Abstract: A system and method of generating test code for testing an electronic device on an Automatic Test Equipment (ATE) platform are described. The invention translates scan and pattern test data into test code based upon user defined settings. The test data preferably comes from a test data generation program such as a Scan ATPG or Simulation program, which generates test data. The test data is serially streamed to the invention by the use of function calls embedded in the test data generation program. The user, preferably using a Graphical User Interface (GUI), defines the desired ATE platform type, as well as other custom format features for the output data. The translation, preferably running simultaneously with the test data generation plan, produces the test code as the test data is generated. The user also has the option to generate several different versions of test code simultaneously from the same generation of the test data.