Abstract: A display device includes a display panel including pixels in one pixel column and a gate driver for sequentially providing scan signals to the pixels. Each of the pixels includes a light emitting element, a first transistor for controlling a current amount of driving current flowing through the light emitting element and a second transistor for transferring a data signal to a gate electrode of the first transistor in response to a corresponding scan signal among the scan signals. A first pixel among the pixels is electrically connected to a first data line, and a second pixel adjacent to the first pixel among the pixels is electrically connected to a second data line different from the first data line. A second scan signal provided to the second pixel partially overlaps with a first scan signal provided to the first pixel.

Abstract: A display device includes a display panel; a first upper support member on the display panel; and a second upper support member on the display panel and spaced from the first upper support member; and a blocking member including a blocking part crossing the first upper support member and the second upper support member, a first stretchable part connected to a side of the blocking part and including a plurality of openings, a second stretchable part connected to another side of the blocking part and including a plurality of openings, a first fixing part connected to the first stretchable part, and a second fixing part connected to the second stretchable part.

Abstract: A display device includes a pixel. The pixel is electrically connected to a first power line, a second power line, and a data line. The pixel includes a first transistor, and a capacitor electrically connected between a gate electrode of the first transistor and an electrode of the first transistor. In a plan view, the data line extends in a second direction. The first power line extends in a first direction intersecting the second direction and overlaps the data line and the gate electrode of the first transistor. The second power line extends in the second direction, overlaps the data line, and overlaps the gate electrode of the first transistor.

Abstract: A semiconductor device is provided. The semiconductor device includes an active pattern extending in a first horizontal direction, a plurality of lower nanosheets stacked on the active pattern and spaced apart from one another in a vertical direction, a separation layer on the plurality of lower nanosheets, a plurality of upper nanosheets stacked on the separation layer and spaced apart from one another in the vertical direction, a gate electrode extending on the active pattern in a second horizontal direction, the gate electrode surrounding each of the plurality of lower nanosheets, the separation layer and the plurality of upper nano sheets, and a first conductive layer between the gate electrode and each of a top surface and a bottom surface of the plurality of upper nanosheets. The first conductive layer is not between the gate electrode and sidewalls of the plurality of upper nanosheets.

Abstract: An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.

Abstract: An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Abstract: Disclosed herein is a method of preparing uranium metal by electrorefining uranium metal, comprising: applying a predetermined current to an anode electrode included in an anode basket receiving fuel segments made of uranium metal and a cathode electrode of carbon material; electrodepositing uranium on the cathode electrode in accordance with the reaction initiated by the applied current; and collecting the electrodeposited uranium by self-weight. An apparatus for electrorefining uranium metal used in the method according to the present invention, comprises: an anode basket (6) receiving fuel segments made of uranium metal and comprising an anode electrode; and a reactor including a cathode electrode (5) made of carbon material and a uranium collector (10) therein.

Abstract: Disclosed is a continuous electrorefining device for recovering metal uranium. The electrorefining device comprises an electrolytic cell 10 having an internal accommodating space filled with electrolyte; a cathode unit 20 including a top plate 22, connecting rods 21 whose top ends are joined to the top plate 22, and cathode electrodes 24 whose top end is joined to lower plates; an anode unit 40 which is placed in a cylinder shape surrounding the cathode electrodes 24; a uranium recovery unit 50 for drawing out the uranium metal by a first drawing-out means; and a transition metal recovery unit 60 for drawing out the metal particles by a second drawing-out means. The cathode unit 20 further comprises an insulating and vibration absorbing member that is interposed between the top plate 22 and the cover plate 12; and a vibration means which is mounted on the top plate 22 to transmit vibration and impact force to the cathode electrode 24 through the connecting rods 21.

Abstract: Disclosed herein is a continuous electrolytic refining device for metal uranium, the device comprising a cathode section fixed to the lower side of the heat radiation plate, and having a plurality of graphite cathodes; an anode section encompassing the cathode section to face the cathode section, rotatably fixed to the lower side of the heat radiation plate, and receiving the used nuclear fuel; an electrolytic cell receiving the cathode section and the anode section and filled with electrolytes so as to sink the cathode section and the anode section; an uranium collecting section collecting metal uranium deposited on and detached from the graphite cathode in the lower side of the cathode section inside the electrolytic cell and withdrawing the collected metal uranium to the outside of the electrolytic cell; and a transition metal collecting section coupled with the lower side of the electrolytic cell to withdraw the transition metal particles released from the anode section and collected in the lower side of

Abstract: Disclosed herein is a method of preparing uranium metal by electrorefining uranium metal, comprising: applying a predetermined current to an anode electrode included in an anode basket receiving fuel segments made of uranium metal and a cathode electrode of carbon material; electrodepositing uranium on the cathode electrode in accordance with the reaction initiated by the applied current; and collecting the electrodeposited uranium by self-weight. An apparatus for electrorefining uranium metal used in the method according to the present invention, comprises: an anode basket (6) receiving fuel segments made of uranium metal and comprising an anode electrode; and a reactor including a cathode electrode (5) made of carbon material and a uranium collector (10) therein.