Abstract: A switching device includes a first switch disposed between a power source voltage and an intermediate node, the first switch forming a current path on the basis of an input signal, a second switch disposed between the intermediate node and a ground, the second switch forming a current path on the basis of a voltage of the intermediate node, and a transmission gate receiving the input signal, the transmission gate outputting the input signal on the basis of the voltage of the intermediate node.

Abstract: A switching device includes a first switch disposed between a power source voltage and an intermediate node, the first switch forming a current path on the basis of an input signal, a second switch disposed between the intermediate node and a ground, the second switch forming a current path on the basis of a voltage of the intermediate node, and a transmission gate receiving the input signal, the transmission gate outputting the input signal on the basis of the voltage of the intermediate node.

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal.

Abstract: A method of simulating a semiconductor integrated circuit (IC) at gate level includes providing a net list including information about a variable power source and a variable ground source, providing a circuit model including the variable power source and the variable ground source, and simulating the net list by using the circuit model at gate level.

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal.