Patents by Inventor Stephan Thiberge

Stephan Thiberge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
    Patent number: 7253418
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Grant
    Filed: August 19, 2005
    Date of Patent: August 7, 2007
    Assignees: Yeda Research and Development Co. Ltd., El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
    Publication number: 20060033038
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Application
    Filed: August 19, 2005
    Publication date: February 16, 2006
    Applicants: YEDA RESEARCH AND DEVELOPMENT CO. LTD., EL-MUL TECHNOLOGIES LTD.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
    Patent number: 6992300
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: January 31, 2006
    Assignees: Yeda Research and Development Co., Ltd, El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
    Patent number: 6989542
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: January 24, 2006
    Assignees: Yeda Research and Development Co., Ltd., El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Low-pressure chamber for scanning electron microscopy in a wet environment
    Publication number: 20050279938
    Abstract: A specimen enclosure assembly (100) for use in an electron microscope and including a rigid specimen enclosure dish (102) having an aperture (122) and defining an enclosed specimen placement volume (125), at electron beam permeable, fluid impermeable, cover (114) sealing the specimen placement volume (125) at the aperture (122) from a volume outside the enclosure and a pressure controller communicating with the enclosed specimen placement volume (125) and being operative to maintain the enclosed specimen placement volume (125) at a pressure, which exceeds a vapor pressure of a liquid sample (123) in the specimen placement volume (125) and is greater than a pressure of a volume outside the enclosure, whereby a pressure differential across the cover (114) does not exceed a threshold level at which rupture of the cover (114) would occur
    Type: Application
    Filed: June 1, 2003
    Publication date: December 22, 2005
    Applicant: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
    Inventors: Elisha Moses, Stephan Thiberge
  • Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
    Publication number: 20040217297
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Application
    Filed: May 6, 2004
    Publication date: November 4, 2004
    Applicants: YEDA RESEARCH AND DEVELOPMENT CO. LTD., EL-MUL TECHNOLOGIES LTD.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
    Publication number: 20040046120
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Application
    Filed: May 27, 2003
    Publication date: March 11, 2004
    Applicants: Yeda Research and Development Co., Ltd., El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge