Abstract: A method for operating a coating system for producing layer systems includes the steps of: (i) coating a layer system in a coating facility; (ii) determining a spectral actual measuring plot for the layer system in an optical measuring system; (iii) determining an actual data set by fitting a simulation target measuring plot to the actual measuring plot; (iv) determining actual layer parameters as computed actual layer parameters from the simulation target measuring plot by simulation of the layer system using the actual data set; (v) outputting the actual data set and the computed actual layer parameters at least to a decision system; (vi) providing quality requirement data; and (vii) deciding on an approval of the layer system in the decision system on the basis of a comparison of at least the actual data set, the computed actual layer parameters and. the quality requirement data. A coating system for producing layer systems is also disclosed.

Abstract: A self-controlling feedback method for operating at least one coating installation for producing layer systems, a method for producing a layer system in at least one coating installation, a method for running in a coating process in at least one coating installation for producing a layer system, a coating system for producing a layer system, a coating installation for producing a layer system, a system of coating installations for producing layer systems, a database for storing installation datasets, a computer program product for a method for operating at least one coating installation, and a data processing system for executing a data processing program are disclosed.

Abstract: An optical element includes a substrate and an interferometric reflection-reducing layer system on at least one surface of the substrate. The layer system includes a stack of at least four successive layer packets, wherein each layer packet includes a first sub-layer with a first optical depth and a second sub-layer with a second optical depth which differs from the first optical depth. The refractive index of each first sub-layer nearer the substrate is greater than the refractive index of each second sub-layer further away from the substrate, of the respective stack, wherein the layer system has a brightness, a colorfulness, and a hue angle of a residual reflection color. The value of a change in the hue angle of the residual reflection color in a range of a viewing angle with the boundary values of 0° and 30° relative to a surface normal to the layer system is smaller than the value of a change in the colorfulness in the range of the viewing angle.