Abstract: A design method for a thermal control film advantageously used in cosmic space, especially for a multilayer film, includes: setting at least two candidate materials for forming the multilayer film and the number of layers of the multilayer film; and designing a combination of the candidate material and a layer thickness by using a genetic algorithm stored in a computer-readable medium using an evaluation function, and recording the obtained results on a computer-readable medium. The evaluation function includes: ?s=1?Rs, wherein Rs represents a reflectance of solar energy in a wavelength range used for design, within a solar radiation wavelength range; and ?H: ?H=1?RIR, wherein RIR represents a reflectance of heat radiation energy in a wavelength range used for design, within a heat radiation wavelength range.

Abstract: A design method for a thermal control film advantageously used in cosmic space, especially for a multilayer film, includes: setting at least two candidate materials for forming the multilayer film and the number of layers of the multilayer film; and designing a combination of the candidate material and a layer thickness by using a genetic algorithm stored in a computer-readable medium using an evaluation function, and recording the obtained results on a computer-readable medium. The evaluation function includes: ?s=1?Rs, wherein Rs represents a reflectance of solar energy in a wavelength range used for design, within a solar radiation wavelength range; and ?H: ?H=1?RIR, wherein RIR represents a reflectance of heat radiation energy in a wavelength range used for design, within a heat radiation wavelength range.

Abstract: The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator (43) for changing light for measurement (L) transmitted through a slit (41) into collimated light (L0), a plurality of diffraction gratings (44a, 44b) with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit (41) and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L0), and a diffracted-light focusing members (45a, 45b) for focusing a plurality of diffracted light rays (L1 to L4) provided by the plurality of diffraction gratings (44a, 44b) by which the collimated light (L0) is diffracted, each of the diffracted-light focusing members (45a, 45b) being provided in association with each of the plurality of diffraction gratings (44a, 44b).

Abstract: A wireless measuring device 1 is provided which includes a plurality of child units 2 and a parent unit 3 to receive data measured by these child units 2 by wireless communication. Each of the child units 2 has a controlling section 20 that can move to a standby state, a measuring section 21, a signal receiving section 22 to receive a measurement instructing signal from the parent unit 3, and a signal transmitting section 23 to transmit the measured data by wireless communication. The parent unit 3 has a signal transmitting section to transmit the measurement instructing signal to each of the child units 2 and a measured data receiving section 32 to receive measured data to be transmitted from the signal transmitting section 23.

Abstract: The emissivity measuring device 10 of the present invention includes an integrating sphere 18 having an energy entering hole 12 through which radiation energy is made to enter from an infrared ray source 11, a sample hole 14 placed being opposite to an entering direction of radiation energy supplied from the energy entering hole 12 and open edge portions of which are put into contact, in a struck manner, with an object 13 to be tested, and a detecting hole 16 to which a detector 15 to detect radiation energy is attached, wherein the detector 15 detects radiation energy emitted from the object 13 to be tested being multiple-scattered by the integrating sphere 17 via the detecting hole 16 and the detected radiation energy is compared with a measured value of emissivity of a known sample in a calculation controlling means 18 to calculate emissivity of the object 13 to be tested. The temperature sensor is attached to aperture edge portions of the sample hole 14.

Abstract: A wireless measuring device 1 is provided which includes a plurality of child units 2 and a parent unit 3 to receive data measured by these child units 2 by wireless communication. Each of the child units 2 has a controlling section 20 that can move to a standby state, a measuring section 21, a signal receiving section 22 to receive a measurement instructing signal from the parent unit 3, and a signal transmitting section 23 to transmit the measured data by wireless communication. The parent unit 3 has a signal transmitting section to transmit the measurement instructing signal to each of the child units 2 and a measured data receiving section 32 to receive measured data to be transmitted from the signal transmitting section 23.

Abstract: The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator (43) for changing light for measurement (L) transmitted through a slit (41) into collimated light (L0), a plurality of diffraction gratings (44a, 44b) with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit (41) and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L0), and a diffracted-light focusing members (45a, 45b) for focusing a plurality of diffracted light rays (L1 to L4) provided by the plurality of diffraction gratings (44a, 44b) by which the collimated light (L0) is diffracted, each of the diffracted-light focusing members (45a, 45b) being provided in association with each of the plurality of diffraction gratings (44a, 44b).