Patents by Inventor Steve Eppell

Steve Eppell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning force microscope to determine interaction forces with high-frequency cantilever
    Patent number: 6452170
    Abstract: An apparatus and method for determining a force of interaction between a sample and a tip on a cantilever. The method uses a non-Hookian equation to model the cantilever as it is deflected by the force of interaction between the sample and the cantilever tip. The sample is positioned at a predetermined distance from the cantilever tip such that the cantilever is deflected by the force of interaction. The positions of a plurality of points on the cantilever are then rapidly measured and the force of interaction from the measured positions is then obtained using a non-Hookian model that accounts for higher order vibrational modes of the cantilever.
    Type: Grant
    Filed: April 7, 2000
    Date of Patent: September 17, 2002
    Assignees: University of Puerto Rico, Case Western Reserve University
    Inventors: Fredy R. Zypman, Steve Eppell