Patents by Inventor Stefan BARTZSCH

Stefan BARTZSCH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray micro-beam production and high brilliance x-ray production
    Patent number: 11594394
    Abstract: An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width ? formed on a surface of the target.
    Type: Grant
    Filed: March 21, 2022
    Date of Patent: February 28, 2023
    Assignee: The Institute of Cancer Research: Royal Cancer Hospital
    Inventors: Stefan Bartzsch, Uwe Oelfke
  • X-Ray Micro-Beam Production and High Brilliance X-Ray Production
    Publication number: 20220277920
    Abstract: An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width ? formed on a surface of the target.
    Type: Application
    Filed: March 21, 2022
    Publication date: September 1, 2022
    Inventors: Stefan Bartzsch, Uwe Oelfke
  • X-ray micro-beam production and high brilliance x-ray production
    Patent number: 11393654
    Abstract: An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width ? formed on a surface of the target.
    Type: Grant
    Filed: June 14, 2017
    Date of Patent: July 19, 2022
    Assignee: The Institute of Cancer Research: Royal Cancer Hospital
    Inventors: Stefan Bartzsch, Uwe Oelfke
  • X-Ray Micro-Beam Production and High Brilliance X-Ray Production
    Publication number: 20190164717
    Abstract: An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width ? formed on a surface of the target.
    Type: Application
    Filed: June 14, 2017
    Publication date: May 30, 2019
    Inventors: Stefan BARTZSCH, Uwe OELFKE