Abstract: Various embodiments provide a processing module that calibrates a current-mode baseline correction system to account for features in an input device that lead to “offset” in output of a charge integrator used for sensing presence of an input object. The offset is a difference between a common mode voltage, which is the average voltage output of the charge integrator over a sensing cycle and a mid-rail voltage midway between high and low power supply voltages. Calibration is performed by adjusting an N-side and/or P-side current flow duration parameter until common mode voltage falls within a low offset window in which the offset is deemed to be sufficiently close to the mid-rail voltage. The resulting duration parameters are stored and used for current-mode baseline corrections when operating an associated sensor electrode for capacitive sensing.

Abstract: A capacitance measurement circuit cancels background capacitance while reducing charge leakage and supply ripples during reset phases and integrate phases. The capacitance measurement circuit operates a first switch into a linear mode causing a first resistance in the first switch, and after a delay, operates a second switch into a saturation mode causing a second resistance in parallel to the first resistance.

Abstract: Various embodiments provide a processing module that calibrates a current-mode baseline correction system to account for features in an input device that lead to “offset” in output of a charge integrator used for sensing presence of an input object. The offset is a difference between a common mode voltage, which is the average voltage output of the charge integrator over a sensing cycle and a mid-rail voltage midway between high and low power supply voltages. Calibration is performed by adjusting an N-side and/or P-side current flow duration parameter until common mode voltage falls within a low offset window in which the offset is deemed to be sufficiently close to the mid-rail voltage. The resulting duration parameters are stored and used for current-mode baseline corrections when operating an associated sensor electrode for capacitive sensing.

Abstract: A capacitance measurement circuit cancels background capacitance while reducing charge leakage and supply ripples during reset phases and integrate phases. The capacitance measurement circuit operates a first switch into a linear mode causing a first resistance in the first switch, and after a delay, operates a second switch into a saturation mode causing a second resistance in parallel to the first resistance.

Abstract: The digitally programmable delay circuit to correct timing skew between data and clock is developed. The digitally programmable delay circuit may be built by cascading delay cells. The delay circuit uses delay cells comprising simple digital elements such as inverters and tri-state inverters to eliminate the intrinsic delay and achieves linearity and monotinicity. The delay cell may be used as a building module which is repeatedly used in a serial fashion. The delay range is fully programmable from the delay of one delay cell to infinity if the chip area is available. The delay range can be scaled by adding more delay cells.

Abstract: The digitally programmable delay circuit to correct timing skew between data and clock is developed. The digitally programmable delay circuit may be built by cascading delay cells. The delay circuit uses delay cells comprising simple digital elements such as inverters and tri-state inverters to eliminate the intrinsic delay and achieves linearity and monotinicity. The delay cell may be used as a building module which is repeatedly used in a serial fashion. The delay range is fully programmable from the delay of one delay cell to infinity if the chip area is available. The delay range can be scaled by adding more delay cells.

Abstract: An input buffer circuit includes a first differential circuit, a second differential circuit, a pull-up circuit, and a pull-down circuit. An input voltage and a reference voltage are provided to the first and second differential circuits. The first differential circuit detects rising edges of the input voltage and causes the pull-up circuit to quickly drive an output voltage to logic high. The second differential circuit detects falling edges of the input voltage and causes the pull-down circuit to quickly drive the output voltage to logic low.

Abstract: A method and apparatus for optimizing crossover voltage for differential pair switches in a current-steering digital-to-analog converter or the like are disclosed. An array of at least one or more MOSFET switches may be utilized to control the crossover voltage of a differential pair of transistors such that the off time overlap of the differential pair transistors is optimized. In one embodiment, the pull-up and pull-down times of the input for the differential pair transistors are optimized such that the differential pair transistors are not turned off simultaneously. The array of switches may be n-channel MOSFETs when the differential pair are p-channel MOSFETs. Likewise, the array of switches may be p-channel MOSFETs when the differential pair are n-channel MOSFETs. The output of the diflerential pair is free of crossover glitches and is capable of being utilized in a data converter such as a current-steering digital-to-analog converter (DAC).