Patents by Inventor Sunnie Park Kim

Sunnie Park Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8323466
    Abstract: A microfluidic-based lab-on-a-test card is described. The test card is used with a point-of-care (POC) analyzer. The test card is designed to receive a sample and then, with the use of the POC analyzer, quantify or count a particular substance in the sample. The test card may be comprised of multiple layers. In one embodiment, the test card includes a primary separation chamber with a filtration surface, a trapping channel, and a particle detector. The test card may also include a nanowire sensor.
    Type: Grant
    Filed: December 7, 2009
    Date of Patent: December 4, 2012
    Assignee: NanoIVD, Inc.
    Inventors: Sunnie Park Kim, Young Shik Shin, Changgeng Liu, Rory Kelly, Becky Chan
  • Publication number: 20120258445
    Abstract: Methods for using nanowire sensors are described. In one embodiment, the nanowire sensor may be field effect transistor having a nanowire and a functionalized control electrode. One method of using such a nanowire sensor includes exposing the functionalized control electrode to a test sample and an enhancing reagent. In another embodiment, the nanowire sensor may be a field effect transistor having a gate electrode and a functionalized nanowire. One method of using such a nanowire sensor includes exposing the functionalized nanowire to a test sample and an enhancing reagent. The use of an enhancing reagent increases the sensitivity of the nanowire sensor to a substance to be detected or quantified.
    Type: Application
    Filed: April 12, 2012
    Publication date: October 11, 2012
    Applicant: NanolVD, Inc.
    Inventors: Sunnie Park KIM, Young Shik SHIN, Changgeng LIU
  • Publication number: 20100140110
    Abstract: A microfluidic-based lab-on-a-test card is described. The test card is used with a point-of-care (POC) analyzer. The test card is designed to receive a sample and then, with the use of the POC analyzer, quantify or count a particular substance in the sample. The test card may be comprised of multiple layers. In one embodiment, the test card includes a primary separation chamber with a filtration surface, a trapping channel, and a particle detector. The test card may also include a nanowire sensor.
    Type: Application
    Filed: December 7, 2009
    Publication date: June 10, 2010
    Applicant: NANOIVD, INC.
    Inventors: Sunnie Park KIM, Young Shik SHIN, Changgeng LIU, Rory KELLY, Becky CHAN