Patents by Inventor Taeko I. Urano
Taeko I. Urano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6857573Abstract: An article including a substrate and an invisible symbol on the substrate is disclosed. The invisible symbol is formed by a compound which includes a cyano group and has an infrared absorption wavelength apart from that of the substrate when heated.Type: GrantFiled: September 9, 2003Date of Patent: February 22, 2005Assignee: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Publication number: 20040155113Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a loading or trailing edge of a binary function.Type: ApplicationFiled: July 29, 2003Publication date: August 12, 2004Applicant: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Patent number: 6712272Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.Type: GrantFiled: July 30, 2002Date of Patent: March 30, 2004Assignee: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Publication number: 20040046032Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.Type: ApplicationFiled: September 9, 2003Publication date: March 11, 2004Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Patent number: 6471126Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.Type: GrantFiled: January 2, 2001Date of Patent: October 29, 2002Assignee: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Publication number: 20010020677Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.Type: ApplicationFiled: January 2, 2001Publication date: September 13, 2001Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Publication number: 20010001472Abstract: Disclosed is a method of reading a pattern comprising steps of heating or irradiating with infrared light a substrate on which a transparent pattern is formed, the pattern containing a material capable of absorbing infrared light of specific wavelength such as polyacrylonitrile, and detecting infrared light which is radiated or reflected from the pattern.Type: ApplicationFiled: July 1, 1999Publication date: May 24, 2001Inventors: KENJI SANO, TAEKO I. URANO, HIDEYUKI NISHIZAWA, MITSUNAGA SAITO, KENJI TODORI
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Patent number: 6168081Abstract: An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.Type: GrantFiled: March 22, 1999Date of Patent: January 2, 2001Assignee: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Kenji Sano, Hideo Nagai, Tomokazu Domon, Hironori Fukuda
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Patent number: 5971276Abstract: A method of reading a pattern including steps of heating or irradiating with infrared light a substrate on which a transparent pattern is formed, the pattern containing a material capable of absorbing infrared light of specific wavelength such as polyacrylonitrile, and detecting infrared light which is radiated or reflected from the pattern.Type: GrantFiled: February 7, 1997Date of Patent: October 26, 1999Assignee: Kabushiki Kaisha ToshibaInventors: Kenji Sano, Taeko I. Urano, Hideyuki Nishizawa, Mitsunaga Saito, Kenji Todori
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Patent number: 5694188Abstract: A liquid crystal display device comprises two substrates opposed to each other, a comb-shaped wall electrode formed to correspond to each pixel of an array defined by vertical and horizontal wires formed on the substrate, the comb-shaped wall electrode having a plurality of elemental electrodes, major surfaces of each of the elemental electrodes being substantially perpendicular to the surfaces of the two substrates, and the major surfaces of adjacent ones of the elemental electrodes constituting counter electrodes to each other, and a liquid crystal filled in a gap of the comb-shaped wall electrode provided between the two substrates.Type: GrantFiled: September 14, 1995Date of Patent: December 2, 1997Assignee: Kabushiki Kaisha ToshibaInventors: Kenji Sano, Kenji Todori, Yutaka Majima, Masayuki Sekimura, Akinori Hongu, Taeko I. Urano, Shigeru Machida, Koji Asakawa
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Patent number: 5621334Abstract: A liquid crystal device evaluation method including the steps of irradiating infrared a liquid crystal device with light while applying an electric field to the liquid crystal device, and obtaining a field response curve corresponding to a change in infrared light intensity with time by measuring time-profile of infrared light intensity having passed through the liquid crystal layer, wherein an impurity mixed in the liquid crystal device is detected on the basis of the slope of the field response curve which is obtained, when pulsed electric fields having different polarities are applied to the liquid crystal device, within a time corresponding to the pulse width of each pulsed electric field. An apparatus for realizing the evaluation method is also disclosed.Type: GrantFiled: September 28, 1995Date of Patent: April 15, 1997Assignee: Kabushiki Kaisha ToshibaInventors: Taeko I. Urano, Shigeru Machida, Kenji Sano, Hiroshi Yoshida
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Patent number: 5543949Abstract: A liquid crystal device including two substrates each having a liquid crystal orienting film formed on each opposing surface, and a liquid crystal sealed between these substrates, wherein a liquid crystal orienting film formed on the surface of at least one of the two substrates is constituted by a polyamino acid film having a rigid structure and a dipole moment that is bound to the surface of the substrate through a layer of surface treating agent.Type: GrantFiled: August 18, 1993Date of Patent: August 6, 1996Assignee: Kabushiki Kaisha ToshibaInventors: Shigeru Machida, Taeko I. Urano, Kenji Sano, Yasushi Mori