Patents by Inventor Sven NIESE

Sven NIESE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Illumination and imaging device for high-resolution X-ray microscopy with high photon energy
    Patent number: 10153062
    Abstract: The present invention relates to an illumination and imaging device for high-resolution X-ray microscopy with high photon energy, comprising an X-ray source (1) for emitting X-ray radiation and an area detector (4) for detecting the X-ray radiation. Moreover, the device comprises a monochromatizing and two-dimensionally focussing condenser-based optical system (2) arranged in the optical path of X-ray radiation with two reflective elements (6) being arranged side-by-side for focussing impinging X-ray radiation on an object to be imaged (5) and a diffractive X-ray lens (3) for imaging the object to be imaged (5) on the X-ray detector (4). Typically, the illumination and imaging device is used for performing radiography, tomography and examination of a micro-electronic component or an iron-based material.
    Type: Grant
    Filed: June 27, 2016
    Date of Patent: December 11, 2018
    Assignees: FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V., AXO DRESDEN GMBH
    Inventors: Martin Gall, Ehrenfried Zschech, Reiner Dietsch, Sven Niese
  • ILLUMINATION AND IMAGING DEVICE FOR HIGH-RESOLUTION X-RAY MICROSCOPY WITH HIGH PHOTON ENERGY
    Publication number: 20170003234
    Abstract: The present invention relates to an illumination and imaging device for high-resolution X-ray microscopy with high photon energy, comprising an X-ray source (1) for emitting X-ray radiation and an area detector (4) for detecting the X-ray radiation. Moreover, the device comprises a monochromatizing and two-dimensionally focussing condenser-based optical system (2) arranged in the optical path of X-ray radiation with two reflective elements (6) being arranged side-by-side for focussing impinging X-ray radiation on an object to be imaged (5) and a diffractive X-ray lens (3) for imaging the object to be imaged (5) on the X-ray detector (4). Typically, the illumination and imaging device is used for performing radiography, tomography and examination of a micro-electronic component or an iron-based material.
    Type: Application
    Filed: June 27, 2016
    Publication date: January 5, 2017
    Applicants: FRAUNHOFER-GESELLSCHAFT zur Foerderung der angewandten Forschung e.V., AXO Dresden GmbH
    Inventors: Martin GALL, Ehrenfried ZSCHECH, Reiner DIETSCH, Sven NIESE