Patents by Inventor Sujit Dey
Sujit Dey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20080052414Abstract: A method and system are provided for wireless multimedia customization for different access networks with variable network conditions and device types. In one aspect, when a multimedia content clip is available, the clip is processed for transport by processing it in accordance with different options for the content clip in an optimized way that helps dynamic customization. For example, instead of preparing a version of the entire content clip, targeted for a particular network condition and target device characteristics, or creating a separate processed clip for each compression parameter available, a set of content ingredients are generated that can address a wide range of network conditions even through dynamic fluctuations in conditions and device characteristics.Type: ApplicationFiled: August 28, 2006Publication date: February 28, 2008Applicant: Ortiva Wireless, Inc.Inventors: Debashis Panigrahi, Sujit Dey, Douglas Wong, Parag Arole
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Publication number: 20070297387Abstract: A method and system for wireless data communication. A request is accepted for communication of a data collection including a plurality of data objects. For each of the plurality of data objects, content importance and error resilience properties are evaluated. A transmission order of the data objects is determined based upon evaluated content importance, error resilience properties, past channel conditions and predicted channel conditions, and one or more data objects are selected based on the determined order. An error control level is selected for transmission of data packets for communicating the selected data objects based upon error resilience properties and current channel conditions to achieve communication of the data collection.Type: ApplicationFiled: September 1, 2005Publication date: December 27, 2007Inventors: Sujit Dey, Debashis Panigrahi
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Publication number: 20070283036Abstract: Method and system for providing a web page. Preferably, the method and system composes a web page based on real-time conditions. In an exemplary method, a web page including a plurality of data objects is received. For each of the plurality of data objects, content importance is evaluated. Available bytes that can be transmitted under current bandwidth of a communication channel to meet a desired latency goal are estimated, and the available transmission bytes are distributed among different ones of the plurality of data objects based on the evaluated content importance.Type: ApplicationFiled: November 17, 2005Publication date: December 6, 2007Inventors: Sujit Dey, Nishant Mittal
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Patent number: 6978425Abstract: A method of designing a communication architecture comprising receiving a partitioned system, communication architecture topology, input traces and performance matrices. Analyzing and creating communication analysis graph (CAG). Partitioning communication instances to create partition clusters. Evaluating cluster statistics related to the partition clusters and assigning parameter values to the partition clusters to form a new system with new communication architecture. Reanalyzing the new system and recomputing performance metrics. If performance is improved then synthesizing CATs to realize optimized protocols. If performance is not improved then the process is repeated.Type: GrantFiled: May 24, 2000Date of Patent: December 20, 2005Assignees: NEC Corporation, The Regents of the University of CaliforniaInventors: Anand Raghunathan, Ganesh Lakshminarayana, Kanishka Lahiri, Sujit Dey
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Publication number: 20050102594Abstract: A method for generating a software-based self-test in an integrated circuit includes extracting constraints for corresponding instructions for the integrated circuit, modeling the constraints for a plurality of timeframes and performing constrained test pattern generation on the integrated circuit using the models. An automatic test pattern generation method for an AC fault in an integrated circuit includes identifying a current desired condition for triggering the AC fault, determining whether the current desired condition is feasible, and identifying a subsequent desired condition for triggering the AC fault if the current desired condition is not feasible. The method further includes determining whether the subsequent desired condition for triggering the AC fault is feasible, and searches for test vectors for realizing the current desired condition or subsequent desired condition which is determined to be feasible.Type: ApplicationFiled: September 27, 2004Publication date: May 12, 2005Inventors: Sujit Dey, Xiaoliang Bai, Li Chen, Angela Krstic
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Patent number: 6324679Abstract: A method and apparatus for design-for-low-power of register transfer level (RTL) controller/data path circuits that implement control-flow intensive specifications. The method of the invention focuses on multiplexer networks and registers which dominate the total circuit power consumption and reduces generation and propagation of glitches in both the control and data path parts of the circuit. Further the method reduces glitching power consumption by minimizing propagation of glitches in the RTL circuit through restructuring multiplexer networks (to enhance data correlations and eliminate glitchy control signals), clocking control signals, and inserting selective rising/falling delays, in order to kill the propagation of glitches from control as well as data signals. To reduce power consumption in registers, the clock inputs to registers are gated with conditions derived by an analysis of the RTL circuit, ensuring that glitches are not introduced on the clock signals.Type: GrantFiled: June 1, 1998Date of Patent: November 27, 2001Assignee: NEC USA, Inc.Inventors: Anand Raghunathan, Sujit Dey
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Patent number: 6195786Abstract: A power management method and system targeted toward high-level synthesis of data-dominated behavioral descriptions. The method of the present invention is founded on the observation that variable assignment can significantly affect power management opportunities in the synthesized architecture. Based on this observation, a procedure for constraining variable assignment is provided so that the functional units in the synthesized architecture do not execute any spurious operations.Type: GrantFiled: June 3, 1998Date of Patent: February 27, 2001Assignees: NEC USA, Inc., Princeton UniversityInventors: Anand Raghunathan, Sujit Dey, Ganesh Lakshminarayana, Niraj K. Jha
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Patent number: 6105139Abstract: A low-overhead controller-based power management technique that re-specifies control signals to reconfigure existing multiplexer networks and functional units to minimize unnecessary activity. Though the control signals in an RT-level implementation are fully specified, they can be re-specified under certain states/conditions when the data path components that they control need not be active. Another aspect of this invention is an algorithm to perform power management through controller re-specification, that consist of constructing an activity graph for each data path component, identifying conditions under which the component need not be active, and re-labeling the activity graph resulting in re-specification of the corresponding control expressions. The algorithm avoids the above negative effects of controller re-specification.Type: GrantFiled: June 3, 1998Date of Patent: August 15, 2000Assignee: NEC USA, Inc.Inventors: Sujit Dey, Anand Raghunathan, Niraj K. Jha
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Patent number: 5748647Abstract: An alternative method for testing circuits (H-SCAN) which retains the main advantage of full scan testing, namely, the ability to use combinational automatic test pattern generation (ATPG), while eliminating the high area overhead the long test application time associated with full, scan test methods. The method provides a practical test methodology that can be easily applied to any RT-level specification. The method uses existing connections of registers and other structures available in a high-level specification of a circuit without necessitating the use of scan flip-flops. Test application time is reduced by using the parallelism inherent in the circuit design to load multiple flip-flops in a single clock cycle, without having to add parallel scan chains as done in traditional parallel scan approaches.Type: GrantFiled: October 31, 1996Date of Patent: May 5, 1998Assignee: NEC USA, Inc.Inventors: Subhrajit Bhattacharya, Sujit Dey
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Patent number: 5553000Abstract: A technique for optimizing the speed of sequential synchronous digital circuits. First, the bottlenecks that prevent retiming for shortening the delay period are identified and then conditions to eliminate the bottlenecks are derived. This involves identifying the subcircuits associated with the bottlenecks, satisfying a set of timing constraints on the subcircuits, and developing a new circuit that meets the timing constraints. The new circuit free of bottlenecks can generally be retimed by relocation of the forward slack latches to reduce the clock period.Type: GrantFiled: November 5, 1992Date of Patent: September 3, 1996Assignee: NEC USA, Inc.Inventors: Sujit Dey, Miodrag Potkonjak, Steven Rothweiler
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Patent number: 5550749Abstract: A method of high level circuit design synthesis using transformations based upon the addition of deflection operations reduces the interconnects and register requirements as well as the area requirements of a circuit design while preserving throughput without increasing the number of execution units needed. The method may also be applied to reduce the partial scan overhead for generating testable datapaths. The overall result of the transformations is to improve resource utilization and/or testability of circuits so designed.Type: GrantFiled: June 3, 1994Date of Patent: August 27, 1996Assignee: NEC USA, Inc.Inventors: Sujit Dey, Miodrag Potkonjak
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Patent number: 5513123Abstract: Non-scan design-for-testability methods for making register-transfer-level data path circuits testable include using EXU S-graph representation of the circuits. Loops in the EXU S-graph are made k-level controllable/observable to render the circuit testable without having to scan any flip-flops or break loops directly. Moreover, the resultant circuit is testable at-speed.Type: GrantFiled: June 30, 1994Date of Patent: April 30, 1996Assignee: NEC USA, Inc.Inventors: Sujit Dey, Miodrag Potkonjak
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Patent number: 5513118Abstract: A method for performing high level synthesis of integrated circuits simultaneously considers testability and resource utilization. The method considers the relationship between hardware sharing, loops in the synthesized data path, and partial scan testing overhead. Hardware sharing is used to minimize the quantity of scan registers required to synthesize data paths with a minimal quantity of loops. A random walk based algorithm is used to break all control data flow graph (CDFG) loops with a minimal quantity of scan registers. Subsequent scheduling and assignment avoids the formation of loops in the data path by reusing the scan registers, while ensuring high resource utilization of the components of hardware costs: execution units, registers and interconnects. The partial scan overhead incurred is less than that of conventional gate level design partial scan techniques.Type: GrantFiled: August 25, 1993Date of Patent: April 30, 1996Assignee: NEC USA, Inc.Inventors: Sujit Dey, Miodrag Potkonjak, Rabindra K. Roy
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Patent number: 5502647Abstract: A partial scan methodology selects scan flip flops (FFs) in the minimum feedback vertex set (MFVS) of the FF dependency graph so that all loops, except self-loops, are broken. The MFVS of the circuit, i.e. the minimum quantity of gates whose removal makes the circuit acyclic, is a lower bound and in many cases is significantly smaller than the MFVS of the dependency graph. Since only FFs arc considered for scan, FFs are repositioned so that, in a modified circuit, every circuit MFVS gate drives one FF that can be scanned. A method is disclosed by which resynthesis and retiming can always transform any circuit into an equivalent circuit whose FF dependency graph MFVS is equal to the MFVS of the original circuit. Therefore, the MFVS of a circuit is a lower bound on the quantity of scan FFs needed. The necessary and sufficient conditions under which legal retiming can produce the desired FF repositioning are identified.Type: GrantFiled: December 1, 1993Date of Patent: March 26, 1996Assignee: NEC USA, Inc.Inventors: Srimat T. Chakradhar, Sujit Dey
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Patent number: 5448497Abstract: A methodology for the redesign of sequential VLSI circuits to increase the circuit speed involves cascading the circuit over a plurality of time frames without the memory elements, identifying any long false paths in the cascaded circuit, reconfiguring the original circuit to eliminate the false paths while providing fanout to preserve functionality, and retiming the reconfigured circuit to reduce circuit delay.Type: GrantFiled: September 8, 1992Date of Patent: September 5, 1995Assignee: NEC Research Institute, Inc.Inventors: Pranav Ashar, Sujit Dey, Sharad Malik