Patents by Inventor Suneel Tumkur Shankarappa

Suneel Tumkur Shankarappa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TOOL WEAR QUANTIFICATION SYSTEM AND METHOD
    Publication number: 20110317909
    Abstract: A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 29, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Satheesh Jeyaraman, Kevin George Harding, Anandraj Sengupta, Debasish Mishra, Suneel Tumkur Shankarappa, Howard Paul Weaver, Kevin William Meyer
  • Method for performing model based scanplan generation of a component under inspection
    Patent number: 7337651
    Abstract: A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.
    Type: Grant
    Filed: April 5, 2005
    Date of Patent: March 4, 2008
    Assignee: General Electric Company
    Inventors: Suneel Tumkur Shankarappa, William Stewart McKnight, Vamshi Krishna Reddy Kommareddy, Ui Won Suh, Mandar Diwakar Godbole, Anjani Narendra Schrad, Prafull Sharma
  • System and method for analyzing and identifying flaws in a manufactured part
    Patent number: 7272254
    Abstract: A system and method for identifying flaws in a part being inspected includes generating a 3-d representation of the part, the 3-d representation comprising 3-d spatial coordinates corresponding to different locations on the part, and registering the 3-d spatial coordinates with corresponding locations of a part being inspected. An image of the part being inspected is generated, and a flaw in the part being inspected is identified from the generated image. A location of the flaw is correlated to a corresponding 3-d spatial coordinate, and a device is controlled to perform an operation on the part being inspected at the flaw location using information of the corresponding 3-d spatial coordinate.
    Type: Grant
    Filed: July 9, 2003
    Date of Patent: September 18, 2007
    Assignee: General Electric Company
    Inventors: Suneel Tumkur Shankarappa, Gregory Alan Mohr, Mysore Siddu Dinesh, Brian Walter Lasiuk, Ronald Cecil McFarland, Elizabeth Lokenberg Dixon