Patents by Inventor Susumu Kuroyanagi

Susumu Kuroyanagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070285291
    Abstract: A binarization circuit for binarizing a pulsative analog signal includes: a first comparator circuit for reversing an output signal when the analog signal becomes smaller than a threshold voltage and when the analog signal becomes larger than a high side threshold voltage; a second comparator circuit for reversing an output signal when the analog signal becomes larger than the threshold voltage and when the analog signal becomes smaller than a low side threshold voltage; and a selector circuit for inputting the output signals from the first and second comparator circuits and for reversing an output signal when the analog signal becomes smaller than the threshold voltage and when the analog signal becomes larger than the threshold voltage.
    Type: Application
    Filed: March 13, 2007
    Publication date: December 13, 2007
    Applicant: DENSO CORPORATION
    Inventors: Yasuaki Makino, Susumu Kuroyanagi, Shinji Nakatani, Reiji Iwamoto, Hideki Hosokawa, Norikazu Ohta
  • Patent number: 7304473
    Abstract: A rotational angle detecting device includes a sensor portion disposed on a shaft. The sensor portion includes longitudinal hall elements disposed perpendicular to each other for outputting a hall voltage proportional to a magnetic flux induced by a magnet disposed on the shaft. The device also includes an engagement mechanism for maintaining a positional relationship with the magnet in which a center portion of the sensor is aligned with a center portion of the magnet.
    Type: Grant
    Filed: August 23, 2005
    Date of Patent: December 4, 2007
    Assignee: DENSO CORPORATION
    Inventors: Susumu Kuroyanagi, Yukihiro Kato
  • Patent number: 7202660
    Abstract: A rotation sensor has a sensor and a processing circuit that are provided as an integrated circuit chip (IC chip). The sensor has a magnetic resistance element. The rotation sensor senses an angular change of a magnetic vector as a change of resistance. The rotation sensor is located to face a rotor, or a helical gear used in an automatic transmission. The magnetic resistance element is located such that a sensing plane thereof is parallel to a hypothetical plane perpendicular to the line of inclination of each tooth of the rotor.
    Type: Grant
    Filed: September 13, 2005
    Date of Patent: April 10, 2007
    Assignee: Denso Corporation
    Inventors: Susumu Kuroyanagi, Yukihiro Kato
  • Publication number: 20060066296
    Abstract: A rotational angle detecting device includes a sensor portion disposed on a shaft. The sensor portion includes longitudinal hall elements disposed perpendicular to each other for outputting a hall voltage proportional to a magnetic flux induced by a magnet disposed on the shaft. The device also includes an engagement mechanism for maintaining a positional relationship with the magnet in which a center portion of the sensor is aligned with a center portion of the magnet.
    Type: Application
    Filed: August 23, 2005
    Publication date: March 30, 2006
    Inventors: Susumu Kuroyanagi, Yukihiro Kato
  • Publication number: 20060055398
    Abstract: A rotation sensor has a sensor and a processing circuit that are provided as an integrated circuit chip (IC chip). The sensor has a magnetic resistance element. The rotation sensor senses an angular change of a magnetic vector as a change of resistance. The rotation sensor is located to face a rotor, or a helical gear used in an automatic transmission. The magnetic resistance element is located such that a sensing plane thereof is parallel to a hypothetical plane perpendicular to the line of inclination of each tooth of the rotor.
    Type: Application
    Filed: September 13, 2005
    Publication date: March 16, 2006
    Applicant: DENSO CORPORATION
    Inventors: Susumu Kuroyanagi, Yukihiro Kato
  • Patent number: 6020736
    Abstract: A rotation object is made of a magnetic material and disposed within a predetermined range of an angle of rotation on a plane perpendicular to an axis of rotation. A bias magnet generates a bias magnetic field to the rotation body in a direction perpendicular to the axis of rotation. Magnetic resistance elements are disposed in the bias magnetic field on a plane including the axis of rotation at a position deviated from the position of the rotation object in the axial direction of the rotation body and inclined by about 45.degree. relative to a direction perpendicular to the axis of rotation.
    Type: Grant
    Filed: August 7, 1995
    Date of Patent: February 1, 2000
    Assignee: Nippondenso Co., Ltd.
    Inventors: Seiki Aoyama, Yasuaki Makino, Susumu Kuroyanagi, Izuru Shoji, Ichiro Izawa
  • Patent number: 5821745
    Abstract: Magnetoresistive elements are disposed facing a gear to form a sensor for detecting rotation of the gear. The signal output from MRE sensor is an alternating amplitude signal. An operational amplifier has a differential gain exceeding its operational limit relative to the amplitude value of the sensor signal, and it amplifies and outputs the difference between the sensor signal and a reference voltage. Comparators judge whether an output of the operational amplifier is within a predetermined amplitude range relative to the amplitude center thereof. When the op-amp output deviates from the predetermined amplitude range, transistors either charge or discharge a capacitor, so that the reference voltage can be changed closer to the output of the operational amplifier. Another comparator compares the output signal of the operational amplifier with a threshold value to output a binary-valued signal.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: October 13, 1998
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yasuaki Makino, Susumu Kuroyanagi, Tomoatsu Makino
  • Patent number: 5644226
    Abstract: A magnetic detector which is small in size and is capable of preventing the occurrence of deformation in the waveform representing a change in the resistance. A bias magnet 2 is adhered to the support plate 1. A bias magnetic field is generated by the bias magnet 2 toward a gear 7. A substrate 3 is adhered onto the support plate 1, and magneto resistance elements are formed on the substrate 3 by vacuum evaporation. The magneto resistance elements are disposed in parallel with the magnetized surface of the bias magnet 2. The magneto resistance elements are disposed being tilted by about 45 degrees with respect to a vector that is in parallel with the N-pole surface of the bias magnet 2 in the bias magnetic field and is directed toward the outer peripheral edge.
    Type: Grant
    Filed: March 1, 1995
    Date of Patent: July 1, 1997
    Assignee: Nippondenso Co., Ltd.
    Inventors: Seiki Aoyama, Susumu Kuroyanagi, Ichirou Izawa, Yasuaki Makino
  • Patent number: 5644288
    Abstract: Rotational speed of a vehicle speed detecting gear 1 is detected by a detection element 2 using an MRE or the like and the detected signal is waveform-shaped by a waveform shaping circuit 3 to serve as a vehicle-speed pulse signal. The cycle of the vehicle-speed pulse signal is detected by a sampling circuit 4. The detected cycle of the pulse signal is multiplied by a predetermined multiplier in a multiplication circuit 6 and the multiplication result is divided by a predetermined divisor in a diving and pulsing circuit 8. Then, a pulse signal having the cycle equivalent to the division result is output as a divided vehicle-speed pulse signal.
    Type: Grant
    Filed: June 19, 1995
    Date of Patent: July 1, 1997
    Assignee: Nippondenso Co., Ltd.
    Inventor: Susumu Kuroyanagi
  • Patent number: 5637995
    Abstract: A magnetic detection device including a biasing magnet for generating a bias magnetic field directed to an object of detection having a magnetic material; a magnetoresistance effective element disposed at an inclination of about 45.degree. to the direction of the bias magnetic field to provide a change in resistance caused by the bias magnetic field in accordance with movement of the object of detection, so as to detect a change in state of the bias magnetic field via the change in resistance of the magnetoresistance effective element; and the biasing magnet having a hollow portion containing a holder for holding the magnetoresistance effective element in a position between a surface of the biasing magnet and the object of detection and close to the surface of the biasing element.
    Type: Grant
    Filed: March 21, 1995
    Date of Patent: June 10, 1997
    Assignee: Nippondenso Co., Ltd.
    Inventors: Ichiro Izawa, Yasuaki Makino, Susumu Kuroyanagi, Seiki Aoyama, Shigehiro Kasumi, Kenji Yagi, Kazuo Kajimoto, Masaki Takashima, Shinichi Konda
  • Patent number: 5523692
    Abstract: An oil deterioration detector comprising a sensitive electrode whose electric potential varies in response to acidity and/or basicity of oil to be measured, and a reference electrode associated with this sensitive electrode. An electrically conductive housing accommodates the sensitive electrode and the reference electrode together with the oil. A potential difference detector detects oil deterioration by measuring a potential difference between the sensitive electrode and the reference electrode. And, an insulating member is interposed between these electrodes and the electrically conductive housing for electrically insulating these electrodes from the electrically conductive housing. The reference electrode is grounded together with the electrically conductive housing. An insulating, hydrophilic porous member would be interposed between the sensitive electrode and the reference electrode.
    Type: Grant
    Filed: March 22, 1994
    Date of Patent: June 4, 1996
    Assignee: Nippondenso Co., Ltd.
    Inventors: Susumu Kuroyanagi, Tetsuo Fujii, Kingo Okada, Masaei Nozawa, Syuji Yamaguchi, Kiwamu Naito
  • Patent number: 5520051
    Abstract: Device including a strain generating portion supported at least at one end on a substrate and formed in a displaceable manner with respect to the substrate in a cavity of the substrate. A semiconductor strain sensing element, which is disposed at the strain generating portion, detects the amount of strain of the strain generating portion. A support is disposed at a connection point between the strain generating portion and the substrate so as to reinforce the connection point.
    Type: Grant
    Filed: May 25, 1994
    Date of Patent: May 28, 1996
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Yoshitaka Gotoh, Susumu Kuroyanagi
  • Patent number: 5493219
    Abstract: A peak hold circuit 11 holds a peak value of an output signal from a rotating angle sensor 6. A bottom hold circuit 12 holds a bottom value of the output signal from the rotating angle sensor 6. A threshold value is set from the peak value by the peak hold circuit 11 and the bottom value by the bottom hold circuit 12 by resistors 24 to 27, analog switches 28 and 29 and a NOT circuit 31. A comparator 10 compares the output signal of the rotating angle sensor 6 with the set value thus set, and outputs a binary signal (digitized signal) in accordance with the comparison result.
    Type: Grant
    Filed: April 14, 1994
    Date of Patent: February 20, 1996
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yasuki Makino, Seiki Aoyama, Ichirou Izawa, Tomoatsu Makino, Susumu Kuroyanagi
  • Patent number: 5320705
    Abstract: A semiconductor pressure sensor of this invention is intended to provide a semiconductor pressure sensor having an excellent electrical isolation between the supporting means of the semiconductor pressure sensor and the semiconductor substrate, the semiconductor pressure sensor basically comprising a semiconductor substrate having a first semiconductor region in which; at least a semiconductor device is formed, a second semiconductor region and an isolated layer buried between the first and second semiconductor regions, a cavity provided in the second semiconductor region, the opening thereof existing on the mail surface of the second semiconductor region and a strain detecting portion consisting of the semiconductor device and provided in the first semiconductor region opposite to the cavity.
    Type: Grant
    Filed: August 18, 1993
    Date of Patent: June 14, 1994
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Yoshitaka Gotoh, Susumu Kuroyanagi, Osamu Ina
  • Patent number: 5313836
    Abstract: A semiconductor sensor for an accelerometer including a beam portion, consisting of a thin beam portion and a thick beam portion and supported by a solid member through the end of the thin beam portion, and a stopper portion provided at a position on an imaginary line along which a center of gravity of the thick beam portion moves. These components are integrally formed in a silicon substrate. Excessive displacement of the beam portion when excessive acceleration is applied is effectively suppressed by the stopper portion, and breakage of the thin beam portion due to excessive acceleration can be avoided.
    Type: Grant
    Filed: December 23, 1992
    Date of Patent: May 24, 1994
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Susumu Kuroyanagi, Yoshitaka Gotoh
  • Patent number: 5138422
    Abstract: Disclosed is a semiconductor device which comprises a substrate, an insulating film formed at a predetermined region in the substrate or on the main surface of the substrate, a polycrystalline semiconductor layer formed on at least the insulating film, a single crystal semiconductor layer formed on at least the polycrystalline semiconductor layer, an isolation region formed to extend from the top main surface of the single crystal semiconductor layer to at least the surface of the insulating film, through the polycrystalline semiconductor layer, to electrically isolate a portion formed in the single crystal semiconductor layer surrounded by the isolation region from another portion formed in the single crystal semiconductor layer and not surrounded by the isolation region, at least a semiconductor device formed within the portion surrounded by the isolation region.
    Type: Grant
    Filed: November 6, 1991
    Date of Patent: August 11, 1992
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Susumu Kuroyanagi, Yukio Tsuzuki
  • Patent number: 5095349
    Abstract: A semiconductor pressure sensor of this invention is intended to provide a semiconductor pressure sensor having an excellent electrical isolation between the supporting means of the semiconductor pressure sensor and the semiconductor substrate, the semiconductor pressure sensor basically comprising a semiconductor substrate having a first semiconductor region in which at least a semiconductor device is formed, a second semiconductor region and an isolated layer buried between the first and second semiconductor regions, a cavity provided in the second semiconductor region, the opening thereof existing on the main surface of the second semiconductor region and a strain detecting portion consisting of the semiconductor device and provided in the first semiconductor region opposite to the cavity.
    Type: Grant
    Filed: June 7, 1989
    Date of Patent: March 10, 1992
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Yoshitaka Gotoh, Susumu Kuroyanagi, Osamu Ina
  • Patent number: 4975390
    Abstract: Herein disclosed is a semiconductor pressure sensor and a method of manufacture. The sensor includes a plate having a recess in its main surface. A diaphragm has a lower surface therof bonded to a first main surface of the plate and formed so as to have an upper surface having no holes therein. A piezoresistive layer is formed so as to be in contact with the diaphragm and is positioned so as to be at least partially over the recess. The resistance of the piezoresistive layer provides an indication of pressure applied to the diaphragm. The manufacturing method includes forming a piezoresistive layer of a single crystal substrate in a diaphragm without any recrystallization.
    Type: Grant
    Filed: December 8, 1987
    Date of Patent: December 4, 1990
    Assignee: Nippondenso Co. Ltd.
    Inventors: Tetsuo Fujii, Susumu Kuroyanagi, Akira Kuroyanagi, Tomohiro Funahashi, Minekazu Sakai, Shinji Yoshihara
  • Patent number: 4963505
    Abstract: Disclosed is a semiconductor device which comprises a substrate, an insulating film formed at a predetermined region in the substrate or on the main surface of the substrate, a polycrystalline semiconductor layer formed on at least the insulating film, a single crystal semiconductor layer formed on at least the polycrystalline semiconductor layer, an isolation region formed to extend from the top main surface of the single crystal semiconductor layer to at least the surface of the insulating film, through the polycrystalline semiconductor layer, to electrically isolate a portion formed in the single crystal semiconductor layer surrounded by the isolation region from another portion formed in the single crystal semiconductor layer and not surrounded by the isolation region, at least a semiconductor device formed within the portion surrounded by the isolation region.
    Type: Grant
    Filed: October 21, 1988
    Date of Patent: October 16, 1990
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Susumu Kuroyanagi, Yukio Tsuzuki
  • Patent number: RE34893
    Abstract: A semiconductor pressure sensor of this invention is intended to provide a semiconductor pressure sensor having an excellent electrical isolation between the supporting means of the semiconductor pressure sensor and the semiconductor substrate, the semiconductor pressure sensor basically comprising a semiconductor substrate having a first semiconductor region in which at least a semiconductor device is formed, a second semiconductor region and an isolated layer buried between the first and second semiconductor regions, a cavity provided in the second semiconductor region, the opening thereof existing on the main surface of the second semiconductor region and a strain detecting portion consisting of the semiconductor device and provided in the first semiconductor region opposite to the cavity.
    Type: Grant
    Filed: March 22, 1993
    Date of Patent: April 4, 1995
    Assignee: Nippondenso Co., Ltd.
    Inventors: Tetsuo Fujii, Yoshitaka Gotoh, Susumu Kuroyanagi, Osamu Ina