Patents by Inventor Sylvain Blaize
Sylvain Blaize has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9696208Abstract: An interferometric device: includes a separator, for separating a collimated beam (F0) into first (F1) and second (F2) incident beams; at least one transducer; and a transparent optical system, including at least three planar diopters (D1, D2, D3). The the transducer is based on plasmon resonance and in contact with the diopter (D1); the diopter (D2) has a network of nanostructures; the optical system and the separator being configured such that the beam (F1) and the beam (F2) undergo total internal reflection on the diopter (D1) and on the diopter (D3), respectively, prior to interfering on the diopter (D2) by total internal reflection and to forming an interferogram in which the central fringe is located at a convergence point (ZOPD).Type: GrantFiled: June 6, 2014Date of Patent: July 4, 2017Assignee: UNIVERSITE DE TECHNOLOGIE DE TROYESInventors: Yassine Hadjar, Mikael Renault, Aurélien Bruyant, Sylvain Blaize
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Patent number: 9683891Abstract: A spectrometer for sampling interferograms in two dimensions offering a large spectral band and high spectral resolution with a relative compactness. The spectrometer includes a refracting surface, an array of detecting elements and an array of diffusion elements capturing means at the refracting surface of an interferogram delivered from two interference beams (F1, F2) and forming interference lines parallel to each other along the transverse axis (Ox) of the interferogram within the plane (xOy) of the refracting surface, the array of detection elements being parallel to the plane of the refracting surface and arranged to detect the spatial distribution of the interferogram, wherein the array is a two-dimensional array over an entirety of which the detections elements are disposed equidistantly, and wherein interference lines exhibit an angular shift with the capturing means.Type: GrantFiled: March 17, 2009Date of Patent: June 20, 2017Assignee: UNIVERSITE DE TECHNOLOGIE DE TROYESInventors: Yassine Hadjar, Sylvain Blaize, Aurelien Bruyant, Gilles Lerondel, Pascal Royer
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Patent number: 9459149Abstract: An evanescent wave microspectrometer includes a planar diopter separating two transparent media, an optical sensor with a pixel array, and disposed in the second transparent medium, and an interference device disposed such that at least a part of the interference device is in contact with evanescent waves generated at the surface of the diopter. The micro-spectrometer also includes a memory storing a map having a set of set of data grids including the optical response of said sensor for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator configured to determine the spectrum (?) of a test light source configured to generate evanescent waves at the surface of the diopter, on the basis of the map and the optical response of the sensor.Type: GrantFiled: September 26, 2014Date of Patent: October 4, 2016Assignee: UNIVERSITE DE TECHNOLOGIE DE TROYESInventors: Laurent Arnaud, Yassine Hadjar, Mikael Renault, Aurelien Bruyant, Sylvain Blaize
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Publication number: 20160245699Abstract: An evanescent wave microspectrometer includes a planar diopter separating two transparent media, an optical sensor with a pixel array, and disposed in the second transparent medium, and an interference device disposed such that at least a part of the interference device is in contact with evanescent waves generated at the surface of the diopter. The micro-spectrometer also includes a memory storing a map having a set of set of data grids including the optical response of said sensor for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator configured to determine the spectrum (?) of a test light source configured to generate evanescent waves at the surface of the diopter, on the basis of the map and the optical response of the sensor.Type: ApplicationFiled: September 26, 2014Publication date: August 25, 2016Applicant: Universite de Technologie de TroyesInventors: Laurent Arnaud, Yassine Hadjar, Mikael Renault, Aurelien Bruyant, Sylvain Blaize
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Publication number: 20160123814Abstract: An interferometric device: includes a separator, for separating a collimated beam (F0) into first (F1) and second (F2) incident beams; at least one transducer; and a transparent optical system, including at least three planar diopters (D1, D2, D3). The the transducer is based on plasmon resonance and in contact with the diopter (D1); the diopter (D2) has a network of nanostructures; the optical system and the separator being configured such that the beam (F1) and the beam (F2) undergo total internal reflection on the diopter (D1) and on the diopter (D3), respectively, prior to interfering on the diopter (D2) by total internal reflection and to forming an interferogram in which the central fringe is located at a convergence point (ZOPD).Type: ApplicationFiled: June 6, 2014Publication date: May 5, 2016Applicant: Universite de Technologie de TroyesInventors: Yassine Hadjar, Mikael Renault, Aurélien Bruyant, Sylvain Blaize
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Publication number: 20150116720Abstract: The present invention relates to a spectrometer including a diopter (11); capturing means (15, 18) at said diopter (11) of an interferogram (12) originating from two interference beams (F1, F2) and forming interference lines (13) along the transverse axis (Ox) of the interferogram (12) within the plane (xOy) of the diopter (11), said capturing means (15, 18) including a network (18) of detection elements (19) so arranged to detect the spatial distribution of said interferogram (12), characterized in that said network (18) of detection elements (19) is two-dimensional and in that at least a portion of said capturing means (15, 18) and said interferogram (12) are tilted with regard to each other along the transverse axis (Ox) of the interferogram (12). The present invention also relates to a spectroscopic imaging device, including means for emitting two interference beams (F1, F2), and to such a spectrometer.Type: ApplicationFiled: March 17, 2009Publication date: April 30, 2015Applicant: UNIVERSITÉ DE TECHNOLOGIE DE TROYESInventors: Yassine Hadjar, Sylvain Blaize, Aurélien Bruyant, Gilles Lerondel, Pascal Royer
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Patent number: 7995211Abstract: The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.Type: GrantFiled: August 4, 2006Date of Patent: August 9, 2011Assignee: Universite Joseph FourierInventors: Etienne Le Coarer, Pierre Benech, Pierre Kern, Gilles Lerondel, Sylvain Blaize, Alain Morand
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Publication number: 20090219543Abstract: The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.Type: ApplicationFiled: August 4, 2006Publication date: September 3, 2009Inventors: Etienne Le Coarer, Pierre Benech, Pierre Kern, Gilles Lerondel, Sylvain Blaize, Alain Morand