Abstract: A universal circuit board probe assembly connects a variety of circuit board types to a diagnostic system. The probe assembly is an integrated system which includes a general purpose perforate platform having perforations in a uniform grid pattern, a plurality of floating connector pins of the type having an opposing double-action movement, a removable backing plate which confronts the platform, pin displacement modules which removably mount to the backing plate and are disposed to abut to the connector pins, means for aligning the backing plate with the platform and circuit board test points, means for urging the modules in contact with connector pins to activate the connector pins for testing, and means for causing the activated connector pins to engage test points on a circuit board to be tested.

Abstract: An electrical contact assembly for electrically coupling a first contact location on a first side of a planar test fixture to a second contact location on the opposing side of the test fixture. A first tubular barrel is provided for fixably mounting through a test fixture. A second tubular barrel is mounted within said first barrel with one end disposed to extend toward said first contact location. The second tubular barrel is reciprocally movable within the first barrel between a first position extending toward said first contact location and a second position extending toward said second contact location. The second barrel is biased toward said first position. A plunger is mounted within said second tubular barrel with one end disposed to extend toward said second contact location. The plunger is reciprocally movable within said second barrel between a first position extending toward said second contact location and a second position extending toward said first contact location.