Patents by Inventor Stefan L. A. Van Vlijmen

Stefan L. A. Van Vlijmen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analysis apparatus including goniometer with angle encoders
    Patent number: 5268953
    Abstract: An X-ray analysis apparatus includes angle encoders for the determination of angular positions of at least two rotary shafts, for example the .theta. shaft for a specimen holder, the 2.theta. shaft of an X-ray detector arm or the rotary shaft of an X-ray source. Because the angles are directly or indirectly measured relative to a fixed point, preferably coupled to a goniometer frame of the apparatus, accurate angle detection is ensured. The encoders can also be used as adjusting mechanisms for exact, flexible angular adjustment.
    Type: Grant
    Filed: August 12, 1992
    Date of Patent: December 7, 1993
    Assignee: U.S. Philips Corporation
    Inventor: Stefan L. A. Van Vlijmen