Patents by Inventor Tadashi Arii
Tadashi Arii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9744788Abstract: A stamp-face platemaking device transports a medium holder inserted into a plate insertion portion to a printing unit. The medium holder holds a stamp face material at a center portion of a plate-like member, and has a cutout portion in one side end portion thereof. An optical sensor detects the top end portion of the medium holder on a sensor scanning line in the inserting direction, and the cutout start point and the cutout end point of the cutout portion. The size of the stamp face material in the inserting direction and/or the size of the stamp face material in a direction perpendicular to the inserting direction are set based on the positions of two of the detected end portions. When the cutout end point is detected, platemaking with the stamp face material is started. The cutout portion can have a wedge-like shape or a U-shape, or can change its positions and/or sizes.Type: GrantFiled: September 18, 2014Date of Patent: August 29, 2017Assignee: CASIO COMPUTER CO., LTD.Inventors: Hirotaka Yuno, Tadashi Arii
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Patent number: 9691594Abstract: A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.Type: GrantFiled: June 27, 2014Date of Patent: June 27, 2017Assignee: RIGAKU CORPORATIONInventors: Tadashi Arii, Koichi Matsushima, Satoshi Otake
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Publication number: 20160189944Abstract: A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.Type: ApplicationFiled: June 27, 2014Publication date: June 30, 2016Applicant: RIGAKU CORPORATIONInventors: Tadashi Arii, Koichi Matsushima, Satoshi Otake
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Publication number: 20150084257Abstract: A stamp-face platemaking device transports a medium holder inserted into a plate insertion portion to a printing unit. The medium holder holds a stamp face material at a center portion of a plate-like member, and has a cutout portion in one side end portion thereof. An optical sensor detects the top end portion of the medium holder on a sensor scanning line in the inserting direction, and the cutout start point and the cutout end point of the cutout portion. The size of the stamp face material in the inserting direction and/or the size of the stamp face material in a direction perpendicular to the inserting direction are set based on the positions of two of the detected end portions. When the cutout end point is detected, platemaking with the stamp face material is started. The cutout portion can have a wedge-like shape or a U-shape, or can change its positions and/or sizes.Type: ApplicationFiled: September 18, 2014Publication date: March 26, 2015Applicant: CASIO COMPUTER CO., LTD.Inventors: Hirotaka YUNO, Tadashi ARII
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Patent number: 8592779Abstract: An ionizing device 2 includes an ionization chamber 2a having an ionization space 2b for ionizing sample molecules A, filaments 23a and 23b to have an electron impact on the sample molecules A in the ionization space 2b, to ionize the sample molecules A, and an electric discharge tube 29 to irradiate the sample molecules A in the ionization space 2b with ultraviolet light, to ionize the sample molecules A.Type: GrantFiled: March 16, 2007Date of Patent: November 26, 2013Assignees: Hamamatsu Photonics K.K., Rigaku CorporationInventors: Shigeki Matsuura, Yoshihiro Takata, Tadashi Arii, Satoshi Otake
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Patent number: 8044343Abstract: A plurality of molecule components included in a gas are to be ionized at the same time by PI method. For instance, a plurality of molecule components included in a gas generated at a certain instance are accurately analyzed in real time based on PI method. A gas analyzer is provided with a gas transfer apparatus for transferring a gas generated from a sample in a sample chamber to an analyzing chamber; an ionizer for ionizing the gas; a quadruple filter for separating ions by mass/charge ratio; and an ion detector for detecting the separated ions. The ionizer is provided with an ionizing region arranged in the vicinity of a gas exhaust of the gas transfer apparatus, and a lamp for applying light on the ionizing region. Since the lamp outputs light which has light directivity lower than that of a laser beam and travels by spreading, the gas entered the ionizing region in the ionizer receives light in a wide range, and the gas components inside are ionized at the same time.Type: GrantFiled: March 16, 2007Date of Patent: October 25, 2011Assignees: Rigaku Corporation, Hamamatsu Photonics K.K.Inventors: Tadashi Arii, Yoshihiro Takata, Satoshi Otake, Shigeki Matsuura
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Patent number: 7989761Abstract: Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained through soft ionization process from a second gas having same concentration of components as that of the first gas are subjected to mass analysis to obtain ion intensities which stored in a second file, and molecular weights are determined based on parent ions from soft ionization measurement data. A mass spectrum corresponding to the determined molecular weight is read out based on an NIST database, and the ion intensity data stored in the first file and the read out NIST data are compared with each other, and component molecules of the first gas are determined based on the comparison results. Qualitative analysis of mixed gas can be conducted in real time with high accuracy by making effective use of the measurement data of both mass analysis based on EI process and mass analysis based on soft ionization process.Type: GrantFiled: December 31, 2008Date of Patent: August 2, 2011Assignee: Rigaku CorporationInventors: Tadashi Arii, Kyoji Matsumoto, Satoshi Otake
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Publication number: 20090173879Abstract: Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained through soft ionization process from a second gas having same concentration of components as that of the first gas are subjected to mass analysis to obtain ion intensities which stored in a second file, and molecular weights are determined based on parent ions from soft ionization measurement data. A mass spectrum corresponding to the determined molecular weight is read out based on an NIST database, and the ion intensity data stored in the first file and the read out NIST data are compared with each other, and component molecules of the first gas are determined based on the comparison results. Qualitative analysis of mixed gas can be conducted in real time with high accuracy by making effective use of the measurement data of both mass analysis based on EI process and mass analysis based on soft ionization process.Type: ApplicationFiled: December 31, 2008Publication date: July 9, 2009Applicant: RIGAKU CORPORATIONInventors: Tadashi ARII, Kyoji Matsumoto, Satoshi Otake
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Publication number: 20090026362Abstract: A plurality of molecule components included in a gas are to be ionized at the same time by PI method. For instance, a plurality of molecule components included in a gas generated at a certain instance are accurately analyzed in real time based on PI method. A gas analyzer is provided with a gas transfer apparatus for transferring a gas generated from a sample in a sample chamber to an analyzing chamber; an ionizer for ionizing the gas; a quadruple filter for separating ions by mass/charge ratio; and an ion detector for detecting the separated ions. The ionizer is provided with an ionizing region arranged in the vicinity of a gas exhaust of the gas transfer apparatus, and a lamp for applying light on the ionizing region. Since the lamp outputs light which has light directivity lower than that of a laser beam and travels by spreading, the gas entered the ionizing region in the ionizer receives light in a wide range, and the gas components inside are ionized at the same time.Type: ApplicationFiled: March 16, 2007Publication date: January 29, 2009Applicants: RIGAKU CORPORATION, HAMAMATSU PHOTONICS K.K.Inventors: Tadashi Arii, Yoshihiro Takata, Satoshi Otake, Shigeki Matsuura
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Publication number: 20090008571Abstract: An ionizing device 2 includes an ionization chamber 2a having an ionization space 2b for ionizing sample molecules A, filaments 23a and 23b to have an electron impact on the sample molecules A in the ionization space 2b, to ionize the sample molecules A, and an electric discharge tube 29 to irradiate the sample molecules A in the ionization space 2b with ultraviolet light, to ionize the sample molecules A.Type: ApplicationFiled: March 16, 2007Publication date: January 8, 2009Inventors: Shigeki Matsuura, Yoshihiro Takata, Tadashi Arii, Satoshi Otake
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Patent number: 7155960Abstract: A temperature-programmed desorbed gas analyzing apparatus including a sample chamber 1 in which a sample S is disposed, an infrared heating furnace 2 for heating the sample S disposed in the sample chamber 1, a measuring chamber 3 in which gas desorbed from the sample S by heating is introduced, a turbo molecular pump 4 for reducing the pressure in the measuring chamber 3, a mass spectrometer 5 having a gas detection portion 5a disposed in the measuring chamber 3, an intermediate pressure-reduced chamber 6 provided between the sample chamber 1 and the measuring chamber 3, a first orifice 7 which the intermediate pressure-reduced chamber 6 and the sample chamber 1 intercommunicate with each other, and a second orifice 8 through which the intermediate pressure-reduced chamber 6 and the measuring chamber 3 intercommunicate with each other, and the desorbed gas occurring in the sample chamber 1 is introduced through the first orifice 7, the intermediate pressure-reduced chamber 6 and the second orifice 8 into theType: GrantFiled: October 26, 2004Date of Patent: January 2, 2007Assignee: Rigaku CorporationInventors: Tadashi Arii, Yoshihiro Takata, Shuichi Matsuo
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Patent number: 7140231Abstract: An evolved gas analysis system contains a first measurement step of heating a first sample containing measurement target material and non-measurement target material at a predetermined temperature programming rate and detecting the amount of gas evolved from the first sample; a second measurement step of heating a second sample achieved by excluding the measurement target material from the first sample at the same temperature increasing rate as the first measurement step, and detecting the amount of gas evolved from the second sample; and a correcting step of calculating the amount of gas evolved from the measurement target material on the basis of the detected data of the respective steps.Type: GrantFiled: August 17, 2004Date of Patent: November 28, 2006Assignee: Rigaku CorporationInventors: Tadashi Arii, Yoshihiro Takata
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Publication number: 20050112027Abstract: An evolved gas analysis system contains a first measurement step of heating a first sample containing measurement target material and non-measurement target material at a predetermined temperature programming rate and detecting the amount of gas evolved from the first sample, a second measurement step of heating a second sample achieved by excluding the measurement target material from the first sample at the same temperature increasing rate as the first measurement step, and detecting the amount of gas evolved from the second sample, and a correcting step of calculating the amount of gas evolved from the measurement target material on the basis of the detected data of the respective steps.Type: ApplicationFiled: August 17, 2004Publication date: May 26, 2005Inventors: Tadashi Arii, Yoshihiro Takata
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Publication number: 20050098112Abstract: An apparatus for producing metal oxide comprising (a) a water vapor generator for generating a water-vapor containing gas with a desired partial pressure of water vapor; and (b) heating equipment for heating a metal salt of a carboxylic acid, the metal salt of the carboxylic acid being disposed in a sample vessel, to a predetermined temperature in a water-vapor-containing gas which is introduced from said water vapor generator.Type: ApplicationFiled: December 17, 2004Publication date: May 12, 2005Applicant: RIGAKU CORPORATIONInventors: Tadashi Arii, Akira Kishi
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Publication number: 20050086997Abstract: A temperature-programmed desorbed gas analyzing apparatus including a sample chamber 1 in which a sample S is disposed, an infrared heating furnace 2 for heating the sample S disposed in the sample chamber 1, a measuring chamber 3 in which gas desorbed from the sample S by heating is introduced, a turbo molecular pump 4 for reducing the pressure in the measuring chamber 3, a mass spectrometer 5 having a gas detection portion 5a disposed in the measuring chamber 3, an intermediate pressure-reduced chamber 6 provided between the sample chamber 1 and the measuring chamber 3, a first orifice 7 which the intermediate pressure-reduced chamber 6 and the sample chamber 1 intercommunicate with each other, and a second orifice 8 through which the intermediate pressure-reduced chamber 6 and the measuring chamber 3 intercommunicate with each other, and the desorbed gas occurring in the sample chamber 1 is introduced through the first orifice 7, the intermediate pressure-reduced chamber 6 and the second orifice 8 into theType: ApplicationFiled: October 26, 2004Publication date: April 28, 2005Applicant: RIGAKU CORPORATIONInventors: Tadashi Arii, Yoshihiro Takata, Shuichi Matsuo
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Publication number: 20030087516Abstract: Metal oxide is produced by heating a metal salt of a carboxylic acid to a predetermined temperature, which varies with a raw material, lower than 300° C. In the case of using zinc acetate as the raw material, when heated in dry helium gas, it is sublimated and decomposed to produce no zinc oxide. In contrast, when heated in a mixture gas of nitrogen gas and water vapor with a programming rate of 5° C./min, the weight loss begins around 110° C. and has been completed around 230° C., at a water vapor partial pressure of 17.9 kPa, to produce zinc oxide. If keeping the temperature approximately constant when the weight loss begins, zinc oxide is produced around 115° C. with a high degree of crystallinity. A metal may be any one of zinc, cadmium, indium and copper. A carboxylic acid may be any one of formic acid, acetic acid, propionic acid and 2-ethylhexanoic acid.Type: ApplicationFiled: October 31, 2002Publication date: May 8, 2003Applicant: RIGAKU CORPORATIONInventors: Tadashi Arii, Akira Kishi