Patents by Inventor Stephen Jesse
Stephen Jesse has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11518674Abstract: A system and method (referred to as the system) fabricates controllable atomic assemblies in two and three dimensions. The systems identify by a non-invasive imager, a local atomic structure, distribution of vacancies, and dopant atoms and modify, by a microscopic modifier, the local atomic structure, via electron beam irradiation. The systems store, by a knowledge base, cause-and-effect relationships based on a non-invasive imaging and electron scans. The systems detect, by detectors, changes in the local atomic structure induced by the electron irradiation; and fabricate, a modified atomic structure by a beam control software and feedback.Type: GrantFiled: February 3, 2020Date of Patent: December 6, 2022Assignee: UT-BATTELLE, LLCInventors: Sergei V. Kalinin, Stephen Jesse, Albina Y. Borisevich, Ondrej E. Dyck, Bobby G. Sumpter, Raymond R. Unocic
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Patent number: 10777381Abstract: A system and method (referred to as a method) to fabricate nanorobots. The method generates a pixel map of an atomic object and identifies portions of the atomic object that form a nanorobot. The method stores those identifications in a memory. The method adjusts an electron beam to a noninvasive operating level and images the portions of the atomic object that form the nanorobot. The method executes a plurality of scanning profiles by the electron beam to form the nanorobot and detects nanorobot characteristics and their surroundings via the electron beam in response to executing the plurality of scanning profiles.Type: GrantFiled: August 8, 2019Date of Patent: September 15, 2020Assignee: UT-BATTELLE, LLCInventors: Sergei V. Kalinin, Stephen Jesse, Ondrej E. Dyck, Bobby G. Sumpter
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Publication number: 20200247667Abstract: A system and method (referred to as the system) fabricates controllable atomic assemblies in two and three dimensions. The systems identify by a non-invasive imager, a local atomic structure, distribution of vacancies, and dopant atoms and modify, by a microscopic modifier, the local atomic structure, via electron beam irradiation. The systems store, by a knowledge base, cause-and-effect relationships based on a non-invasive imaging and electron scans. The systems detect, by detectors, changes in the local atomic structure induced by the electron irradiation; and fabricate, a modified atomic structure by a beam control software and feedback.Type: ApplicationFiled: February 3, 2020Publication date: August 6, 2020Inventors: Sergei V. Kalinin, Stephen Jesse, Albina Y. Borisevich, Ondrej E. Dyck, Bobby G. Sumpter, Raymond R. Unocic
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Patent number: 10400351Abstract: A method for sculpting crystalline oxide structures for bulk nanofabrication is provided. The method includes the controlled electron beam induced irradiation of amorphous and liquid phase precursor solutions using a scanning transmission electron microscope. The atomically focused electron beam includes operating parameters (e.g., location, dwell time, raster speed) that are selected to provide a higher electron dose in patterned areas and a lower electron dose in non-patterned areas. Concurrently with the epitaxial growth of crystalline features, the present method includes scanning the substrate to provide information on the size of the crystalline features with atomic resolution. This approach provides for atomic level sculpting of crystalline oxide materials from a metastable amorphous precursor and the liquid phase patterning of nanocrystals.Type: GrantFiled: September 7, 2017Date of Patent: September 3, 2019Assignee: UT-Battelle, LLCInventors: Albina Y. Borisevich, Stephen Jesse, Sergei V. Kalinin, Andrew R. Lupini, Raymond R. Unocic, Qian He
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Publication number: 20180066376Abstract: A method for sculpting crystalline oxide structures for bulk nanofabrication is provided. The method includes the controlled electron beam induced irradiation of amorphous and liquid phase precursor solutions using a scanning transmission electron microscope. The atomically focused electron beam includes operating parameters (e.g., location, dwell time, raster speed) that are selected to provide a higher electron dose in patterned areas and a lower electron dose in non-patterned areas. Concurrently with the epitaxial growth of crystalline features, the present method includes scanning the substrate to provide information on the size of the crystalline features with atomic resolution. This approach provides for atomic level sculpting of crystalline oxide materials from a metastable amorphous precursor and the liquid phase patterning of nanocrystals.Type: ApplicationFiled: September 7, 2017Publication date: March 8, 2018Inventors: Albina Y. Borisevich, Stephen Jesse, Sergei V. Kalinin, Andrew R. Lupini, Raymond R. Unocic, Qian He
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Patent number: 9612257Abstract: Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.Type: GrantFiled: March 7, 2016Date of Patent: April 4, 2017Assignee: UT-Battelle, LLCInventors: Stephen Jesse, Alex Belianinov, Sergei V. Kalinin, Suhas Somnath
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Patent number: 9541576Abstract: A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.Type: GrantFiled: July 28, 2015Date of Patent: January 10, 2017Assignee: UT-Battelle, LLCInventors: Sergei V. Kalinin, Stephen Jesse, Liam F. Collins, Brian J. Rodriguez
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Patent number: 9535087Abstract: Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.Type: GrantFiled: June 26, 2015Date of Patent: January 3, 2017Assignee: UT-Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Publication number: 20160025773Abstract: A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.Type: ApplicationFiled: July 28, 2015Publication date: January 28, 2016Inventors: Sergei V. Kalinin, Stephen Jesse, Liam F. Collins, Brian J. Rodriguez
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Publication number: 20150293144Abstract: Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.Type: ApplicationFiled: June 26, 2015Publication date: October 15, 2015Applicant: UT-BATTELLE, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Patent number: 9097738Abstract: Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.Type: GrantFiled: May 3, 2013Date of Patent: August 4, 2015Assignee: UT-Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Publication number: 20150089693Abstract: A multi-resonant detection system (MRD) chip comprises an AFM tip, a cantilever, and resonator members separately positioned relative to the cantilever and tip. The chip may be fabricated from a silicon wafer. Frequency of tip motion is detected or actuated by displacement of resonator members. A rigid member, which is coupled to the chip by flexible members, coupled to the resonator members and rigidly coupled to the cantilever, enables tip motion. Resonator members include an array of discrete resonator bars, a single resonator bar or a continuous membrane which resonates at a continuous range of frequency. Tip motion is detected by measuring displacement of the resonator members using angle of light reflection, capacitance, piezo-resistive or piezo-strain techniques. Tip motion is actuated using displacement of the resonator members and capacitive, piezo-strain or piezo-resistive techniques. Resonator members may be encased by cover plates and/or hermetically sealed for measurements in a liquid medium.Type: ApplicationFiled: August 15, 2014Publication date: March 26, 2015Inventor: Stephen Jesse
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Patent number: 8752211Abstract: An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.Type: GrantFiled: August 3, 2012Date of Patent: June 10, 2014Assignee: UT-Battelle, LLCInventors: Sergei V. Kalinin, Nina Balke, Albina Y. Borisevich, Stephen Jesse, Petro Maksymovych, Yunseok Kim, Evgheni Strelcov
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Patent number: 8719961Abstract: A method and system for probing mobile ion diffusivity and electrochemical reactivity on a nanometer length scale of a free electrochemically active surface includes a control module that biases the surface of the material. An electrical excitation signal is applied to the material and induces the movement of mobile ions. An SPM probe in contact with the surface of the material detects the displacement of mobile ions at the surface of the material. A detector measures an electromechanical strain response at the surface of the material based on the movement and reactions of the mobile ions. The use of an SPM tip to detect local deformations allows highly reproducible measurements in an ambient environment without visible changes in surface structure. The measurements illustrate effective spatial resolution comparable with defect spacing and well below characteristic grain sizes of the material.Type: GrantFiled: November 8, 2011Date of Patent: May 6, 2014Assignee: UT-Battelle, LLCInventors: Sergei V. Kalinin, Nina Balke, Amit Kumar, Nancy J. Dudney, Stephen Jesse
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Publication number: 20140042373Abstract: The present invention, in one embodiment, provides a method of forming an organic electric device that includes providing a plurality of carbon nanostructures; and dispersing the plurality of carbon nanostructures in a polymeric matrix to provide a polymeric composite, wherein when the plurality of carbon nanostructures are present at a first concentration an interface of the plurality of carbon nanostructures and the polymeric matrix is characterized by charge transport when an external energy is applied, and when the plurality of carbon nanostructures are present at a second concentration the interface of the plurality of carbon nanostructures and the polymeric matrix are characterized by exciton dissociation when an external energy is applied, wherein the first concentration is less than the second concentration.Type: ApplicationFiled: September 9, 2013Publication date: February 13, 2014Applicants: University of Tennessee Research Foundation, UT-BATTELLE LLCInventors: David Bruce Geohegan, Ilia N. Ivanov, Alexander A. Puretzky, Stephen Jesse, Bin Hu, Matthew Garrett, Bin Zhao
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Publication number: 20140041085Abstract: An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.Type: ApplicationFiled: August 3, 2012Publication date: February 6, 2014Inventors: Sergei V. Kalinin, Nina Balke, Albina Y. Borisevich, Stephen Jesse, Petro Maksymovych, Yunseok Kim, Evgheni Strelcov
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Patent number: 8540542Abstract: The present invention, in one embodiment, provides a method of forming an organic electric device that includes providing a plurality of carbon nanostructures; and dispersing the plurality of carbon nanostructures in a polymeric matrix to provide a polymeric composite, wherein when the plurality of carbon nanostructures are present at a first concentration an interface of the plurality of carbon nanostructures and the polymeric matrix is characterized by charge transport when an external energy is applied, and when the plurality of carbon nanostructures are present at a second concentration the interface of the plurality of carbon nanostructures and the polymeric matrix are characterized by exciton dissociation when an external energy is applied, wherein the first concentration is less than the second concentration.Type: GrantFiled: April 8, 2011Date of Patent: September 24, 2013Assignees: UT-Battelle, LLC, University of Tennessee Research FoundationInventors: David Bruce Geohegan, Ilia N. Ivanov, Alexander A. Puretzky, Stephen Jesse, Bin Hu, Matthew Garrett, Bin Zhao
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Patent number: 8484759Abstract: An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.Type: GrantFiled: August 17, 2010Date of Patent: July 9, 2013Assignee: UT-Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin, Maxim P. Nikiforov
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Patent number: 8448502Abstract: Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation).Type: GrantFiled: June 2, 2010Date of Patent: May 28, 2013Assignee: UT Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Publication number: 20130111636Abstract: This system includes non-linear interaction imaging and spectroscopy (“NIIS”) for scanning probe microscopy. Scanning probe microscopy operates with an oscillating tip and cantilever to monitor characteristics of the oscillation and NIIS measures both the linear and non-linear components of the interactions between the probe tip and the surface.Type: ApplicationFiled: October 28, 2011Publication date: May 2, 2013Applicant: UT-BATTELLE, LLCInventor: Stephen Jesse