Patents by Inventor Syuichi Ishiwari

Syuichi Ishiwari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6609415
    Abstract: A test piece made of a material equal to the material of the workpiece is formed in a size that permits the test piece to be housed in an adsorption tube container mounted to a mass analyzing apparatus of a gas chromatograph. The test piece is left to stand for a predetermined time in a measuring site of the atmosphere within a cleansing chamber and, then, recovered. The recovered test piece is introduced into a mass analyzing apparatus of a gas chromatograph (GC-MS apparatus) for measurement of the material of the contaminant and the mass of the contaminant, thereby evaluating the degree of contamination of the measured point.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: August 26, 2003
    Assignee: Hitachi Plant Engineering & Construction Co., Ltd.
    Inventors: Syuichi Ishiwari, Haruo Kato
  • Publication number: 20010025524
    Abstract: A test piece made of a material equal to the material of the workpiece is formed in a size that permits the test piece to be housed in an adsorption tube container mounted to a mass analyzing apparatus of a gas chromatograph. The test piece is left to stand for a predetermined time in a measuring site of the atmosphere within a cleansing chamber and, then, recovered. The recovered test piece is introduced into a mass analyzing apparatus of a gas chromatograph (GC-MS apparatus) for measurement of the material of the contaminant and the mass of the contaminant, thereby evaluating the degree of contamination of the measured point.
    Type: Application
    Filed: March 9, 2001
    Publication date: October 4, 2001
    Inventors: Syuichi Ishiwari, Haruo Kato