Abstract: Test structures and methods of testing pixel driver chip donor wafers are described. In an embodiment, a redistribution layer is formed over a pixel driver chip donor wafer and probed to determine known good dies, followed by removal of the RDL. In other embodiments, test routing is formed in the pixel driver chip using a polycide material or doped region in the semiconductor wafer.

Abstract: Electronic devices, displays, and methods are provided for operating an electronic display in coexistence with sensors that could be adversely impacted by the operation of the electronic display. An electronic device may include an electronic display and a sensor. The electronic display may display image content by light emission during an emission period and periodically enter a quiet period in which the light emission of the electronic display is turned off. The sensor may perform sensing operations during the quiet period without interference from the operation of the electronic display.

Abstract: An implantable bone lengthening apparatus may utilize an entirely self-contained lengthening mechanism which includes a shape memory material-powered hydraulic pump, a shape memory material-powered ratchet mechanism, a permeable head piston mechanism, and a bellows extension mechanism. The bone lengthening nails are more compact, simpler, eliminate unnecessary shifting or torsional movement, and maintain alignment of the bone during its natural healing process.