Patents by Inventor Steven M. Shepard
Steven M. Shepard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11474059Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.Type: GrantFiled: April 27, 2021Date of Patent: October 18, 2022Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Maria Frendberg Beemer
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Publication number: 20210341403Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.Type: ApplicationFiled: April 27, 2021Publication date: November 4, 2021Applicant: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Maria Frendberg Beemer
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Patent number: 9250134Abstract: An assembly including an optically excited infrared nondestructive testing active thermography system is disclosed. The optically excited infrared nondestructive testing active thermography system includes one or more illumination sources, at least one first reflector, at least one second reflector and a computing resource. The at least one first reflector is arranged about the one or more illumination sources. The at least one first reflector has a near focal point and a far focal point. The one or more illumination sources is/are positioned at least proximate the near focal point of the at least one first reflector. The at least one second reflector is positioned at least proximate the far focal point. The computing resource is communicatively-coupled to a motor that is coupled to the at least one second reflector for manipulating the at least one second reflector between at least: a first spatial orientation and a second spatial orientation.Type: GrantFiled: September 23, 2014Date of Patent: February 2, 2016Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Timothy Young, Maria Frendberg Beemer
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Patent number: 9157878Abstract: A system for detecting aberrations within a workpiece having a conduit with an input end and an output end is disclosed. The system comprises a fluid delivery device arranged proximate to input end of conduit to pass fluid into input end of the conduit, the fluid delivery device having one or more fluid controllers that control one or more conditions of the fluid passed thereby, a sensor having an input and an output, the input arranged proximate to output end of conduit to measure one or more conditions of the fluid experienced by input, a workpiece exciter situated to excite workpiece and a processor having an input connected to the output of sensor, the processor having a correlator to correlate any changed of the one or more conditions of the fluid experienced by input of sensor with an excitement of workpiece by sensor.Type: GrantFiled: October 10, 2012Date of Patent: October 13, 2015Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 9080453Abstract: A method of thermal inspection of a component defining at least one internal passageway at a thermal equilibrium state with its surrounding environment, the method includes: capturing a sequence of thermal indications of a surface of the component, delivering an airflow pulse at the thermal equilibrium state of the at least one internal passageway into the at least one internal passageway, and receiving a temperature response signal as a function of time based on the received thermal indication. The method also includes determining a level of blockage of the at least one internal passageway based on the temperature response signal.Type: GrantFiled: October 16, 2012Date of Patent: July 14, 2015Assignee: THERMAL WAVE IMAGING, INC.Inventors: Steven M. Shepard, James R. Lhota, Tasdiq Ahmed, Bharat Bhushan Chaudhry
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Publication number: 20150083920Abstract: An assembly including an optically excited infrared nondestructive testing active thermography system is disclosed. The optically excited infrared nondestructive testing active thermography system includes one or more illumination sources, at least one first reflector, at least one second reflector and a computing resource. The at least one first reflector is arranged about the one or more illumination sources. The at least one first reflector has a near focal point and a far focal point. The one or more illumination sources is/are positioned at least proximate the near focal point of the at least one first reflector. The at least one second reflector is positioned at least proximate the far focal point. The computing resource is communicatively-coupled to a motor that is coupled to the at least one second reflector for manipulating the at least one second reflector between at least: a first spatial orientation and a second spatial orientation.Type: ApplicationFiled: September 23, 2014Publication date: March 26, 2015Inventors: Steven M. Shepard, Timothy Young, Maria Frendberg Beemer
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Patent number: 7724925Abstract: A method for compiling thermographic data including obtaining data indicative of a monotonically changing characteristic of a specimen, sequencing the data or a surrogate of the data into a plurality of groups, categorizing, within each group, the frequency distribution of an attribute of the data or an attribute of said surrogate data, and compiling, from one or more groups, a collection of two or more of the frequency distributions.Type: GrantFiled: May 18, 2004Date of Patent: May 25, 2010Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 7186981Abstract: A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the power supply to deliver electrical power to the heat source, a sensor for sensing the delivery of electrical power to the heat source, a flash duration module coupled to said sensor for measuring a duration of time, and a gate device coupled to said flash duration module for gating the electrical power utilized by the heat source. A method for thermographically evaluating a sample is also disclosed.Type: GrantFiled: July 29, 2004Date of Patent: March 6, 2007Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Timothy Young
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Patent number: 7083327Abstract: A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.Type: GrantFiled: December 2, 1999Date of Patent: August 1, 2006Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6795784Abstract: A method an apparatus for non-destructive testing and evaluation of part samples includes obtaining a defect image of the sample, displaying the defect image on a display, referencing the defect image, such as through marking or annotation, to highlight locations at which defects or measurements are found, superimposing the defect image onto a live image of the part, and physically marking/annotating the part, tracing the marks from the defect image onto the physical sample, while viewing the live image. Because both the defect image and the live image are viewed through the same camera lens and are therefore subject to the same amount of distortion, the actual sample can be marked exactly according to the marks made in the defect image; there is no need to attempt matching a distorted defect image with the physical sample, as has been done in the prior art.Type: GrantFiled: January 12, 2001Date of Patent: September 21, 2004Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6751342Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture multiple, spatially different images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics.Type: GrantFiled: April 15, 2002Date of Patent: June 15, 2004Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6585146Abstract: A method and apparatus for automated, non-destructive evaluation of spot welds includes a device for heating a sample containing a spot weld, an infrared camera for detecting changes in the surface temperature of the weld, and a computer to acquire and analyze data from the camera. In one embodiment, the sample is heated on one side and the time-temperature characteristic is monitored as the heat travels through the sample and the spot weld. The computer generates a histogram that represents the relationship between a particular time-temperature characteristic and the number of pixels exhibiting that characteristic, thereby representing the quality and size of the weld nugget. By generating a histogram corresponding to weld quality, the inventive apparatus and method provides an objective weld quality indicator and allows automation of the evaluation process.Type: GrantFiled: January 5, 2001Date of Patent: July 1, 2003Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6516084Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial.Type: GrantFiled: December 4, 2000Date of Patent: February 4, 2003Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Publication number: 20020172410Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture multiple, spatially different images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics.Type: ApplicationFiled: April 15, 2002Publication date: November 21, 2002Applicant: Thermal Wave Imagining, Inc.Inventor: Steven M. Shepard
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Publication number: 20020134817Abstract: A method and apparatus for automated, non-destructive evaluation of spot welds includes a device for heating a sample containing a spot weld, an infrared camera for detecting changes in the surface temperature of the weld, and a computer to acquire and analyze data from the camera. In one embodiment, the sample is heated on one side and the time-temperature characteristic is monitored as the heat travels through the sample and the spot weld. The computer generates a histogram that represents the relationship between a particular time-temperature characteristic and the number of pixels exhibiting that characteristic, thereby representing the quality and size of the weld nugget. By generating a histogram corresponding to weld quality, the inventive apparatus and method provides an objective weld quality indicator and allows automation of the evaluation process.Type: ApplicationFiled: January 5, 2001Publication date: September 26, 2002Applicant: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Publication number: 20020044679Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial.Type: ApplicationFiled: December 4, 2000Publication date: April 18, 2002Inventor: Steven M. Shepard
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Patent number: 5982422Abstract: Disclosed is a method to image events with a camera having a focal plane ay of sensors on a charge coupled device whose parallel vertical registers clock signal charges to a horizontal register. The method includes sending a first clock signal to first gates on vertical register zones proximal to the sensors, and sending a second clock signal to second gates on distal vertical register zones remote from the sensors. A first transfer pulse on the first clock signal causes first signal charges in the sensors to transfer to the proximal zones, and then the first signal charges dissipate into the substrate of the charge coupled device. A second transfer pulse of the first clock signal occurs at a predetermined interval after the first transfer pulse and second signal charges transfer to the proximal zone. The second signal charges are clocked off the charge coupled device to become part of a video signal.Type: GrantFiled: June 20, 1994Date of Patent: November 9, 1999Assignee: The United States of America as represented by the Secretary of the ArmyInventors: Laurence Flath, Eustace L. Dereniak, John P. Garcia, Steven M. Shepard
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Patent number: 5683181Abstract: An embodiment of an apparatus for enhancing remote infrared (IR) temperature measurement of a low-emissivity sample includes a flexible membrane of a high-emissivity material for converting thermal energy from the sample into IR energy, an enclosed shroud, an IR camera, a light source, and at least one fan. The membrane is coupled to the enclosed shroud at one end of the shroud for supporting the membrane. The shroud includes at least four walls and an end wall opposite the membrane to define an interior space. The end wall includes an imaging window formed therethrough for accommodating the IR camera, which is provided for detecting IR energy radiated from the membrane. The light source is disposed in the interior space and mounted to the shroud for illuminating the membrane.Type: GrantFiled: May 12, 1995Date of Patent: November 4, 1997Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 5631465Abstract: In connection with a method of interpreting thermographic data for nondestructive evaluation of subsurface structural irregularities in a sample object, the sample object is thermally excited and then allowed to cool. As the thermal energy level on the object's surface changes, a series of positionally-fixed infrared images of the object are acquired. The method calculates a pixel sum set for each image in the series by counting the number of pixels in each image which display each of the different pixel shades of gray (or colors). The mathematical moments of each of the functions derived from the pixel sum sets are then calculated, producing a single total energy value for each image, the total energy values collectively being referred to as a total energy value set.Type: GrantFiled: February 29, 1996Date of Patent: May 20, 1997Inventor: Steven M. Shepard
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Patent number: 5404162Abstract: A new imaging technique increases the effective frame rate of a video cam to a rate as high as one million Hz. In this technique, raw video signals are taken from the camera's sensors before the camera's logic does any signal processing. These signals are sent to an interface unit which selects signal segments for creating a composite image, the segments' size being as small as one or two pixels. Portions of the video signal that are not selected are given a zero value by the interface unit. The video signals are thereafter sent to the camera's signal processing logic, which converts the video signals into signals representing frames comprised of raster scan lines. The selected video signal segments become discrete portions of frames which are collected by a frame grabber. The frame grabber counts the times it has collected each discrete frame portion, determines an average value for each discrete portion, and builds the composite image from the averaged frame portions.Type: GrantFiled: June 7, 1993Date of Patent: April 4, 1995Assignee: The United States of America as represented by the Secretary of the ArmyInventors: David T. Sass, Steven M. Shepard