Patents by Inventor Sybren Sijbrandij

Sybren Sijbrandij has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM
    Publication number: 20230402251
    Abstract: A gas injection subsystem for use in an inspection system serves to inspect a sample by use of charged particles. At least one gas duct of the gas injection subsystem guides a gas flow from a gas reservoir to a sample inspection region. The gas duct has in the vicinity of the sample inspection region a diameter which is less than 5 mm. At least one flow control valve of the gas injection subsystem controls the gas flow through the gas duct. The valve is switchable between an open valve state in which a nominal gas flow through the gas duct is enabled and a closed valve state in which the gas duct is closed to inhibit a gas flow through the gas duct. The valve is designed such that a switching time between the open and the closed state is 100 ms at most. A gas injection subsystem results which facilitates a reproducible gas injection to the sample inspection region.
    Type: Application
    Filed: August 25, 2023
    Publication date: December 14, 2023
    Inventors: Louise Barris, Alexander Lombardi, Mark Dimanna, Jeffrey Sauer, Brett Lewis, Sybren Sijbrandij
  • Sample inspection methods, systems and components
    Patent number: 8669525
    Abstract: The disclosure relates to sample inspection using an ion-beam microscope. In some embodiments, the disclosure involves the use of multiple detectors, each of which provides different information about a sample.
    Type: Grant
    Filed: May 26, 2009
    Date of Patent: March 11, 2014
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Sybren Sijbrandij, John Notte, IV, William B. Thompson
  • Isotope ion microscope methods and systems
    Patent number: 8648299
    Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, an isotope of Neon is used.
    Type: Grant
    Filed: March 4, 2013
    Date of Patent: February 11, 2014
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Sybren Sijbrandij
  • ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
    Publication number: 20130175444
    Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, an isotope of Neon is used.
    Type: Application
    Filed: March 4, 2013
    Publication date: July 11, 2013
    Applicant: Carl Zeiss NTS, LLC
    Inventors: John A. Notte, IV, Sybren Sijbrandij
  • Isotope ion microscope methods and systems
    Patent number: 8399834
    Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, He-3 is used.
    Type: Grant
    Filed: May 26, 2009
    Date of Patent: March 19, 2013
    Assignee: Carl Zeiss NTS, LLC
    Inventors: John Notte, IV, Sybren Sijbrandij
  • ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
    Publication number: 20110139979
    Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, He-3 is used.
    Type: Application
    Filed: May 26, 2009
    Publication date: June 16, 2011
    Applicant: CARL ZEISS NTS, LLC.
    Inventors: John A. Notte, IV, Sybren Sijbrandij
  • SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
    Publication number: 20110121176
    Abstract: The disclosure relates to sample inspection using an ion-beam microscope. In some embodiments, the disclosure involves the use of multiple detectors, each of which provides different information about a sample.
    Type: Application
    Filed: May 26, 2009
    Publication date: May 26, 2011
    Applicant: CARL ZEISS NTS, LLC.
    Inventors: Sybren Sijbrandij, John A. Notte, IV, William B. Thompson