Abstract: An apparatus for manufacturing a secondary battery includes: an index table configured to receive a secondary battery cell, the secondary battery cell including an electrode assembly, a can accommodating the electrode assembly, and an electrode tab between the electrode assembly and the can to electrically connect the electrode assembly to the can; a laser scanner configured to irradiate laser onto an outer surface of the can to weld the electrode tab to the can; and a controller configured to variably control the laser scanner according to an operation of the index table.

Abstract: The inventive concept provides a substrate treating method. The substrate treating method includes pre-treating a substrate by cleaning the substrate; etching the substrate by supplying an etchant and heating a substrate supplied with the etchant; and post-treating the substrate after the etching the substrate, and wherein the pre-treating the substrate, the etching the substrate, and the post-treating the substrate are each performed in different chambers, a substrate on which the pre-treating the substrate is completed is transferred in a dry state to a chamber at which the etching the substrate is performed, and a substrate on which the etching the substrate is completed is transferred in a wetted state with a liquid to a chamber at which the post-treating the substrate is performed.

Abstract: A display device includes a substrate including a display area and a non-display area, a pixel located in the display area, a pad unit on one side of the non-display area, and a driver connected to the pixel. The pixel includes a first insulating layer, a first light emitting element on the first insulating layer, a second insulating layer on the first light emitting element and exposing one end portion and another end portion of the first light emitting element, a first contact electrode on the second insulating layer and connected to the one end portion of the first light emitting element, and a second contact electrode on the second insulating layer and connected to the other end portion of the first light emitting element. The pad unit includes a pad metal layer, a first pad insulating layer, a second pad insulating layer, and a pad electrode.

Abstract: The present solution preserves an amount of charge sufficient to reach a nearest or most convenient charger in a battery of a vehicle during a prolonged vehicle disuse. The solution can include a data processing system that can identify an inactive state of a battery and determine that the vehicle should enter an energy reservation mode. The data processing system can identify a vehicle charger and determine, based on a location of the vehicle and the charger, an amount of energy needed for the vehicle to reach the charging unit. The data processing system can determine a power reservation threshold for the first battery and modify, based on the power reservation threshold, a level of energy provided by the first battery to the second battery to maintain at least the first amount of amount of energy in the first battery.

Abstract: The present disclosure relates to a thermoplastic resin composition and an exterior material including the same. The thermoplastic resin composition included 90 to 99.5% by weight of styrene-based resins each including 5 to 30% by weight of acrylate rubber having a DLS average particle diameter of 0.25 to 0.32 ?m or a TEM average particle diameter of 0.2 to 0.27 ?m based on a total weight of the styrene-based resins; and 0.5 to 10% by weight of a polyamide resin, and an exterior material including the thermoplastic resin composition. According to the present disclosure, a low-gloss thermoplastic resin composition having excellent aesthetics, such as softness, luxuriousness, and naturalness, due to uniformity, low gloss, and improvement in surface texture while having mechanical properties and processability equal or superior to those of conventional ASA resins; and an exterior material including the low-gloss thermoplastic resin composition may be provided.

Abstract: A method for coding image information includes generating prediction information by predicting information on a current coding unit, and determining whether the information on the current coding unit is the same as the prediction information. When the information on the current coding unit is the same as the prediction information, a flag indicating that the information on the current coding unit is the same as the prediction information is coded and transmitted. When the information on the current coding unit is not the same as the prediction information, a flag indicating that the information on the current coding unit is not the same as the prediction information and the information on the current coding unit are coded and transmitted.

Abstract: A method of reinforcement learning of a neural network device for generating a verification vector for verifying a circuit design comprising a circuit block includes inputting a test vector to the circuit block, generating one or more rewards based on a coverage corresponding to the test vector, the coverage being determined based on a state transition of the circuit block based on the test vector, and applying the one or more rewards to a reinforcement learning.

Abstract: Provided is a process proximity effect correction method capable of efficiently improving the dispersion of patterns. There is a process proximity effect correction method according to some embodiments, the process proximity effect correction method of a process proximity effect correction device for performing process proximity effect correction (PPC) of a plurality of patterns using a machine learning module executed by a processor, comprising: training a sensitivity model by inputting a layout image of the plurality of patterns and a layout critical dimension (CD) of the plurality of patterns into the machine learning module; estimating an after cleaning inspection critical dimension (ACI-CD) sensitivity prediction value of the plurality of patterns by inferring an ACI-CD prediction value of the plurality of patterns; and determining a correction rate of the layout CD of the plurality of patterns using the estimated sensitivity prediction value.

Abstract: The present invention discloses an image decoding method, the method including generating a candidate list including motion information derived from a spatial neighboring block and a temporal neighboring block adjacent to a current block; deriving motion information of the current block using the candidate list; generating a prediction block of the current block using the derived motion information; and updating the derived motion information in a motion information list, wherein the generating of the candidate list is performed in such a manner as to include at least one information of the motion information included in the updated motion information list in a block decoded before the current block.

Abstract: The present disclosure relates to an organic electroluminescent device. The organic electroluminescent device of the present disclosure shows high luminous efficiency and good lifespan by comprising a specific combination of the plural kinds of host compounds and a specific hole transport compound.

Abstract: A cell-to-cell comparison method for inspecting a defect in a subject in which unit cells that may be expressed by a two-dimensional (2D) vector are periodically arranged according to an embodiment of the present invention includes: obtaining an image of the subject including an array of the unit cells; generating a tile that is a set of pixels corresponding to the same position in a plurality of unit cells within the array in the image; determining a gray level of each of a plurality of pixels within the tile; and determining whether the plurality of pixels within the tile are defective on the basis of the determined gray level of each of the plurality of pixels.

Abstract: A battery load management system and methods of managing a battery load, e.g., in a vehicle, may be directed to a converter that steps down electrical power from an input voltage to a reduced voltage. An electrical bus in electrical communication with the converter may be configured to supply electrical power received from the converter at the reduced voltage to a plurality of electrical loads. A controller may be configured to detect a load shed trigger, and in response to the detection select one or more low-priority loads included in the plurality of electrical loads. The controller may also be configured to reduce electrical power consumption by the one or more low-priority loads.

Abstract: A battery load management system and methods of managing a battery load, e.g., in a vehicle, may be directed to a converter that steps down electrical power from an input voltage to a reduced voltage. An electrical bus in electrical communication with the converter may be configured to supply electrical power received from the converter at the reduced voltage to a plurality of electrical loads. A controller may be configured to detect a load shed trigger, and in response to the detection select one or more low-priority loads included in the plurality of electrical loads. The controller may also be configured to reduce electrical power consumption by the one or more low-priority loads.

Abstract: ProA wafer image inspection apparatus for inspecting defects of a semiconductor wafer comprises: a lighting portion for generating light; a lens portion for obtaining a wafer image, which is reflected after the light has been reflected onto a wafer to be inspected, and delivering the wafer image by lighting same in one direction; a dividing optical element for dividing the wafer image delivered from the lens portion; an image detection portion comprising a plurality of image-capturing elements, which are installed so that images which have passed through the lens portion and the dividing optical element are respectively formed on different focus positions; and an image processing portion for combining the images on different focus positions captured by the plurality of image pick-up elements to form a TSOM image, and comparing the TSOM image with a TSOM image of a normal semiconductor apparatus part to determine whether an object is defective.

Abstract: ProA wafer image inspection apparatus for inspecting defects of a semiconductor wafer comprises: a lighting portion for generating light; a lens portion for obtaining a wafer image, which is reflected after the light has been reflected onto a wafer to be inspected, and delivering the wafer image by lighting same in one direction; a dividing optical element for dividing the wafer image delivered from the lens portion; an image detection portion comprising a plurality of image-capturing elements, which are installed so that images which have passed through the lens portion and the dividing optical element are respectively formed on different focus positions; and an image processing portion for combining the images on different focus positions captured by the plurality of image pick-up elements to form a TSOM image, and comparing the TSOM image with a TSOM image of a normal semiconductor apparatus part to determine whether an object is defective.

Abstract: There are provided a method for producing an electroconductive polymer which can be operated at a low temperature such as the human body temperature, is safe to the human body, and is flexible and useful as a thermoelectric material, and a thermoelectric element including a thin film of an electroconductive polymer produced by the production method.

Abstract: There are provided a method for producing an electroconductive polymer which can be operated at a low temperature such as the human body temperature, is safe to the human body, and is flexible and useful as a thermoelectric material, and a thermoelectric element including a thin film of an electroconductive polymer produced by the production method.

Abstract: A method of manufacturing an electronic device, which can obtain sufficient manufacturing margins and reduce a defect rate by compensating for a threshold voltage variation caused by the variation of a critical dimension (CD) of a gate electrode. An ion implanter controller and an ion implantation system perform the method. In the method, an ion implantation recipe for forming a junction contact plug of a transistor formed on the wafer is adjusted based on the measured CD. Then, ions are implanted into the wafer by using the adjusted ion implantation recipe. All defects that may occur in the transistor during previous manufacturing steps can be repaired after the transistor is formed, thus enhancing manufacturing margins.

Abstract: A film for display device, a filter for display device including the film, and a display device including the filter are disclosed. The film for display device includes a plurality of first portions positioned to be spaced with a predetermined distance therebetween, and a plurality of second portions transmitting light. Each second portion is positioned between the first portions. A refractive index of the first portion is larger than a refractive index of the second portion.

Abstract: A multi-sector in-building repeater, including: a master transmitting unit for receiving multi-sector signals of a carrier from a base station, mixing the multi-sector signals with different transmission intermediate frequency signals, and outputting mixed multi-sector signals to a same transmission line; a plurality of slave transmitting units for extracting sector signals assigned to the multi-sector signals from the master transmitting unit, converting extracted sector signals into high frequency signals, and transmitting converted high frequency signals through an antenna to a mobile terminal.