Patents by Inventor Sruthi Yapalapalli

Sruthi Yapalapalli has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEM TO TRACK AND MEASURE MACHINE LEARNING MODEL EFFICACY
    Publication number: 20230205663
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Application
    Filed: March 6, 2023
    Publication date: June 29, 2023
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti
  • System to track and measure machine learning model efficacy
    Patent number: 11609838
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: March 21, 2023
    Assignee: PayPal, Inc.
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti
  • SYSTEM TO TRACK AND MEASURE MACHINE LEARNING MODEL EFFICACY
    Publication number: 20220083445
    Abstract: Systems and/or techniques for facilitating online-monitoring of machine learning models are provided. In various embodiments, a system can receive monitoring settings associated with a machine learning model to be monitored. In various cases, the monitoring settings can identify a first set of data features that are generated as output by the machine learning model. In various cases, the monitoring settings can identify a second set of data features that are received as input by the machine learning model. In various aspects, the system can compute a first set of statistical metrics based on the first set of data features. In various cases, the first set of statistical metrics can characterize a performance quality of the machine learning model. In various instances, the system can compute a second set of statistical metrics based on the second set of data features.
    Type: Application
    Filed: September 17, 2020
    Publication date: March 17, 2022
    Inventors: Lokesh Nyati, Jonathan Doering, Sruthi Yapalapalli, Sriharsha Vogeti