Patents by Inventor Ta-Feng Tseng

Ta-Feng Tseng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050075835
    Abstract: A method and system of real-time statistical bin control. First, a statistical bin control rule is generated by a statistical bin control rule generator, and a test result having an error frequency is then retrieved from test equipment. If the error frequency exceeds a preset limit, the system replies to the test equipment with a first action corresponding to the statistical bin control rule. Next, if the error frequency of the test results exceeds another limit, the system then replies to the test equipment with a second action corresponding to the statistical bin control rule.
    Type: Application
    Filed: September 7, 2004
    Publication date: April 7, 2005
    Inventors: Ta-Feng Tseng, Lee-Chung Lin
  • Patent number: 6732000
    Abstract: Within a system and a method for determining performance of a plurality of manufacturing tools which generates a plurality of tool operation data sets in a plurality of non-uniform data analysis formats, there is employed a uniform data analysis format into which is translated the plurality of tool operation data sets in the plurality of non-uniform data analysis formats. The system and the method provide for enhanced efficiency for determining performance of the plurality of manufacturing tools.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: May 4, 2004
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Ta-Feng Tseng, Lee-Chung Lin
  • Publication number: 20030225471
    Abstract: Within a system and a method for determining performance of a plurality of manufacturing tools which generates a plurality of tool operation data sets in a plurality of non-uniform data analysis formats, there is employed a uniform data analysis format into which is translated the plurality of tool operation data sets in the plurality of non-uniform data analysis formats. The system and the method provide for enhanced efficiency for determining performance of the plurality of manufacturing tools.
    Type: Application
    Filed: May 30, 2002
    Publication date: December 4, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Ta-Feng Tseng, Lee-Chung Lin
  • Patent number: 6042714
    Abstract: A new method which employs a mixed-valence cluster of M.sub.y.sup.z+ [Fe(II)(CN).sub.6 ] coated on an electrode surface to determine hydrogen peroxide concentration electrochemically is developed. M of the mixed-valence compound can be Co, Ni, Cr, Sc, V, Cu, Mn, Ag, Eu, Cd, Zn, Ru or Rh; z is the valence state of M; and y=4/z. In addition, this invention also reveals a new approach to determine a concentration of a hydrogen peroxide precursor, wherein a catalyst is immobilized in the matrix or on the surface of the mixed-valence compound on the electrode. In a typical biochemical system, the catalyst can be a glucose oxidase and blood sugar is catalyzed to form hydrogen peroxide.
    Type: Grant
    Filed: December 4, 1997
    Date of Patent: March 28, 2000
    Assignee: National Science Council
    Inventors: Meng Shan Lin, Yi Cong Wu, Jung Sheng Lai, Bor Iuan Jan, Ta Feng Tseng, Wei Chung Shih