Patents by Inventor Subodh Prakash Taigor

Subodh Prakash Taigor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9704591
    Abstract: Disclosed herein are techniques for generating a temperature independent reference current, which may be used during calibration. The temperature independent reference current may be generated based on a current through an on-chip calibration resistor. This alleviates the need for an off chip calibration resistor, which can be costly and cause slow calibration. A voltage at one terminal of the on chip calibration resistor may be modulated to substantially cancel a temperature coefficient of the on chip calibration resistor. This may result in the current passing through the on chip calibration resistor being temperature independent. The temperature independent reference current may be based on a reference voltage and a target calibration resistance.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: July 11, 2017
    Assignee: SanDisk Technologies LLC
    Inventors: Subodh Prakash Taigor, Sridhar Yadala, Rangarao Samineni
  • Publication number: 20160211031
    Abstract: Disclosed herein are techniques for generating a temperature independent reference current, which may be used during calibration. The temperature independent reference current may be generated based on a current through an on-chip calibration resistor. This alleviates the need for an off chip calibration resistor, which can be costly and cause slow calibration. A voltage at one terminal of the on chip calibration resistor may be modulated to substantially cancel a temperature coefficient of the on chip calibration resistor. This may result in the current passing through the on chip calibration resistor being temperature independent. The temperature independent reference current may be based on a reference voltage and a target calibration resistance.
    Type: Application
    Filed: March 28, 2016
    Publication date: July 21, 2016
    Applicant: SanDisk Technologies Inc.
    Inventors: Subodh Prakash Taigor, Sridhar Yadala, Rangarao Samineni
  • Publication number: 20160179113
    Abstract: Disclosed herein are techniques for generating a temperature independent reference current, which may be used during calibration. The temperature independent reference current may be generated based on a current through an on-chip calibration resistor. This alleviates the need for an off chip calibration resistor, which can be costly and cause slow calibration. A voltage at one terminal of the on chip calibration resistor may be modulated to substantially cancel a temperature coefficient of the on chip calibration resistor. This may result in the current passing through the on chip calibration resistor being temperature independent. The temperature independent reference current may be compared with a calibration current in a ZQ calibration circuit.
    Type: Application
    Filed: October 30, 2015
    Publication date: June 23, 2016
    Applicant: SANDISK TECHNOLOGIES INC.
    Inventors: Subodh Prakash Taigor, Sridhar Yadala, Rangarao Samineni