Patents by Inventor Tadahiro Shiota

Tadahiro Shiota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6925148
    Abstract: X- and y-axis moving mechanisms are provided for positioning a sample table in the x-axis and the y-axis directions. A yT-axis moving mechanism for moving those moving mechanisms in a direction along a tilting direction of a X-ray camera is provided separately from the x- and y-axes moving mechanisms. When the X-ray camera is tilted, the sample table is moved by the yt axis moving mechanism and a z-axis moving mechanism, whereby a viewpoint of the sample and a fluoroscopic magnification factor set before the X-ray camera is tilted are left unchanged. The coordinates on the sample table by the moving mechanisms before the X-ray camera is tilted can be used as they are even after the camera is tilted.
    Type: Grant
    Filed: October 21, 2003
    Date of Patent: August 2, 2005
    Assignee: Shimadzu Corporation
    Inventors: Tadahiro Shiota, Masayuki Kamegawa
  • Patent number: 6798861
    Abstract: As the operator sets a direction of moving a turn table, a view field FOV (z) of an X-ray detector in the rotation axis direction of the turn table, and the number of imaging times n and gives a continuous imaging command, the imaging operation of collecting X-ray fluoroscopic data while rotating the turn table and the operation of moving the turn table in the setup direction by FOV (z) are repeated and imaging is conducted n times. Then, the provided data is reconstructed to provide tomograms. It is possible to provide a continuous tomogram even if a high imaging magnification is set to provide high-resolution three-dimensional data and a necessary region for the three-dimensional data cannot be covered in the field of view of the X-ray detector.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: September 28, 2004
    Assignee: Shimadzu Corporation
    Inventor: Tadahiro Shiota
  • Publication number: 20040096029
    Abstract: X- and y-axis moving mechanisms are provided for positioning a sample table in the x-axis and the y-axis directions. A yT-axis moving mechanism for moving those moving mechanisms in a direction along a tilting direction of a X-ray camera is provided separately from the x- and y-axes moving mechanisms. When the X-ray camera is tilted, the sample table is moved by the yt axis moving mechanism and a z-axis moving mechanism, whereby a viewpoint of the sample and a fluoroscopic magnification factor set before the X-ray camera is tilted are left unchanged. The coordinates on the sample table by the moving mechanisms before the X-ray camera is tilted can be used as they are even after the camera is tilted.
    Type: Application
    Filed: October 21, 2003
    Publication date: May 20, 2004
    Applicant: SHIMADZU CORPORATION
    Inventors: Tadahiro Shiota, Masayuki Kamegawa
  • Publication number: 20020191736
    Abstract: As the operator sets a direction of moving a turn table, a view field FOV (z) of an X-ray detector in the rotation axis direction of the turn table, and the number of imaging times n and gives a continuous imaging command, the imaging operation of collecting X-ray fluoroscopic data while rotating the turn table and the operation of moving the turn table in the setup direction by FOV (z) are repeated and imaging is conducted n times. Then, the provided data is reconstructed to provide tomograms. It is possible to provide a continuous tomogram even if a high imaging magnification is set to provide high-resolution three-dimensional data and a necessary region for the three-dimensional data cannot be covered in the field of view of the X-ray detector.
    Type: Application
    Filed: May 30, 2002
    Publication date: December 19, 2002
    Applicant: SHIMADZU CORPORATION
    Inventor: Tadahiro Shiota
  • Patent number: 6314158
    Abstract: A data processor for fluorescent x-ray spectroscopy calculates theoretical x-ray intensity which is theoretically expected to be obtained by a fluorescent x-ray spectroscopy measurement of a standard sample with known composition by taking into account the effects of x-ray attenuation by the possible presence of an environmental gas along the optical path of the x-rays between the x-ray tube and the sample and between the sample and the detector. The element sensitivity for each of elements in the standard sample is obtained from this calculated x-ray intensity and the intensity actually measured and is stored in a memory. When a fluorescent x-ray spectroscopy measurement is carried out on an unknown sample, the sample is quantitatively analyzed, a theoretically calculated x-ray intensity obtained also by taking into account the effects of x-ray attenuation by an environmental gas is used together with the actually measured x-ray intensity and the element sensitivities stored in the memory.
    Type: Grant
    Filed: March 8, 2000
    Date of Patent: November 6, 2001
    Assignee: Shimadzu Corporation
    Inventors: Tadahiro Shiota, Makoto Nishino, Shoji Kuwabara