Abstract: A device includes a PWM circuit to generate a complementary PWM signal comprised of a positive polarity PWM signal and a negative polarity PWM signal. The positive polarity signal may drive a high-side switch. A trigger multiplexer may take as input the negative polarity PWM signal and may force an output based on a predetermined condition, the predetermined condition including but not limited to the maximum on-time of a low-side switch. The output of the trigger multiplexer may drive a low-side switch. The high-side switch and the low-side switch may drive a load.

Abstract: A device including an input to receive a clock signal, a ramp start program register, a ramp start active register, a ramp stop program register, a ramp stop active register, a ramp slope program register, a ramp slope active register, an update controller, the update controller to update, based on a programmable condition, respectively, the ramp start active register contents, the ramp stop active register contents and the ramp slope active register contents, and a ramp controller to generate a ramp signal, the ramp signal to begin at the value reflective of the ramp start active register contents, the ramp signal to change value at each cycle of the clock signal based on the value reflective of the ramp slope active register contents, and the ramp signal to stop at the value reflective of the ramp stop active register contents.

Abstract: An inductor-inductor-capacitor (LLC) power converter includes a current input interface to receive a current input indication. The current input indication includes a voltage to represent a current passing through of a primary side of the LLC power converter. The LLC power converter includes voltage input interface to receive a voltage input. The voltage input is to include a representative voltage to be provided from a secondary side of the LLC power converter. The LLC power converter includes a control circuit to generate pulsed-width modulation (PWM) control signals for the LLC power converter. The control circuit is to match an on-time period of a first leg and a second leg of the LLC power converter and based upon the current input indication and the voltage input.

Abstract: A fault event monitor and filter having a digital comparator receiving a digital input value, wherein the digital comparator generates a plurality of outputs based on programmable threshold input values, a first counter coupled to a first output of the plurality of outputs of the digital comparator, a second counter coupled to a second output of the plurality of outputs of the digital comparator, and an output controller with a first input coupled to an output of the first counter and with a second input coupled to an output of the second counter, wherein the output controller to generate a fault event signal based at least partially on signals received from the first and second counters.

Abstract: An apparatus includes an adjustment circuit configured to receive a pulsed-width modulation (PWM) input, generate an adjusted PWM signal based upon the PWM input, and determine that a first pulse of the PWM input is shorter than a runt signal limit. The adjustment circuit is further configured to, in the adjusted PWM signal, extend the first pulse of the PWM input based on the determination that the PWM input is shorter than the runt signal limit, and output the adjusted PWM signal to an electronic device.

Abstract: An article of manufacture includes a non-transitory machine-readable medium. The medium includes instructions. The instructions, when read and executed by a processor, cause the processor to identify a first input instruction in a code stream to be executed, determine that the first input instruction includes an atomic operation designation, and selectively block interrupts for a duration of execution of the first input instruction and a second input instruction. The second input instruction is to immediately follow the first input instruction in the code stream.

Abstract: An apparatus includes an adjustment circuit configured to receive a pulsed-width modulation (PWM) input, generate an adjusted PWM signal based upon the PWM input, and determine that a first pulse of the PWM input is shorter than a runt signal limit. The adjustment circuit is further configured to, in the adjusted PWM signal, extend the first pulse of the PWM input based on the determination that the PWM input is shorter than the runt signal limit, and output the adjusted PWM signal to an electronic device.

Abstract: An apparatus includes an adjustment circuit configured to receive a pulsed-width modulation (PWM) input, generate an adjusted PWM signal based upon the PWM input, and determine that a first pulse of the PWM input is shorter than a runt signal limit. The adjustment circuit is further configured to, in the adjusted PWM signal, extend the first pulse of the PWM input based on the determination that the PWM input is shorter than the runt signal limit, and output the adjusted PWM signal to an electronic device.

Abstract: An apparatus includes a debugger circuit, debug pins, and a test controller circuit. The test controller circuit is configured to, in a programming mode, determine a subset of the debug pins used in programming the apparatus. The test controller circuit is further configured to save a designation of the subset of the debug pins. The test controller circuit is further configured to, in a test mode subsequent to the programming mode, use the designation to route the subset of the debug pins used in programming the apparatus to the debugger circuit for debug input and output with the server.

Abstract: A temperature-compensating clock frequency monitor circuit may be provided to detect a clock pulse frequency in an electronic device that may cause erratic or dangerous operation of the device, as a function of an operating temperature of the device. The temperature-compensating clock frequency monitor circuit include a temperature sensor configured to measure a temperature associated with an electronic device, a clock having an operating frequency, and a frequency monitoring system. The frequency monitoring system may be configured to determine the operating frequency of the clock, and based at least on (a) the operating frequency of the clock and (b) the measured temperature associated with the electronic device, generate a corrective action signal to initiate a corrective action associated with the electronic device or a related device. The temperature sensor, clock, and frequency monitoring system may, for example, be provided on a microcontroller.

Abstract: A semiconductor die includes a feedback path coupled to the output pin, and an integrity monitor circuit (IMC). The output pin is communicatively coupled to the logic. The IMC is configured to receive a data value. The IMC is further configured to receive measured data value from the output pin routed through the feedback path, compare the data value and the measured data value, and, based on the comparison, determine whether an error has occurred.

Abstract: A clock monitor includes a test clock input, as a reference clock input, another clock input, a measurement circuit, and control logic. The measurement circuit generates a measurement of a frequency or a duty cycle of the test clock input using the reference clock input, which is compared to a threshold. The control logic determines whether the measurement exceeded the threshold and, based on the measurement exceeding the threshold, cause generation of another measurement of a frequency or a duty cycle using the third clock input in combination with the first clock input or the reference clock input. The control logic may determine whether the other measurement exceeded a threshold and, based on such a determination, further determine that the test clock input or the reference clock input are faulty.

Abstract: A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time to produce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.

Abstract: A memory management circuit includes a direct memory access (DMA) channel. The DMA channel includes logic configured to receive a buffer of data to be written using DMA. The DMA channel further includes logic to perform bit manipulation in real-time during a DMA write cycle of the first buffer of data.

Abstract: A semiconductor die includes a feedback path coupled to the output pin, and an integrity monitor circuit (IMC). The output pin is communicatively coupled to the logic. The IMC is configured to receive a data value. The IMC is further configured to receive measured data value from the output pin routed through the feedback path, compare the data value and the measured data value, and, based on the comparison, determine whether an error has occurred.

Abstract: In an embedded device with a plurality of processor cores, each core has a static random access memory (SRAM), a memory built-in self-test (MBIST) controller associated with the SRAM, an MBIST access port coupled with the MBIST controller, an MBIST finite state machine (FSM) coupled with the MBIST access port via a first multiplexer, and a JTAG interface coupled with the MBIST access ports of each processor core via the multiplexer of each processor core.

Abstract: A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time to produce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.

Abstract: A memory management circuit includes a direct memory access (DMA) channel. The DMA channel includes logic configured to receive a buffer of data to be written using DMA. The DMA channel further includes logic to perform bit manipulation in real-time during a DMA write cycle of the first buffer of data.

Abstract: In an embedded device with a plurality of processor cores, each core has a static random access memory (SRAM), a memory built-in self-test (MBIST) controller associated with the SRAM, an MBIST access port coupled with the MBIST controller, an MBIST finite state machine (FSM) coupled with the MBIST access port via a first multiplexer, and a JTAG interface coupled with the MBIST access ports of each processor core via the multiplexer of each processor core.

Abstract: A clock monitor includes a test clock input, as a reference clock input, another clock input, a measurement circuit, and control logic. The measurement circuit generates a measurement of a frequency or a duty cycle of the test clock input using the reference clock input, which is compared to a threshold. The control logic determines whether the measurement exceeded the threshold and, based on the measurement exceeding the threshold, cause generation of another measurement of a frequency or a duty cycle using the third clock input in combination with the first clock input or the reference clock input. The control logic may determine whether the other measurement exceeded a threshold and, based on such a determination, further determine that the test clock input or the reference clock input are faulty.