Abstract: Methods for establishing benchmarks and for analyzing benefits associated with voltage scaling are provided. In one embodiment, the method for establishing benchmarks includes: (1) synthesizing a netlist from a RTL of a functional IC design; (2) implementing a layout of an IC from the netlist, wherein the synthesizing and the implementing are performed at designated voltages and frequencies over a voltage and a frequency range, the voltage range including a voltage scaling range and a voltage associated with a designated implementation of the IC; (3) obtaining measurements of at least one voltage scaling metric associated with the IC at each of the designated voltages and frequencies; and (4) normalizing measurements associated with the voltage scaling range to measurements associated with the designated implementation employing a processor to obtain normalized benchmarks for analyzing optimization of the IC associated with voltage scaling. EDA tools may be used for synthesizing, implementing and obtaining.

Abstract: Methods for establishing benchmarks and for analyzing benefits associated with voltage scaling are provided. In one embodiment, the method for establishing benchmarks includes: (1) synthesizing a netlist from a RTL of a functional IC design; (2) implementing a layout of an IC from the netlist, wherein the synthesizing and the implementing are performed at designated voltages and frequencies over a voltage and a frequency range, the voltage range including a voltage scaling range and a voltage associated with a designated implementation of the IC; (3) obtaining measurements of at least one voltage scaling metric associated with the IC at each of the designated voltages and frequencies; and (4) normalizing measurements associated with the voltage scaling range to measurements associated with the designated implementation employing a processor to obtain normalized benchmarks for analyzing optimization of the IC associated with voltage scaling. EDA tools may be used for synthesizing, implementing and obtaining.

Abstract: A signal buffering and retiming (SBR) circuit for a plurality of memory devices. A PLL-based clock generator generates a set of phase-shifted clock signals from a received host clock signal. Each of a plurality of phase selectors independently selects a subset of contiguous clock signals from the set of phase-shifted clock signals. Each subset of contiguous clock signals is applied to a different set of one or more verniers, each vernier independently selecting one of the contiguous clock signals as its retiming clock signal for use in generating either (1) an output clock signal or a retimed bit of address or control data for one or more of the memory devices or (2) a feedback clock signal for the PLL-based clock generator. The SBR circuit can be designed to satisfy relatively stringent signal timing requirements related to skew and delay.

Abstract: A signal buffering and retiming (SBR) circuit for a plurality of memory devices. A PLL-based clock generator generates a set of phase-shifted clock signals from a received host clock signal. Each of a plurality of phase selectors independently selects a subset of contiguous clock signals from the set of phase-shifted clock signals. Each subset of contiguous clock signals is applied to a different set of one or more verniers, each vernier independently selecting one of the contiguous clock signals as its retiming clock signal for use in generating either (1) an output clock signal or a retimed bit of address or control data for one or more of the memory devices or (2) a feedback clock signal for the PLL-based clock generator. The SBR circuit can be designed to satisfy relatively stringent signal timing requirements related to skew and delay.