Patents by Inventor Susumu Serita
Susumu Serita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20230334406Abstract: An inference apparatus includes: an inference module configured to infer a modification plan for modification target data by inputting, for each of agents, a state of the each of the agents to a policy model of the each of the agents which is related to the modification target data, and by acquiring an action of the each of the agents, and store, as experience data, the state and the action of each of the agents as well as a reward earned by taking the action; an evaluation module configured to calculate an evaluation value for each of the agents, the evaluation value being a probability at which the action is selected under the state; and a modification module configured to modify the experience data based on the evaluation value of each of the agents calculated by the evaluation module.Type: ApplicationFiled: February 28, 2023Publication date: October 19, 2023Inventors: Shunichi AKATSUKA, Susumu SERITA, Toshihiro KUJIRAI
-
Patent number: 11693392Abstract: Example implementations described herein are directed to a system for manufacturing dispatching using reinforcement learning and transfer learning. The systems and methods described herein can be deployed in factories for manufacturing dispatching for reducing job-due related costs. In particular, example implementations described herein can be used to reduce massive data collection and reduce model training time, which can eventually improve dispatching efficiency and reduce factory cost.Type: GrantFiled: January 30, 2019Date of Patent: July 4, 2023Assignee: HITACHI, LTD.Inventors: Shuai Zheng, Chetan Gupta, Susumu Serita
-
Publication number: 20220405161Abstract: A data selection device assists selection of suitable training data used for sign detection, and includes: a storage unit configured to store time-series sensor data acquired from a sensor with respect to a failure prediction target device; a data classification unit configured to classify the time-series sensor data into a first data set and a second data set while allowing the first data set and the second data set to overlap each other; a training data selection unit configured to select a subset of the second data set based on a value range of the first data set; a training data evaluation unit configured to calculate an evaluation index indicating a suitability of a failure prediction model as training data based on the selected subset; and a data selection condition search unit configured to search for the value range of the first data set that maximizes the evaluation index.Type: ApplicationFiled: June 13, 2022Publication date: December 22, 2022Applicant: Hitachi, Ltd.Inventor: Susumu SERITA
-
Patent number: 11312430Abstract: Example implementations described herein are directed to a system for lean angle estimation without requiring specialized calibration. In example implementations, the mobile device sensor data can be utilized without any additional specialized data or configuration to estimate the lean angle of a motorcycle. The lean angle is determined based on a determination of a base attitude of a mobile device and a measured attitude of the mobile device.Type: GrantFiled: August 7, 2017Date of Patent: April 26, 2022Assignee: Hitachi, Ltd.Inventors: Susumu Serita, Chetan Gupta
-
Publication number: 20220012585Abstract: Example implementations described herein involve a new reinforcement learning algorithm to address short-term goals. In the training step, the proposed solution learns the system dynamic model (short-term prediction) in a linear format in terms of actions. It also learns the expected rewards (long-term prediction) in a linear format in terms of actions. In the application step, the proposed solution uses the learned models plus simple optimization algorithms to find actions that satisfy both short-term goals and long-term goals. Through the example implementations, there is no need to design sensitive reward functions for achieving short-term and long-term goals concurrently. Further, there is better performance in achieving short-term and long-term goals compared to the traditional reward modification methods, and it is possible to modify the short-term goals without time-consuming retraining.Type: ApplicationFiled: July 10, 2020Publication date: January 13, 2022Inventors: Hamed KHORASGANI, Chi ZHANG, Susumu SERITA, Chetan GUPTA
-
Patent number: 11200137Abstract: Aspects of the present disclosure are directed to systems and methods for determining execution of failure prediction models and duration prediction models for a sensor system. Systems and methods can involve receiving streaming data from one or more sensors and for a failure prediction model processing the streaming data indicating a predicted failure with a probability higher than a threshold, obtaining a duration of the predicted failure from a duration prediction model configured to predict durations of detected failures based on the streaming data; deactivating the failure prediction model when the predicted failure occurs; and determining a time to reactivate the failure prediction model based on the obtained duration of the predicted failure.Type: GrantFiled: August 20, 2020Date of Patent: December 14, 2021Assignee: Hitachi, Ltd.Inventors: Susumu Serita, Chi Zhang, Chetan Gupta, Qiyao Wang, Huijuan Shao
-
Patent number: 11120383Abstract: A system is provided for operator profiling based on pre-installed sensor measurement. In example implementations, the system extracts a set of segmented time series data associated with a unit of operation and build models which distinguish the operators by machine learning algorithms. The system uses the models to output the evaluation score assigned to each operation, identify the key movements for skilled/non-skilled operators, and recommends appropriate actions to improve operation skill or adjust the scheduling of the operators.Type: GrantFiled: May 30, 2018Date of Patent: September 14, 2021Assignee: Hitachi, Ltd.Inventors: Susumu Serita, Haiyan Wang, Chetan Gupta
-
Patent number: 11049060Abstract: Example implementations described herein involve systems and methods involving a plurality of sensors monitoring one or more processes, the sensors providing sensor data, which can include determining a probability map of the sensor data from a database and a functional relationship between key performance indicators (KPIs) of the one or more processes and the sensor data; executing a search on the probability map to determine constrained and continuous ranges for the sensor data that optimize KPIs for the one or more processes based on the functional relationship; and generating a recommendation for the one or more processes that fit within the constrained and continuous range of the sensor data.Type: GrantFiled: May 31, 2019Date of Patent: June 29, 2021Assignee: Hitachi, Ltd.Inventors: Qiyao Wang, Haiyan Wang, Susumu Serita, Takashi Saeki, Chetan Gupta
-
Publication number: 20210056484Abstract: Example implementations described herein involve methods and systems with one or more machines on a factory floor. Example implementations involve, in response to received orders, determining an initial scheduling policy for internal processes to meet the order and a due date policy for the order; a) executing a simulation involving scheduling decisions and due date quotations based on the initial scheduling policy and the due date policy; b) executing a machine learning process on the simulation results to update the scheduling policy and the due date policy by evaluating the scheduling decisions and the due date quotations according to a scoring function which is common for evaluating the scheduling decisions and evaluating the due date quotations; iteratively executing a) and b) until a finalized scheduling policy and the due date policy is determined; and output the finalized scheduling policy and the due date policy in response to the order.Type: ApplicationFiled: August 21, 2019Publication date: February 25, 2021Inventors: Susumu SERITA, Chetan Gupta
-
Patent number: 10915563Abstract: Provided is a technique for extracting a factor (event pattern) that has an influence on an objective index (objective variable). A data analysis device according to the present disclosure performs: a process of generating, with respect to explanatory variable data included in data to be analyzed, a time-series pattern in a predetermined range; a process of calculating a correlation value between the time-series pattern and at least one item of objective variable data included in the data to be analyzed; and a process of outputting, together with the correlation value, the time-series pattern corresponding to the correlation value as an analysis result.Type: GrantFiled: March 28, 2016Date of Patent: February 9, 2021Assignee: HITACHI, LTD.Inventors: Susumu Serita, Yoshiyuki Tajima, Tomoaki Akitomi, Fumiya Kudo
-
Patent number: 10877989Abstract: This data conversion system is characterized by including: a storage unit that stores a column including a plurality of data elements; a range specification module that specifies the range of each of the data elements of the column; an information amount evaluation module that calculates the information amount of the data element within the specified range of the column; and a change point detection module that detects a point at which a change in the information amount according to a change in the specified range satisfies a predetermined condition.Type: GrantFiled: March 17, 2016Date of Patent: December 29, 2020Assignee: HITACHI, LTD.Inventors: Fumiya Kudo, Tomoaki Akitomi, Susumu Serita, Yu Kitano
-
Publication number: 20200380388Abstract: Example implementations described herein are directed to constructing prediction models and conducting predictive maintenance for systems that provide sparse sensor data. Even if only sparse measurements of sensor data are available, example implementations utilize the inference of statistics with functional deep networks to model prediction for the systems, which provides better accuracy and failure prediction even if only sparse measurements are available.Type: ApplicationFiled: May 31, 2019Publication date: December 3, 2020Inventors: Qiyao WANG, Shuai ZHENG, Ahmed FARAHAT, Susumu SERITA, Takashi SAEKI, Chetan GUPTA
-
Publication number: 20200380447Abstract: Example implementations described herein involve systems and methods involving a plurality of sensors monitoring one or more processes, the sensors providing sensor data, which can include determining a probability map of the sensor data from a database and a functional relationship between key performance indicators (KPIs) of the one or more processes and the sensor data; executing a search on the probability map to determine constrained and continuous ranges for the sensor data that optimize KPIs for the one or more processes based on the functional relationship; and generating a recommendation for the one or more processes that fit within the constrained and continuous range of the sensor data.Type: ApplicationFiled: May 31, 2019Publication date: December 3, 2020Inventors: Qiyao WANG, Haiyan WANG, Susumu SERITA, Takashi SAEKI, Chetan GUPTA
-
Publication number: 20200258057Abstract: In some examples, a computer system may receive historical repair data for equipment and/or domain knowledge related to the equipment. The system may construct a hierarchical data structure for the equipment including a first hierarchy and a second hierarchy, the first hierarchy including a plurality of equipment nodes corresponding to different equipment types, and the second hierarchy including a plurality of repair category nodes corresponding to different repair categories. The system may generate a plurality of machine learning models corresponding to the plurality of repair category nodes, respectively. When the system receives a repair request associated with the equipment, the system determines a certain one of the equipment nodes associated with the equipment, and based on determining that a certain repair category node is associated with the certain equipment node, uses the machine learning model associated with the certain repair category node to determine one or more repair actions.Type: ApplicationFiled: October 6, 2017Publication date: August 13, 2020Inventors: Ahmed Khairy FARAHAT, Chetan GUPTA, Marcos VIEIRA, Susumu SERITA
-
Publication number: 20200241511Abstract: Example implementations described herein are directed to a system for manufacturing dispatching using reinforcement learning and transfer learning. The systems and methods described herein can be deployed in factories for manufacturing dispatching for reducing job-due related costs. In particular, example implementations described herein can be used to reduce massive data collection and reduce model training time, which can eventually improve dispatching efficiency and reduce factory cost.Type: ApplicationFiled: January 30, 2019Publication date: July 30, 2020Inventors: Shuai ZHENG, Chetan GUPTA, Susumu SERITA
-
Patent number: 10579042Abstract: Example implementations described herein are directed to systems and methods for defect rate analytics to reduce defectiveness in manufacturing. In an example implementation, a method include determining, from data associated with each feature for a manufacturing process, the data feature indicative of process defects detected based on the feature, an estimated condition for the feature that reduces a defect rate of the process defects, the estimated condition indicating the data into a first group and second group; calculating the rate reduction of the defect rate based on a difference in defects between the first group and the second group; for the rate reduction meeting a target confidence level for a target defect rate, applying the estimated condition to the manufacturing process associated with each of the features. In example implementations, the defect rate analytics reduce defectiveness in manufacturing with independent processes and/or dependent processes.Type: GrantFiled: July 2, 2018Date of Patent: March 3, 2020Assignee: Hitachi, Ltd.Inventors: Qiyao Wang, Susumu Serita, Chetan Gupta
-
Publication number: 20200004219Abstract: Example implementations described herein are directed to systems and methods for defect rate analytics to reduce defectiveness in manufacturing. In an example implementation, a method include determining, from data associated with each feature for a manufacturing process, the data feature indicative of process defects detected based on the feature, an estimated condition for the feature that reduces a defect rate of the process defects, the estimated condition indicating the data into a first group and second group; calculating the rate reduction of the defect rate based on a difference in defects between the first group and the second group; for the rate reduction meeting a target confidence level for a target defect rate, applying the estimated condition to the manufacturing process associated with each of the features. In example implementations, the defect rate analytics reduce defectiveness in manufacturing with independent processes and/or dependent processes.Type: ApplicationFiled: July 2, 2018Publication date: January 2, 2020Inventors: Qiyao WANG, Susumu SERITA, Chetan GUPTA
-
Publication number: 20190370722Abstract: A system is provided for operator profiling based on pre-installed sensor measurement. In example implementations, the system extracts a set of segmented time series data associated with a unit of operation and build models which distinguish the operators by machine learning algorithms. The system uses the models to output the evaluation score assigned to each operation, identify the key movements for skilled/non-skilled operators, and recommends appropriate actions to improve operation skill or adjust the scheduling of the operators.Type: ApplicationFiled: May 30, 2018Publication date: December 5, 2019Inventors: Susumu SERITA, Haiyan WANG, Chetan GUPTA
-
Publication number: 20190271543Abstract: Example implementations described herein are directed to a system for lean angle estimation without requiring specialized calibration. In example implementations, the mobile device sensor data can be utilized without any additional specialized data or configuration to estimate the lean angle of a motorcycle. The lean angle is determined based on a determination of a base attitude of a mobile device and a measured attitude of the mobile device.Type: ApplicationFiled: August 7, 2017Publication date: September 5, 2019Applicant: Hitachi, Ltd.Inventors: Susumu SERITA, Chetan GUPTA
-
Publication number: 20180253479Abstract: This data conversion system is characterized by including: a storage unit that stores a column including a plurality of data elements; a range specification module that specifies the range of each of the data elements of the column; an information amount evaluation module that calculates the information amount of the data element within the specified range of the column; and a change point detection module that detects a point at which a change in the information amount according to a change in the specified range satisfies a predetermined condition.Type: ApplicationFiled: March 17, 2016Publication date: September 6, 2018Inventors: Fumiya KUDO, Tomoaki AKITOMI, Susumu SERITA, Yu KITANO