Abstract: Methods and devices receive a print job, evaluate the print job to identify job parameter settings and associated sources of the job parameter settings, transmit the job parameter settings and the associated sources to a database, and transmit the print job to a marking device to cause the marking device to print the print job. These methods and devices also provide access to the database to view the job parameter settings and the associated sources, and/or change the job parameter settings. The access to the database is provided before and/or after the marking device prints the print job. When evaluating the print job, these methods and devices identify “potential” and “final” job parameter settings and associated sources. The final settings and sources are used to perform marking and finishing operations, while the potential setting and sources comprise a pre-printing, job preparation history in the database.

Abstract: Methods and devices receive a print job, evaluate the print job to identify job parameter settings and associated sources of the job parameter settings, transmit the job parameter settings and the associated sources to a database, and transmit the print job to a marking device to cause the marking device to print the print job. These methods and devices also provide access to the database to view the job parameter settings and the associated sources, and/or change the job parameter settings. The access to the database is provided before and/or after the marking device prints the print job. When evaluating the print job, these methods and devices identify “potential” and “final” job parameter settings and associated sources. The final settings and sources are used to perform marking and finishing operations, while the potential setting and sources comprise a pre-printing, job preparation history in the database.

Abstract: A method and computer program for detecting and locating defects in integrated circuit die from stimulation of statistical outlier signatures includes receiving as input a test value of an electrical parameter measured for each of a plurality of identically designed electrical circuits, identifying one of the identically designed electrical circuits as an outlier for which the test value of the electrical parameter varies from a mean test value of the electrical parameter for the plurality of identically designed electrical circuits by at least a selected difference, monitoring the test value while subjecting a location on the outlier to a stimulus to detect a change in the test value as a function of the location, and generating as output the location for which the change in the test value is detected to identify a defect in the outlier.

Abstract: A test scheme which includes a drive circuit connected to a plurality of IP cores (such as memory blocks, processors (i.e., ARM, MIPS, ZSP) or special types of IO's (i.e., Gigablaze, Hyperphi)). The drive circuit is configured to simultaneously send the same input stimuli to each of the IP cores. Outputs of the IP cores are run through a comparator, and the comparator is configured to identify when the outputs from the IP cores are not identical.