Patents by Inventor Tabea Pfuhl

Tabea Pfuhl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-invasive substance analysis
    Patent number: 11639894
    Abstract: A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Grant
    Filed: January 4, 2021
    Date of Patent: May 2, 2023
    Assignee: DiaMonTech AG
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Non-Invasive Substance Analysis
    Publication number: 20210148817
    Abstract: A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Application
    Filed: January 4, 2021
    Publication date: May 20, 2021
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Non-invasive substance analysis
    Patent number: 10883933
    Abstract: The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: January 5, 2021
    Assignee: DiaMonTech AG
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Non-Invasive Substance Analysis
    Publication number: 20170146455
    Abstract: The invention relates to analyzing a substance. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Application
    Filed: June 16, 2015
    Publication date: May 25, 2017
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl