Patents by Inventor Stephen C. Blouch

Stephen C. Blouch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10132707
    Abstract: Devices and corresponding methods can be provided to test an ionization gauge, such as a hot cathode ionization gauge, for leakage currents and to respond to the leakage currents to improve pressure measurement accuracy. Responding to the leakage current can include applying a correction to a pressure measurement signal generated by the gauge based on the leakage current. Responding to the leakage current can also include removing contamination causing the leakage current, where the contamination is on electrical feedthrough insulators or other gauge surfaces. Testing and correcting for leakage currents and removing contamination can be completed with the ionization pressure gauge in situ in its environment of use, and while the gauge remains under vacuum.
    Type: Grant
    Filed: July 9, 2015
    Date of Patent: November 20, 2018
    Assignee: MKS Instruments, Inc.
    Inventors: Stephen C. Blouch, Paul C. Arnold, Gerardo A. Brucker, Wesley J. Graba, Douglas C. Hansen
  • Publication number: 20170010171
    Abstract: Devices and corresponding methods can be provided to test an ionization gauge, such as a hot cathode ionization gauge, for leakage currents and to respond to the leakage currents to improve pressure measurement accuracy. Responding to the leakage current can include applying a correction to a pressure measurement signal generated by the gauge based on the leakage current. Responding to the leakage current can also include removing contamination causing the leakage current, where the contamination is on electrical feedthrough insulators or other gauge surfaces. Testing and correcting for leakage currents and removing contamination can be completed with the ionization pressure gauge in situ in its environment of use, and while the gauge remains under vacuum.
    Type: Application
    Filed: July 9, 2015
    Publication date: January 12, 2017
    Inventors: Stephen C. Blouch, Paul C. Arnold, Gerardo A. Brucker, Wesley J. Graba, Douglas C. Hansen
  • Patent number: 9040907
    Abstract: An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.
    Type: Grant
    Filed: October 30, 2012
    Date of Patent: May 26, 2015
    Assignee: MKS Instruments, Inc.
    Inventors: Gerardo A. Brucker, G. Jeffery Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch, Jeffrey G. McCarthy, Timothy R. Piwonka-Corle
  • Publication number: 20140264068
    Abstract: An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.
    Type: Application
    Filed: October 30, 2012
    Publication date: September 18, 2014
    Inventors: Gerardo A. Brucker, G. Jefferey Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch, Jeffrey G. McCarthy, Timothy R. Piwonka-Corle
  • Patent number: 7656165
    Abstract: A method and apparatus for operating a multi-hot-cathode ionization gauge is provided to increase the operational lifetime of the ionization gauge in gaseous process environments. In example embodiments, the life of a spare cathode is extended by heating the spare cathode to a temperature that is insufficient to emit electrons but that is sufficient to decrease the amount of material that deposits on its surface or is optimized to decrease the chemical interaction between a process gas and a material of the at least one spare cathode. The spare cathode may be constantly or periodically heated. In other embodiments, after a process pressure passes a given pressure threshold, plural cathodes may be heated to a non-emitting temperature, plural cathodes may be heated to a lower emitting temperature, or an emitting cathode may be heated to a temperature that decreases the electron emission current.
    Type: Grant
    Filed: August 21, 2008
    Date of Patent: February 2, 2010
    Assignee: Brooks Automation, Inc.
    Inventors: Larry K. Carmichael, Michael D. Borenstein, Paul C. Arnold, Stephen C. Blouch, Richard A. Knott
  • Publication number: 20080315887
    Abstract: A method and apparatus for operating a multi-hot-cathode ionization gauge is provided to increase the operational lifetime of the ionization gauge in gaseous process environments. In example embodiments, the life of a spare cathode is extended by heating the spare cathode to a temperature that is insufficient to emit electrons but that is sufficient to decrease the amount of material that deposits on its surface or is optimized to decrease the chemical interaction between a process gas and a material of the at least one spare cathode. The spare cathode may be constantly or periodically heated. In other embodiments, after a process pressure passes a given pressure threshold, plural cathodes may be heated to a non-emitting temperature, plural cathodes may be heated to a lower emitting temperature, or an emitting cathode may be heated to a temperature that decreases the electron emission current.
    Type: Application
    Filed: August 21, 2008
    Publication date: December 25, 2008
    Applicant: Brooks Automation, Inc.
    Inventors: Larry K. Carmichael, Michael D. Borenstein, Paul C. Arnold, Stephen C. Blouch, Richard A. Knott
  • Patent number: 7429863
    Abstract: A method and apparatus for operating a multi-hot-cathode ionization gauge is provided to increase the operational lifetime of the ionization gauge in gaseous process environments. In example embodiments, the life of a spare cathode is extended by heating the spare cathode to a temperature that is insufficient to emit electrons but that is sufficient to decrease the amount of material that deposits on its surface or is optimized to decrease the chemical interaction between a process gas and a material of the at least one spare cathode. The spare cathode may be constantly or periodically heated. In other embodiments, after a process pressure passes a given pressure threshold, plural cathodes may be heated to a non-emitting temperature, plural cathodes may be heated to a lower emitting temperature, or an emitting cathode may be heated to a temperature that decreases the electron emission current.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: September 30, 2008
    Assignee: Brooks Automation, Inc.
    Inventors: Larry K. Carmichael, Michael D. Borenstein, Paul C. Arnold, Stephen C. Blouch, Richard A. Knott
  • Publication number: 20080018337
    Abstract: A method and apparatus for operating a multi-hot-cathode ionization gauge is provided to increase the operational lifetime of the ionization gauge in gaseous process environments. In example embodiments, the life of a spare cathode is extended by heating the spare cathode to a temperature that is insufficient to emit electrons but that is sufficient to decrease the amount of material that deposits on its surface or is optimized to decrease the chemical interaction between a process gas and a material of the at least one spare cathode. The spare cathode may be constantly or periodically heated. In other embodiments, after a process pressure passes a given pressure threshold, plural cathodes may be heated to a non-emitting temperature, plural cathodes may be heated to a lower emitting temperature, or an emitting cathode may be heated to a temperature that decreases the electron emission current.
    Type: Application
    Filed: July 18, 2006
    Publication date: January 24, 2008
    Inventors: Larry K. Carmichael, Michael D. Borenstein, Paul C. Arnold, Stephen C. Blouch, Richard A. Knott
  • Patent number: 6553841
    Abstract: A pressure transducer assembly includes a transducer member supporting a transducer element for measuring pressure within an environment. The transducer member has a sealing surface surrounding the transducer element. A housing having an integral resilient member resiliently supports the transducer member and exerts a sealing force on the transducer member against a mating member secured to the housing.
    Type: Grant
    Filed: September 26, 2000
    Date of Patent: April 29, 2003
    Assignee: Helix Technology Corporation
    Inventor: Stephen C. Blouch