Abstract: A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).

Abstract: An Echelle spectrometer arrangement (10) with internal order separation contains an Echelle grating (34) and a dispersing element (38) for order separation so that a two-dimensional spectrum having a plurality of separate orders (56) can be generated, an imagine optical system (18, 22, 28, 46), a flat-panel detector (16), and predispersion means (20) for predispersing the radiation into the direction of traverse dispersion of the dispersion element (38). The arrangement is characterized in that the predispersion means (20) comprise a predispersion element which is arranged along the optical path behind the inlet spacing (12) inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane (24) which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element (20) and the echelle grating (34).

Abstract: A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).

Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arran

Abstract: An Echelle spectrometer arrangement (10) with internal order separation contains an Echelle grating (34) and a dispersing element (38) for order separation so that a two-dimensional spectrum having a plurality of separate orders (56) can be generated, an imagine optical system (18, 22, 28, 46), a flat-panel detector (16), and predispersion means (20) for predispersing the radiation into the direction of traverse dispersion of the dispersion element (38). The arrangement is characterized in that the predispersion means (20) comprise a predispersion element which is arranged along the optical path behind the inlet spacing (12) inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane (24) which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element (20) and the echelle grating (34).

Abstract: A method to determine and correct broadband background in complex spectra in a simple and automatized manner includes carrying out a background correction with respect to broadband background before a calibration step. The background correction may involve recording a spectral graph and smoothing the recorded spectral graph, determining all values in the initially recorded graph having a value higher than the value of the smoothed graph and reducing such values to the value of the smoothed graph, and repeating these two steps. The background graph obtained is then subtracted from the initial graph. The smoothing of the graph is carried out by moving average, where each intensity value I at the position x in the spectrum is replaced by an average value. The characteristics of the found peaks can be stored in a file so that the calibration can be used at any time.

Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40).

Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arran

Abstract: A method to determine and correct broadband background in complex spectra in a simple and automatized manner includes carrying out a background correction with respect to broadband background before a calibration step. The background correction may involve recording a spectral graph and smoothing the recorded spectral graph, determining all values in the initially recorded graph having a value higher than the value of the smoothed graph and reducing such values to the value of the smoothed graph, and repeating these two steps. The background graph obtained is then subtracted from the initial graph. The smoothing of the graph is carried out by moving average, where each intensity value I at the position x in the spectrum is replaced by an average value. The characteristics of the found peaks can be stored in a file so that the calibration can be used at any time.

Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40).

Abstract: A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function ?m(x), determination of a provisional wavelength scale ??m 1(x) for at least one neighboring order m 1, by means of addition/subtraction of a wavelength difference ?FSR which corresponds to a free spectral region, according to ?m 1 ?(x)=?m(x)?FSR with ?FSR=?m(x)/m, determination of the wavelengths of lines in said neighboring order m 1, by means of the provisional wavelength scale ? 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength f

Abstract: A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.

Abstract: A spectrometer assembly (10) comprises a light source (11) with a continuous spectrum, a pre-monochromator (2) for generating a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of such spectral portion being smaller than or equal to the bandwidth of the free spectral range of such order in the echelle spectrum wherein the centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency, an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.

Abstract: A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function &ggr;m(x), determination of a provisional wavelength scale &ggr;?m 1(x) for at least one neighbouring order m 1, by means of addition/subtraction of a wavelength difference &ggr;FSR which corresponds to a free spectral region, according to &ggr;m 1 ?(x)=0&ggr;m(x)&ggr;FSR with &ggr;FSR=&ggr;m(x)/m, determination of the wavelengths of lines in said neighbouring order m 1, by means of the provisional wavelength scale &ggr; 1(x), replacement of the provision

Abstract: The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).

Abstract: The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).

Abstract: An Echelle polychromator 50 has disposed upstream thereof a pre-monochromator 14 comprising a prism 20. The linear dispersion of the pre-monochromator 14 is variable by varying the angular dispersion of the prism 20. A particular spectral position and the close vicinity thereof are analyzed by an Echelle grating 54 with high resolution. Care must be taken that, on the one hand, the detector array 66 of the Echelle polychromator 50 is fully exploited in response to the central wavelength respectively observed and that, on the other hand, interfering orders are kept away from the Echelle polychromator 50. The linear dispersion of the pre-monochromator is variable for this purpose.

Abstract: The invention relates to an Echelle polychromator and can be employed in instruments for the spectrophotometric investigation of radiation sources. It is characterized in that, connected in series with the polychromator, there is a dispersive and polychromatic illuminating device, which is formed from an entrance slit arrangement, collimator optics, prism and camera optics, the entrance slit arrangements of the polychromator and of the illuminating device consisting of a main slit for limiting the bundle in the grating dispersion direction and a transverse slit for limiting the bundle in the direction of the dispersion of the prism in the Echelle polychromator. The whole of the wavelength range, which is to be processed by the polychromator, is imaged completely with negligible aberration on the transverse slit of the Echelle polychromator as a spectrum of the illuminating device.

Abstract: The invention relates to a spectrometer useful in analytical spectroscopy. The spectrometer has an imaging diffraction grating, a planar receiver system, and an element for flattening the image field, wherein the improvement comprises that a body of low refractive power and perceptible secondary spectrum is used as the element for flattening the image field, said body having at least two optically active surfaces, and is disposed between the entry slit and the diffraction grating.

Abstract: The invention refers to a device for investigating highly resolved partial spectra of an echelle spectrum, being applicable to the simultaneous determination of the intensities of different spectral elements of a radiation spectrum produced by an echelle spectrometer.