Abstract: Embodiments of the invention provide for integrated circuits for testing one or more transistors for process variation effects. According to an embodiment, the integrated circuit can include: a plurality of ring oscillator macro circuits, wherein each ring oscillator macro circuit includes two ring oscillators, a first multiplexer, and a first divide-by-two circuit; a multiplexer stage; a divide-by-two circuit stage; a second multiplexer; a second divide-by-two circuit; and frequency measurement circuit. According to another embodiment, the integrated circuit can include: a first shift register including a plurality of devices-under-test; a second shift register including a plurality of static latches; a first multiplexer configured to receive outputs from each of the plurality of DUTs; a second multiplexer configured to receive outputs from each of the plurality of static latches; and a comparator configured to compare an output from the first multiplexer with an output from the second multiplexer.

Abstract: Embodiments of the invention provide for a dynamic pulse generator which can combine both the sequential element and the pulse logic into one stage, thereby eliminating the wasted time resulting from a pulse generator' input-to-output propagation delay. The dynamic pulse generator can include a plurality of P-MOS an N-MOS transistors, a first delay element, and a second delay element.

Abstract: Power dissipation of sequential static latch, implemented in CMOS, may be reduced by removing clocked elements from the circuit. One way to do this may be to replace a clocked digital feedback path with an analog programmable feedback path. An analog programmable feedback path, such as disclosed, may, for example, provide a constant, non-clocked bias by providing constant bias voltages to transistors in the feedback path such that they function as analog devices rather than digital switches. This bias may be adjusted, e.g., to reflect the circuit's operating environment.

Abstract: An interferometrically readable optical encoder for sensing linear position includes an optical medium movable in a linear direction and having a data storage layer, a plurality of uniformly sized sectors being defined in the layer. A linear absolute track is defined in the layer parallel to the linear direction and a plurality of absolute marks is formed in the layer in sequence along the absolute track within each sector, each such absolute mark being detectable by interferometric reflection of coherent light as representative of a binary 1 or a binary 0 and each such plurality of absolute marks defining a binary word. A linear incremental track is defined in the layer parallel to the linear direction with a series of incremental marks formed in the layer and evenly spaced along the first incremental track, each such incremental mark being detectable by interferometric reflection of coherent light.

Abstract: An optical encoder for sensing angular position includes a rotatable optical medium having a major surface and an axis of rotation perpendicular to the surface, with a plurality of uniformly sized angular sectors defined on the surface. An annular absolute track is defined on the surface concentric with the axis, a plurality of digital bits being formed on the surface in sequence along the absolute track within each sector. Each such bit is optically readable as a binary 1 or a binary 0, with each plurality of bits defining a binary word. A first series of optically detectable incremental marks are evenly spaced around a first incremental track on the surface. The binary word in a sector is optically read to identify the angular position of that sector and indicate the approximate angular position of the medium, while the first series of incremental marks can be optically detected to refine the approximate angular position indication.