Abstract: Devices and methods for mass spectroscopic analysis of particles are disclosed herein. An example device includes: a first irradiation unit configured to irradiate a particle with electromagnetic radiation to cause components of the particle to detach from the particle. The example device further includes a second irradiation unit configured to irradiate substantially simultaneously i) at least a part of the detached components, and optionally a residual core of the particle, with a first beam of electromagnetic radiation the first beam of electromagnetic radiation exhibiting a first intensity, and ii) at least a part of the residual core, of the particle with a second beam of electromagnetic radiation. The second beam of electromagnetic radiation exhibiting a second intensity, which is preferably larger than the first intensity. The example device further includes a mass spectrometer comprising an ion source region, a first detection channel, and optionally a second detection channel.

Abstract: The invention relates to a device and a corresponding method for mass spectroscopic analysis of particles, the device comprising: a first irradiation unit (4) configured to irradiate a particle (1) with electromagnetic radiation to cause components of the particle (1) to detach, in particular to desorb, ablate and/or evaporate, from the particle (1), the detached components (2) of the particle (1) being located in proximity of a residual core (3) of the particle (1), a second irradiation unit (14-16, 19) configured to irradiate substantially simultaneously i) at least a part of the detached components (2), and optionally the residual core (3) of the particle (1), with a first beam (17) of electromagnetic radiation to cause an ionization of at least a part of the detached components (2), the first beam (17) of electromagnetic radiation exhibiting a first intensity, and ii) at least a part of the residual core (3) of the particle (1) with a second beam (18) of electromagnetic radiation to cause an ionization of