication date: January 10, 2019Inventors: Wenbing Yun, Srivatsan Seshadri, Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon, Benjamin Donald Stripe
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Patent number: 10169865Abstract: An x-ray imaging system data acquisition and image reconstruction system and method are disclosed which enable optimizing the image parameters based on multiple tomographic volumes of the sample that have been captured using an x-ray microscopy system. This enables the operator to control the image contrast, for example, of selected slices, and apply the information associated with optimizing the contrast of the selected slice to all slices in two or more tomographic volume data sets. This creates a combined volume with optimized image contrast throughout. Also, the system enables navigation within the volumes through functional annotation, improvements in volume registration and improvements in noise suppression both within the volumes and within slice histograms of the sample.Type: GrantFiled: October 17, 2016Date of Patent: January 1, 2019Assignee: Carl Zeiss X-Ray Microscopy, Inc.Inventors: Thomas A. Case, Susan Candell, Srivatsan Seshadri, Naomi Kotwal
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Publication number: 20180261350Abstract: Systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro-or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using a arrayed x-ray source and a set of Talbot interference fringes.Type: ApplicationFiled: April 16, 2018Publication date: September 13, 2018Applicant: Sigray, Inc.Inventors: Wenbing Yun, David Vine, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri
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Publication number: 20170336334Abstract: An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.Type: ApplicationFiled: July 31, 2017Publication date: November 23, 2017Applicant: Sigray, Inc.Inventors: Wenbing Yun, Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis
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Publication number: 20170261442Abstract: This disclosure presents systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro- or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using an arrayed x-ray source or a set of Talbot interference fringes.Type: ApplicationFiled: May 26, 2017Publication date: September 14, 2017Applicant: Sigray, Inc.Inventors: Wenbing Yun, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri, Alan Francis Lyon, David Charles Reynolds