Abstract: A system comprising a processor configured to obtain a feature set for a component and generate random trees based on the feature set and a training data set, wherein each of the random trees can include at least one predictive value representing a probability of a feature of the random trees indicating a failure of the component within a period of time. The processor can also select a subset of the random trees based on the at least one predictive value, determine a likelihood of the failure of the component based on operational data for one or more devices and the subset of the random trees, and transmit an explanation to a remote device for the likelihood of failure of the component by indicating the feature selected from the subset of the random trees.

Abstract: Methods and systems are provided for monitoring optical transceiver devices. In one embodiment, a method comprises predicting degradation of an optical transceiver device based on values of an operating parameter of the optical transceiver device obtained over time, and generating a notification of the degradation of the optical transceiver device. In this way, an optical transceiver device that is susceptible to degradation may be pre-emptively identified and replaced, thereby preventing failures of a communication system including the optical transceiver device.

Abstract: A system for acquiring and analyzing fault conditions for at least one coil of Magnetic Resonance Imaging (MRI) system. Each of the at least one coils is electrically connected through a transmit/receive (T/R) bias circuit to an interface. The system has a central processing unit with a processor configured to execute programmable instructions which when executed by the processor cause the processor to conduct circuit tests at predetermined intervals for the at least one coil, acquire data for the at least one coil to construct a data log with a plurality of input events, and algorithmically filter and analyze the plurality of input events to create an output configured to predict a failure event of the at least one coil. A method for analyzing and acquiring fault conditions is also provided.

Abstract: A system for acquiring and analyzing fault conditions for at least one coil of Magnetic Resonance Imaging (MRI) system. Each of the at least one coils is electrically connected through a transmit/receive (T/R) bias circuit to an interface. The system has a central processing unit with a processor configured to execute programmable instructions which when executed by the processor cause the processor to conduct circuit tests at predetermined intervals for the at least one coil, acquire data for the at least one coil to construct a data log with a plurality of input events, and algorithmically filter and analyze the plurality of input events to create an output configured to predict a failure event of the at least one coil. A method for analyzing and acquiring fault conditions is also provided.