Abstract: A mechanism for synchronizing a multiple-circuit system, includes (a) selecting a master circuit from a plurality of circuits, the remaining circuits including at least one slave circuit, (b) receiving, at each of the plurality of circuits, input data and a local clock signal associated with the input data, (d) generating at least one control signal at the master circuit using the local clock signal of the master circuit, (e) outputting the control signal from the master circuit, (f) forwarding the control signal to the slave circuit(s), (g) looping back the control signal to the master circuit, (h) processing the input data at the slave circuit(s) using the forwarded control signal, (i) processing the input data at the master circuit using the looped-back control signal, and (j) outputting the processed data from each of the plurality of circuits.

Abstract: A double data rate (DDR) circuit for testing of a high speed DDR interface using single clock edge triggered tester data. The DDR testing circuit includes a first register, a second register, and a multiplexer (MUX). A clock signal is fed to the first register and the MUX. The inverse of the clock signal is fed to the second register. A tester data signal is fed to the first register which generates a latched tester data signal which is fed to the MUX. The inverse of the latched tester data signal is fed to the second register which generates a transformed tester data signal which is fed to the MUX. The MUX generates a combination of the latched tester data signal and the transformed tester data signal for transmission as an applied test data signal. The resulting applied test data signal has double the data rate of the tester data signal upon which it is based.

Abstract: A double data rate (DDR) circuit for testing of a high speed DDR interface using single clock edge triggered tester data. The DDR testing circuit includes a first register, a second register, and a multiplexer (MUX). A clock signal is fed to the first register and the MUX. The inverse of the clock signal is fed to the second register. A tester data signal is fed to the first register which generates a latched tester data signal which is fed to the MUX. The inverse of the latched tester data signal is fed to the second register which generates a transformed tester data signal which is fed to the MUX. The MUX generates a combination of the latched tester data signal and the transformed tester data signal for transmission as an applied test data signal. The resulting applied test data signal has double the data rate of the tester data signal upon which it is based.