Abstract: Methods and apparatus are provided for adaptive read threshold voltage tracking with gap estimation between default read threshold voltages. A read threshold voltage for a memory is adjusted by estimating a gap between two adjacent default read threshold voltages; determining statistical characteristics of two adjacent memory levels based at least in part on a type of statistical distribution of the memory levels, a distribution of data values read from one or more cells using a plurality of read threshold voltages and the gap; computing an adjusted read threshold voltage associated with the two adjacent memory levels by using the statistical characteristics of the two adjacent memory levels; and updating the read threshold voltage with the adjusted read threshold voltage. The adjustment is optionally performed responsive to one or more read errors.

Abstract: Adaptive read threshold voltage tracking techniques are provided that employ bit error rate estimation based on a non-linear syndrome weight mapping. An exemplary device comprises a controller configured to determine a bit error rate for at least one of a plurality of read threshold voltages in a memory using a non-linear mapping of a syndrome weight to the bit error rate for the at least one of the plurality of read threshold voltages.

Abstract: An apparatus having an interface and a control circuit is disclosed. The interface may be configured to process a plurality of read/write operations to/from a memory. The control circuit may be configured to (i) access information that characterizes a plurality of trapping sets of a low-density parity check code in response to receiving data, (ii) encode the data using the low-density parity check code to generate a codeword and (iii) write the codeword in the memory. The generation of the codeword may include at least one of a shortening and a puncturing of a plurality of bits in the codeword. The plurality of bits may be selected based on the information that characterizes the plurality of trapping sets. The bits selected generally reduce a probability that an error correction of the codeword after the codeword is read from the memory fails due to the plurality of trapping sets.

Abstract: Data compression techniques are provided that remove redundancy across the boundary of compression search engines. An illustrative method comprises splitting the data frame into a plurality of sub-chunks; comparing at least two of the plurality of sub-chunks to one another to remove at least one sub-chunk from the plurality of sub-chunks that substantially matches at least one other sub-chunk to generate a remaining plurality of sub-chunks; generating matching sub-chunk information for data reconstruction identifying the at least one removed sub-chunk and the corresponding substantially matched at least one other sub-chunk; grouping the remaining plurality of sub-chunks into sub-units; removing substantially repeated patterns within the sub-units to generate corresponding compressed sub-units; and combining the compressed sub-units with the matching sub-chunk information to generate a compressed data frame.

Abstract: Method and apparatus for decoding data. In some embodiments, an LDPC decoder has a variable node circuit (VNC) with a plurality of variable nodes configured to store bit reliability values of m-bit code bits. A check node circuit (CNC) has a plurality of check nodes configured to perform parity check operations upon n-bit messages from the VNC. Each n-bit message is formed from a combination of the bit reliability values and stored messages from the check nodes. A pre-saturation compensation circuit is configured to maintain a magnitude of each n-bit message received by the CNC below a saturation limit comprising the maximum value that can be expressed using p bits, with p less than n and each of the n-bit messages received by the CNC having a different magnitude. The pre-saturation compensation circuit may apply different scaling and/or bias factors to the n-bit messages over different decoding iterations.

Abstract: A syndrome weight of failed decoding attempts is used to select parameters for future read retry operations. The following exemplary steps are performed until a decoding success or a predefined limited number of readings is reached: (i) reading a codeword using different read threshold voltages; (ii) mapping the readings to a corresponding likelihood value using a likelihood value assignment; and (iii) recording a syndrome weight for failed decoding attempts of the readings using the different read threshold voltages.

Abstract: Apparatus and method for reducing read disturbed data in a non-volatile memory (NVM). Read operations applied to a first location in the NVM are counted to accumulate a read disturb count (RDC) value. Once the RDC value reaches a predetermined threshold, a flag bit is set and a first bit error statistic (BES) value is evaluated. If acceptable, the RDC value is reduced and additional read operations are applied until the RDC value reaches the predetermined threshold a second time. A second BES value is evaluated and data stored at the first location are relocated if an unacceptable number of read errors are detected by the second BES value. Different thresholds are applied to the first and second BES values so that fewer read errors are acceptable during evaluation of the second BES value as compared to the first BES value.

Abstract: An apparatus includes a memory and a controller. The memory includes a plurality of memory devices. The controller may be coupled to the memory and configured to process a plurality of read/write operations to/from the memory, store data in the plurality of memory devices using units of super-blocks, and generate a number of unique weight statistics in a single read operation by reading a number of dies within a super-block with dissimilar read reference voltages. Each super-block generally includes a block from a die of each of the plurality of memory devices. The controller may be further configured to split the number of dies in each super-block into two sets and collect page weights for upper pages from one of the two sets and page weights for lower pages from the other of the two sets.

Abstract: Adaptive read threshold voltage tracking techniques are provided that employ bit error rate estimation based on a non-linear syndrome weight mapping. An exemplary device comprises a controller configured to determine a bit error rate for at least one of a plurality of read threshold voltages in a memory using a non-linear mapping of a syndrome weight to the bit error rate for the at least one of the plurality of read threshold voltages.

Abstract: Independent read threshold voltage tracking techniques are provided for multiple dependent read threshold voltages using syndrome weights.

Abstract: A read threshold voltage for a memory is adjusted based on a bit error rate based on decoded data for a plurality of read threshold voltages. The read threshold voltage can be adjusted by reading the memory at a current read threshold voltage to obtain a read value; applying a hard decision decoder to the read value; determining if the hard decision decoder converges for the read value to a converged word; storing bits corresponding to the converged word as reference bits and, if the hard decision decoder converges, (i) computing a bit error rate for the current read threshold voltage based on the reference bits; (ii) adjusting the current read reference voltage to a new read threshold voltage; and (iii) reading the memory at the new read threshold voltage to obtain a new read value, until a threshold is satisfied; and once the threshold is satisfied, selecting the read threshold voltage based on the bit error rates.

Abstract: A syndrome weight of failed decoding attempts is used to select parameters for future read retry operations. The following exemplary steps are performed until a decoding success or a predefined limited number of readings is reached: (i) reading a codeword using different read threshold voltages; (ii) mapping the readings to a corresponding likelihood value using a likelihood value assignment; and (iii) recording a syndrome weight for failed decoding attempts of the readings using the different read threshold voltages.

Abstract: An apparatus includes a memory and a controller. The memory includes a plurality of memory devices. The controller may be coupled to the memory and configured to process a plurality of read/write operations to/from the memory, store data in the plurality of memory devices using units of super-blocks, and generate a number of unique weight statistics in a single read operation by reading a number of dies within a super-block with dissimilar read reference voltages. Each super-block generally includes a block from a die of each of the plurality of memory devices. The controller may be further configured to split the number of dies in each super-block into two sets and collect page weights for upper pages from one of the two sets and page weights for lower pages from the other of the two sets.

Abstract: Channel information and channel conditions determined by an Offline Tracking process are used to determine whether or not an adjustment to the read reference voltage can be avoided altogether without detrimentally affecting performance, or, alternatively, to determine a precision with which a read reference voltage adjustment should be made. If it is determined based on the channel conditions that a read reference voltage adjustment can be avoided altogether, read performance is improved by reducing the probability that a read reference voltage adjustment needs to be made during normal read operations. If it is determined based on the channel conditions that a read reference voltage adjustment needs to be made with a particular precision, the read reference voltage is so adjusted. This latter approach is advantageous in that relatively fewer adjustments will be made during normal read operations.

Abstract: An apparatus includes a plurality of memory devices and a controller. The controller is coupled to the plurality of memory devices and configured to store data in the plurality of memory devices using units of super-blocks. Each super-block comprises a block from each of the plurality of memory devices and the controller balances time efficiency and robustness during collection of statistics from soft reads of each super-block.

Abstract: Methods and apparatus are provided for read retry operations that estimate written data based on syndrome weights. One method comprises reading a codeword from a memory multiple times using multiple read reference voltages; obtaining a syndrome weight for each of the readings of the codeword; identifying a given reading of the codeword having a substantially minimum syndrome weight; and estimating a written value of the codeword based on the given reading. Two cell voltage probability distributions of cell voltages are optionally calculated for each possible cell state of the memory, based on the estimated written value and plurality of readings of the codeword. The cell voltage probability distributions are used to (i) dynamically select log likelihood ratio values for a failing page. (ii) determine a read reference voltage that gives a desired log likelihood ratio value, or (iii) dynamically select log likelihood ratio values for the page populations associated with the distributions.

Abstract: Methods and apparatus are provided for adaptive read threshold voltage tracking with separate characterization on each side of a voltage distribution about a distribution mean. A read threshold voltage for a memory is adjusted by determining statistical characteristics of two adjacent memory levels based at least in part on a type of statistical distribution of the memory levels and a distribution of data values read from cells using a plurality of read threshold voltages, wherein the statistical characteristics of the two adjacent memory levels are characterized independently on two sides about at least one mean of the statistical distribution; computing an adjusted read threshold voltage associated with the two adjacent memory levels by using the statistical characteristics of the two adjacent memory levels; and updating the read threshold voltage based on the adjusted read threshold voltage. The adjustment is optionally performed responsive to one or more read errors.

Abstract: A read threshold voltage for a memory is adjusted based on a bit error rate based on decoded data for a plurality of read threshold voltages. The read threshold voltage can be adjusted by reading the memory at a current read threshold voltage to obtain a read value; applying a hard decision decoder to the read value; determining if the hard decision decoder converges for the read value to a converged word; storing bits corresponding to the converged word as reference bits and, if the hard decision decoder converges, (i) computing a bit error rate for the current read threshold voltage based on the reference bits; (ii) adjusting the current read reference voltage to a new read threshold voltage; and (iii) reading the memory at the new read threshold voltage to obtain a new read value, until a threshold is satisfied; and once the threshold is satisfied, selecting the read threshold voltage based on the bit error rates.

Abstract: Methods and apparatus are provided for adaptive read threshold voltage tracking with gap estimation between default read threshold voltages. A read threshold voltage for a memory is adjusted by estimating a gap between two adjacent default read threshold voltages; determining statistical characteristics of two adjacent memory levels based at least in part on a type of statistical distribution of the memory levels, a distribution of data values read from one or more cells using a plurality of read threshold voltages and the gap; computing an adjusted read threshold voltage associated with the two adjacent memory levels by using the statistical characteristics of the two adjacent memory levels; and updating the read threshold voltage with the adjusted read threshold voltage. The adjustment is optionally performed responsive to one or more read errors.

Abstract: Read retry operations in a memory employ likelihood value assignments that change sign at different read voltages for a plurality of read retry operations. A method for multiple read retries of a memory comprises reading a codeword using a first read voltage to obtain a first read value; mapping the first read value to first likelihood values based on a first likelihood value assignment that changes sign substantially at the first read voltage; reading the codeword using a second read voltage to obtain a second read value, wherein the second read voltage is shifted from the first read voltage to compensate for an expected change in analog voltages; and mapping the second read value to second likelihood values based on a second likelihood value assignment, wherein the second likelihood value assignment changes sign substantially at the second read voltage. Read data is optionally generated using iterative decoding of the codeword based on the first likelihood values and/or the second likelihood values.