Patents by Inventor Sukhminder Singh Lobana
Sukhminder Singh Lobana has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10635515Abstract: A partial memory die is removed from an edge of a wafer such that the partial memory die is missing a portion of the memory structure that was not printed on the wafer. A usable portion of the incomplete memory structure is determined and one or more rectangular zones in the usable portion of the incomplete memory structure are identified. During operation of the memory system, the memory system receives logical addresses for memory operations to be performed on the partial memory die and determines physical addresses that corresponding to the logical addresses. The memory system performs an out of bounds response for a physical address that is on the partial memory die but outside of the one or more rectangular zones. The memory system performs memory operations for physical addresses that are inside the one or more rectangular zones.Type: GrantFiled: December 6, 2017Date of Patent: April 28, 2020Assignee: SanDisk Technologies LLCInventors: Sukhminder Singh Lobana, Kirubakaran Periyannan
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Publication number: 20190171506Abstract: A partial memory die is removed from an edge of a wafer such that the partial memory die is missing a portion of the memory structure that was not printed on the wafer. A usable portion of the incomplete memory structure is determined and one or more rectangular zones in the usable portion of the incomplete memory structure are identified. During operation of the memory system, the memory system receives logical addresses for memory operations to be performed on the partial memory die and determines physical addresses that corresponding to the logical addresses. The memory system performs an out of bounds response for a physical address that is on the partial memory die but outside of the one or more rectangular zones. The memory system performs memory operations for physical addresses that are inside the one or more rectangular zones.Type: ApplicationFiled: December 6, 2017Publication date: June 6, 2019Applicant: SANDISK TECHNOLOGIES LLCInventors: Sukhminder Singh Lobana, Kirubakaran Periyannan
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Patent number: 10290354Abstract: A partial memory die is missing one or more components. One example of a partial memory die includes an incomplete memory structure such that the partial memory die is configured to successfully perform programming, erasing and reading of the incomplete memory structure.Type: GrantFiled: October 31, 2017Date of Patent: May 14, 2019Assignee: SanDisk Technologies LLCInventors: Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta, Jagdish Sabde, Ashish Ghai, Deepak Bharadwaj, Sukhminder Singh Lobana, Shrikar Bhagath
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Publication number: 20190130978Abstract: A partial memory die is missing one or more components. One example of a partial memory die includes an incomplete memory structure such that the partial memory die is configured to successfully perform programming, erasing and reading of the incomplete memory structure.Type: ApplicationFiled: October 31, 2017Publication date: May 2, 2019Applicant: SANDISK TECHNOLOGIES LLCInventors: Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta, Jagdish Sabde, Ashish Ghai, Deepak Bharadwaj, Sukhminder Singh Lobana, Shrikar Bhagath
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Patent number: 10276251Abstract: A memory system performs verification when writing to memory. It is possible that the memory system may be missing some components (or components may be otherwise unavailable). To account for missing or unavailable components when performing verification, the memory system uses a pattern of data that includes a mask identifying the missing or unavailable components. The mask is used to force a predetermined result of the verification for the missing or unavailable portions of the memory structure so that results of the verification that correspond to the missing or unavailable components are not counted as errors.Type: GrantFiled: December 21, 2017Date of Patent: April 30, 2019Assignee: SanDisk Technologies LLCInventors: Sukhminder Singh Lobana, Kirubakaran Periyannan, Ankitkumar Babariya
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Patent number: 9036396Abstract: Circuitry and method for detecting occurrence of a reflow process to an embedded storage device are disclosed. A temperature sensing device includes a resistor, a temperature sensor, and a comparator. The first terminal of the resistor is coupled to a voltage source, and the second terminal of the resistor is coupled to both the first terminal of the temperature sensor and the first input of the comparator. The second terminal of the temperature sensor is grounded and the second input of the comparator is coupled to a reference voltage. The resistance state of the temperature sensor changes from a first resistance state to a second resistance state when the temperature surrounding the temperature sensor reaches a threshold. The comparator generates an output based on the resistance changes of the temperature sensor. The generated output may indicate whether a reflow process has occurred to the embedded storage device.Type: GrantFiled: August 30, 2012Date of Patent: May 19, 2015Assignee: SanDisk Technologies, Inc.Inventors: Tal Heller, Sukhminder Singh Lobana, Yacov Duzly
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Publication number: 20140063900Abstract: Circuitry and method for detecting occurrence of a reflow process to an embedded storage device are disclosed. A temperature sensing device includes a resistor, a temperature sensor, and a comparator. The first terminal of the resistor is coupled to a voltage source, and the second terminal of the resistor is coupled to both the first terminal of the temperature sensor and the first input of the comparator. The second terminal of the temperature sensor is grounded and the second input of the comparator is coupled to a reference voltage. The resistance state of the temperature sensor changes from a first resistance state to a second resistance state when the temperature surrounding the temperature sensor reaches a threshold. The comparator generates an output based on the resistance changes of the temperature sensor. The generated output may indicate whether a reflow process has occurred to the embedded storage device.Type: ApplicationFiled: August 30, 2012Publication date: March 6, 2014Applicant: SANDISK TECHNOLOGIES INC.Inventors: Tal Heller, Sukhminder Singh Lobana, Yacov Duzly