Abstract: A method and apparatus for dynamic allocation of DMA buffers in the DRAM banks of an I/O adaptor. The method and apparatus determine the functional status of the adaptor, allocate critical, volatile DMA buffers in non-critical DRAM banks if the adaptor is fully functional, and allocate critical, volatile DMA buffers in critical DRAM banks if the adaptor is partially functional.

Abstract: A method and apparatus for dynamic allocation of DMA buffers in the DRAM banks of an I/O adaptor. The method and apparatus determine the functional status of the adaptor, allocate critical, volatile DMA buffers in non-critical DRAM banks if the adaptor is fully functional, and allocate critical, volatile DMA buffers in critical DRAM banks if the adaptor is partially functional.

Abstract: In a first aspect, a computer system includes a storage adapter, a disk drive and a SCSI bus interconnecting the storage adapter and the disk drive. The storage adapter is connected to the SCSI bus via a first active termination circuit and the disk drive is connected to the SCSI bus via a second active termination circuit. The first active termination circuit is disabled and diagnostic signals are coupled to the bus. The frequency of errors in the diagnostic signals is detected to determine whether the second active termination circuit is in a failing condition.

Abstract: In a first aspect, a computer system includes a storage adapter, a disk drive and a SCSI bus interconnecting the storage adapter and the disk drive. The storage adapter is connected to the SCSI bus via a first active termination circuit and the disk drive is connected to the SCSI bus via a second active termination circuit. The first active termination circuit is disabled and diagnostic signals are coupled to the bus. The frequency of errors in the diagnostic signals is detected to determine whether the second active termination circuit is in a failing condition.

Abstract: A computer program is provided. The computer program product includes a medium readable by a computer, the medium (1) having means for inputting a signal representative of a temperature range in which a temperature of an operating environment of a battery resides; and (2) means for estimating a service life of the battery based on the signal. Other means are also provided.

Abstract: An apparatus is provided for estimating the service life of a battery. The apparatus includes a temperature measurement circuit that measures a temperature of an operating environment of the battery and outputs a signal representative of the temperature of the operating environment. A controller coupled to the temperature measurement circuit receives the temperature signal therefrom and estimates the service life of the battery based on the temperature signal. Preferably, the temperature measurement circuit outputs a signal representative of a temperature range in which the measured operating environment temperature resides and the controller estimates the service life of the battery based on the temperature range signal output by the temperature measurement circuit. A method and a computer program product also are provided for similarly estimating the service life of a battery.

Abstract: An apparatus is provided for estimating the service life of a battery. The apparatus includes a temperature measurement circuit that measures a temperature of an operating environment of the battery and outputs a signal representative of the temperature of the operating environment. A controller coupled to the temperature measurement circuit receives the temperature signal therefrom and estimates the service life of the battery based on the temperature signal. Preferably, the temperature measurement circuit outputs a signal representative of a temperature range in which the measured operating environment temperature resides and the controller estimates the service life of the battery based on the temperature range signal output by the temperature measurement circuit. A method and a computer program product also are provided for similarly estimating the service life of a battery.