Patents by Inventor Steven Alfred Grundon

Steven Alfred Grundon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6611905
    Abstract: A data processing system, and a method of operating a data processing system. The data processing system comprises a clock generator for generating a system clock signal, and a memory unit having a plurality of memory modules for storing data. The data processing system further comprises a memory controller coupled to the clock generator for receiving the system clock signal therefrom, and coupled to the memory modules for outputting memory address and control signals to said modules. The memory controller is programmable to have different clock-to-output delays, on signals from the memory controller end, based on the memory installed in the system.
    Type: Grant
    Filed: June 29, 2000
    Date of Patent: August 26, 2003
    Assignee: International Business Machines Corporation
    Inventors: Steven Alfred Grundon, Bruce Gerard Hazelzet, Mark William Kellogg, James Lewis Rogers
  • Patent number: 6139647
    Abstract: A post-etch structure resulting in the inverse of a sidewall spacer etch, i.e. removal of the spacer. A vertical portion of a film is removed while leaving horizontal portions substantially intact. A facet is left in the film in register with an upper corner formed by the vertical and horizontal portions of the underlying body.
    Type: Grant
    Filed: April 2, 1998
    Date of Patent: October 31, 2000
    Assignee: International Business Machines Corporation
    Inventors: Michael David Armacost, Steven Alfred Grundon, David Laurant Harmon, Donald McAlpine Kenney
  • Patent number: 5767017
    Abstract: A body is provided with a substantially horizontal surface and a substantially vertical surface. A film is formed on the body with a substantially horizontal portion on the substantially horizontal surface, a substantially vertical portion on the substantially vertical surface, and a corner region joining the substantially horizontal and substantially vertical portions. The corner region and the substantially vertical portion of the film are removed while the body and the substantially horizontal portion of the film are left substantially intact. A high density plasma with a fluorocarbon-based etching gas may be used to remove the vertical portion and corner region.
    Type: Grant
    Filed: December 21, 1995
    Date of Patent: June 16, 1998
    Assignee: International Business Machines Corporation
    Inventors: Michael David Armacost, Steven Alfred Grundon, David Laurant Harmon, Donald McAlpine Kenney
  • Patent number: 5714798
    Abstract: Disclosed is a process for depositing a conformal polymer coating on selected areas of a silicon substrate. The substrate is first exposed through a mask to a gaseous plasma so as to form a film of desired pattern, the plasma comprising a compound having strong electron donating characteristics. Then, the patterned film and the remaining substrate not covered by the film are exposed to the vapor of a monomer, which condenses and polymerizes on the exposed substrate surfaces, but not on the film. The film serves to inhibit substantial deposition of the coating, so as to provide a selective deposition, where the coating is formed only on those areas of the substrate where desired.
    Type: Grant
    Filed: September 13, 1996
    Date of Patent: February 3, 1998
    Assignee: International Business Machines Corp.
    Inventors: Michael David Armacost, Steven Alfred Grundon, David Laurant Harmon, Son Van Nguyen, John Francis Rembetski