Abstract: A second generation NIST Kibble balance includes: a main body including a main body fulcrum node; a lever bar in mechanical communication with the main body and that pivots about the main body fulcrum node; a central flexural bridge in flexural mechanical communication with the main body and the lever bar; a measurement mass arm mechanically coupled to the main body via the lever bar, the central flexural bridge, and a mass arm flexural bridge; the mass arm flexural bridge in flexural mechanical communication with the measurement mass arm and the lever bar; a reference force arm mechanically coupled to the main body via the lever bar, the central flexural bridge, and a reference arm flexural bridge; and the reference arm flexural bridge in flexural mechanical communication with the reference force arm and the lever bar.

Abstract: A double-balance electronic test apparatus can measure inductance, capacitance, and resistance more accurately than a single-balance meter. The double-balance electronic test apparatus includes two circuits to balance the impedance of a device under test, and uses the balance to calculate the inductance, capacitance, and resistance of the impedance device under test.

Abstract: Apparatus in accordance with embodiments of the present invention provide torque realization via electrical measurements traceable to the revised International Standard of Units (SI). Torque can be realized via a conversion of linear mechanism of a Kibble balance to a rotational mechanism. Embodiments of the present invention relates to an electronic torque realization apparatus including a rotor for holding permanent magnets and an encoder scale ring and for coupling to a torque device, a stator for characterizing physical aspects of a torque tool and for generating the torque on rotor in conjunction with the permanent magnets, a base plate for mounting a first end of rotor and stator, a cantilever for supporting a second end of rotor and for maintaining axial alignment, a bearing assembly for supporting the motion of rotor, and encoder for recording the angular position of rotor.

Abstract: Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.

Abstract: Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.

Abstract: A DRAM capacitor is described that contains a BaSrTiO3 (BST) dielectric. The dielectric has a three-layer structure enabling the formation of a potential trough in which electrons can be permanently trapped.

Abstract: A DRAM capacitor is described that contains a BaSrTiO3 (BST) dielectric. The dielectric has a three-layer structure enabling the formation of a potential trough in which electrons can be permanently trapped.